United States International Trade Commision Rulings And Harmonized Tariff Schedule

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HTS Number: 9012.10.00

Description: Microscopes other than optical microscopes; diffraction apparatus
MFN Duty Rate: 3.5%

Previous Tariff (9011.90.00 - Parts and accessories for compound optical microscopes, including those for microphotography, microcinematography or microprojection)
Next Tariff (9012.90.00 - Parts and accessories for microscopes other than optical microscopes, and for diffraction apparatus)

Related Rulings:

• 1991 HQ 0088231 - Application For Further Review Of Protest No. 3801-9-002721 (October 19, 1989); Scanning Laser Microscope; Optical Microscopes; Measuring, Checking Instruments And Appliances
• 1992 HQ 0951468 - "Aladin Thermo Microscope"; Heading 9011; Heading 9012; EN 90.11; EN 90.12(A); HQ 088231
• 1993 HQ 0089002 - Protest No. 2809-0-000873; laser scanning microscope; Subheading 9012.10.00; Subheading 9013.80.60; HQ 088231.
• 1993 HQ 0952000 - Protest No. 2809-92-100484; KLA Series 5000 Coherence Probe Metrology System; "optical"; HQ 084646; HQ 088231; 9012; EN 90.31; Add. U.S. Note 3 to Chapter 90; Corning Glass Works v. U.S.
• 1993 NY 888077 - The tariff classification of Vacuum Scanning Tunneling Microscopes, Software and Table from Japan
• 1995 HQ 558673 - Decision on Application for Further Review of Protest No. 2809-94-100266.
• 1997 HQ 952000 - Protest No. 2809-92-100484; KLA Series 5000 Coherence Probe Metrology System; "optical"; HQ 084646; HQ 088231; 9012; EN 90.31; Add. U.S. Note 3 to Chapter 90; Corning Glass Works v. U.S.
• 1997 NY 888077 - The tariff classification of Vacuum Scanning Tunneling Microscopes, Software and Table from Japan
• 1998 NY 888077 - The tariff classification of Vacuum Scanning Tunneling Microscopes, Software and Table from Japan
• 1999 NY D86881 - The tariff classification of scanning tunneling microscopes, atomic force microscopes, software and metal computer tables from Japan
• 2000 HQ 962435 - Protest 1001-98-102442; Measurement and Inspection SEM Microscope, Model MI-3080; Microscopes, Other than Optical Microscopes
• 2003 HQ 966482 - CD Measurement and Inspection Scanning Electron Microscope fitted with equipment specifically designed for the handling and transport of semiconductor wafers; Revocation of HQ 962435
• 2004 HQ 966185 - Protest Number 2904-02-100316; Dual Beam System; Scanning Electron Microscope; Handling and Transport Equipment; ITA.
• 2004 HQ 966296 - Protest 1704-02-100302; CD-Scanning Electron Microscope
• 2006 NY R03296 - The tariff classification of the Nova 200 NanoLab