Patent application number | Description | Published |
20100041194 | SEMICONDUCTOR DEVICE WITH SPLIT GATE MEMORY CELL AND FABRICATION METHOD THEREOF - A split gate memory cell. First and second well regions of respectively first and second conductivity types are formed in the substrate. A floating gate is disposed on a junction of the first and second well regions and insulated from the substrate. A control gate is disposed over the sidewall of the floating gate and insulated from the substrate and the floating gate and partially extends to the upper surface of the floating gate. A doping region of the first conductivity type is formed in the second well region. The first well region and the doping region respectively serve as source and drain regions of the split gate memory cell. | 02-18-2010 |
20110199845 | REDUNDANCY CIRCUITS AND OPERATING METHODS THEREOF - A memory circuit includes a first group of memory arrays including a first memory array coupled with a first input/output (IO) interface and a second memory array coupled with a second IO interface. A second group of memory arrays include a third memory array coupled with a third input/output (IO) interface and a fourth memory array coupled with a fourth IO interface. A plurality of redundancy bit lines include at least one first redundancy bit line that is configured for selectively repairing the first group of memory arrays, and at least one second redundancy bit line that is configured for selectively repairing the second group of memory arrays. | 08-18-2011 |
20120127806 | MEMORY WORD LINE BOOST USING THIN DIELECTRIC CAPACITOR - A memory includes a word line and a word line boost circuit. The word line boost circuit includes a capacitor having a capacitor dielectric thickness, and a transmission gate coupled to the word line and the capacitor. The transmission gate has a gate-dielectric thickness that is greater than the capacitor dielectric thickness. The word line boost circuit is configured to supply a high voltage that is higher than a power supply voltage to the word line during an operation of the memory by utilizing the capacitor. | 05-24-2012 |
20120134218 | CHARGE PUMP CONTROL SCHEME USING FREQUENCY MODULATION FOR MEMORY WORD LINE - A memory includes a word line having a word line voltage, a charge pump coupled to the word line, and a dynamic feedback control circuit coupled to the charge pump. The dynamic feedback control circuit is capable of changing a clock frequency of a clock signal supplied the charge pump from a first non-zero value to a second non-zero value depending on the difference between the word line voltage and a target threshold voltage. | 05-31-2012 |
20120275249 | REDUNDANCY CIRCUITS AND OPERATING METHODS THEREOF - A memory circuit includes a group of memory arrays and at least one redundancy bit line. The group of memory arrays includes a first memory array coupled with a first input/output (IO) interface and a second memory array coupled with a second IO interface. The at least one redundancy bit line is configured to selectively repair the group of memory arrays. | 11-01-2012 |
20130093499 | POWER SWITCH AND OPERATION METHOD THEREOF - A power switch includes a control circuit, a cross-coupled amplifier, a first switching circuit coupled between a first output terminal and the first controlled ground terminal, and a second switching circuit coupled between a second output terminal and the second controlled ground terminal. The control circuit is configured to connect the second controlled ground terminal to a ground during a first period that a voltage level at the first output terminal is switched from the ground to a first voltage level and to set the second controlled ground terminal at an elevated ground level during a second period that the voltage level at the first output terminal remains at the first voltage level. | 04-18-2013 |
20130121088 | MEMORY WORD LINE BOOST USING THIN DIELECTRIC CAPACITOR - A memory including a boost circuit configured to supply a voltage higher than a supply voltage to a word line. The boost circuit includes a first capacitor having a first capacitor dielectric thickness. The boost circuit further includes a transmission gate coupled to the word line and the first capacitor, the transmission gate having a gate-dielectric thickness that is greater than the first capacitor dielectric thickness. | 05-16-2013 |
20130127515 | VOLTAGE DIVIDING CIRCUIT - A voltage divider is disclosed that includes a plurality of components connected in series having respective input terminals, respective output terminals, and a reference voltage node at the connection between one of the input terminals and one of the output terminals. The voltage divider also includes a level shifter having a input terminal coupled to the reference voltage node and having a output terminal supplying an output reference voltage. | 05-23-2013 |
