United States International Trade Commision Rulings And Harmonized Tariff Schedule
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9025.80.50 - 9032.81.00
> 9031.80.80
Previous Tariff (9031.80.40 - Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor devices or reticles)
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HTS Number:
9031.80.80
Description:
Measuring and checking instruments, appliances and machines, nesoi
MFN Duty Rate:
1.7%
Previous Tariff (9031.80.40 - Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor devices or reticles)
Next Tariff (9031.90.20 - Parts and accessories of profile projectors)
Related Rulings:
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