20140146613 | OPERATING METHOD OF MEMORY HAVING REDUNDANCY CIRCUITRY - In a method of operating a memory circuit, which includes a plurality of memory arrays each coupled with a corresponding input/output (IO) interface and a redundancy memory page a failing address of a failing bit cell is determined. The failing address is located in a memory page of one of the memory arrays. The method further includes repairing the failing bit cell by replacing the memory page with the redundancy memory page. | 05-29-2014 |
20140185401 | SENSING CIRCUIT, MEMORY DEVICE AND DATA DETECTING METHOD - A sensing circuit includes a sensing resistor, a reference resistor and a comparator. The comparator has a first input coupled to the sensing resistor, a second input coupled to the reference resistor, and an output. The first input is configured to be coupled to a data bit line associated with a memory cell to receive a sensing input voltage caused by a cell current of the memory cell flowing through the sensing resistor. The second input is configured to be coupled to a reference bit line associated with a reference cell to receive a sensing reference voltage caused by a reference current of the reference cell flowing through the reference resistor. The comparator is configured to generate, at the output, an output signal indicating a logic state of data stored in the memory cell based on a comparison between the sensing input voltage and the sensing reference voltage. | 07-03-2014 |
20140211537 | RESISTANCE-BASED RANDOM ACCESS MEMORY - A resistance-based random access memory circuit includes a first data line, a second data line, a plurality of memory cells, a first driving unit, and a second driving unit. The memory cells are arranged one following another in parallel with the first and second data lines. Each of the memory cells are coupled between the first data line and the second data line. The first driving unit is coupled with first ends of the first and second data lines. The first driving unit is configured to electrically couple one of the first data line and the second data line to a first voltage node. The second driving unit is coupled with second ends of the first and second data lines. The second driving unit is configured to electrically couple the other one of the first data line and the second data line to a second voltage node. | 07-31-2014 |
20140256099 | METHOD OF CONVERTING BETWEEN NON-VOLATILE MEMORY TECHNOLOGIES AND SYSTEM FOR IMPLEMENTING THE METHOD - A method of designing a charge trapping memory array including designing a floating gate memory array layout. The floating gate memory layout includes a first type of transistors, electrical connections between memory cells of the floating gate memory array layout, a first input/output (I/O) interface, a first type of charge pump, and an I/O block. The method further includes modifying the floating gate memory array layout, using a processor, to replace the first type of transistors with a second type of transistors different than the first type of transistors. The method further includes determining an operating voltage difference between the I/O block and the second type of transistors. The method further includes modifying the floating gate memory array layout, using the processor, to modify the first charge pump based on the determined operating voltage difference. | 09-11-2014 |
20140340970 | MEMORY WITH DYNAMIC FEEDBACK CONTROL CIRCUIT - A memory comprising a word line having a word line voltage, a charge pump coupled to the word line, and a dynamic feedback control circuit coupled to the charge pump. The dynamic feedback control circuit is configured to boost the word line voltage to a predetermined voltage value greater than a target threshold voltage, change a clock frequency of a clock signal supplied to the charge pump from a non-zero frequency to a zero frequency if the word line voltage is above the predetermined voltage value, and change the clock frequency from the zero frequency to the non-zero frequency if the word line voltage is below the target threshold voltage. | 11-20-2014 |
20150015223 | Low Dropout Regulator and Related Method - A device includes an error amplifier, a standby current source, a charging current source, a voltage divider, and a first switch. The error amplifier has a negative input terminal and a positive input terminal. The standby current source has a control terminal electrically connected to an output terminal of the error amplifier. The voltage divider has an input terminal electrically connected to an output terminal of the standby current source, and an output terminal electrically connected to the positive input terminal of the error amplifier. The charging current source has a control terminal electrically connected to the output terminal of the error amplifier. The first switch has a first terminal electrically connected to an input terminal of the charging current source, and a second terminal electrically connected to a first power supply node. | 01-15-2015 |