Patent application number | Description | Published |
20080212739 | X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD - In an X-ray analysis apparatus and an X-ray analysis method, a quantitative analysis is stably performed by stably behaving an X-ray source. There are possessed an X-ray tubular bulb irradiating a primary X-ray to a sample, a primary X-ray adjustment mechanism capable of adjusting an intensity of the primary X-ray, an X-ray detector detecting a characteristic X-ray radiated from the sample, thereby outputting a signal including energy informations of the characteristic X-ray and a scattered X-ray, an analyzer analyzing the above signal, and an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector, and capable of adjusting a total intensity of the characteristic X-ray and the scattered x-ray, which are entered to the X-ray detector. | 09-04-2008 |
20090028297 | X-RAY TUBE AND X-RAY ANALYSIS APPARATUS - There are disclosed an X-ray tube and an X-ray analysis apparatus which are made smaller and lighter in weight than heretofore and which detect fluorescent X-rays more efficiently with enhanced sensitivity. The X-ray tube has a vacuum enclosure, an electron beam source mounted in the enclosure and emitting an electron beam, a target irradiated with the beam and producing primary X-rays, an X-ray detector device, and a metallic thermal and electrical conductor portion mounted over a part of the window and extending from the target to the enclosure. The enclosure has a vacuum inside and a window made of an X-ray transmissive film through which X-rays are transmitted. The target is smaller in outside diameter than the window and mounted over the central portion of the window such that the primary X-rays can be ejected at an external sample through the window. The detector device is disposed in the enclosure such that it can detect the fluorescent and scattering X-rays entering from the window after being released from the sample. The detector device outputs a signal carrying information about the energies of the fluorescent and scattering X-rays. | 01-29-2009 |
20090041196 | X-RAY TUBE AND X-RAY ANALYSIS APPARATUS - Provided are an X-ray tube and an X-ray analysis apparatus, which can be further reduced in size as well as in weight and more efficiently detect a fluorescent X-ray and the like to increase sensitivity. The X-ray tube includes: a vacuum casing ( | 02-12-2009 |
20090213996 | X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD - Provided are an X-ray analysis apparatus and an X-ray analysis method, in which a measurer can judge an area incapable of being analyzed in a sample with a concave-convex portion. The X-ray analysis apparatus includes: an X-ray tubular bulb for irradiating an arbitrary irradiation point located on the sample with a radiation beam; an X-ray detector for detecting a characteristic X-ray and a scattered X-ray radiated from the sample and outputting a signal containing energy information on the characteristic X-ray and the scattered X-ray; a narrow-range illumination mechanism and a wide-range illumination mechanism for emitting an illumination light to the sample to illuminate the sample; and a narrow-range observation mechanism and a wide-range observation mechanism for obtaining an illumination image of the sample, which is illuminated with the illumination light, as image data, in which the narrow-range observation mechanism and the wide-range observation mechanism include a narrow-range oblique illumination section and a wide-range oblique illumination section, respectively, in which an optical axis of the illumination light at a time of the illuminating is set toward the irradiation point in the same direction as a direction linking the irradiation point with the X-ray detector at a time of the detecting. | 08-27-2009 |
20100046700 | X-RAY ANALYZER AND X-RAY ANALYSIS METHOD - An X-ray tube which irradiates a primary X-ray to an irradiation point on a sample, an X-ray detector which detects a characteristic X-ray and a scattered X-ray emitted from the sample and outputs a signal including energy information on the characteristic X-ray and scattered X-ray, an analyzer which analyzes the signal, a sample stage on which the sample is placed, a moving mechanism which moves the sample on the sample stage, the X-ray tube, and the X-ray detector relative to each other, a height measuring mechanism which measures a maximum height of the sample, and a control unit which adjusts the distance between the sample and the X-ray tube and the distance between the sample and the X-ray detector by controlling the moving mechanism on the basis of the measured maximum height of the sample, are included. | 02-25-2010 |
20100046701 | X-RAY ANALYZER AND X-RAY ANALYSIS METHOD - An X-ray tube which irradiates a primary X-ray to an irradiation point on a sample, an X-ray detector which detects a characteristic X-ray and a scattered X-ray emitted from the sample and outputs a signal including energy information of the characteristic X-ray and scattered X-ray, an analyzer which analyzes the signal, a first observation system which optically observes a surface of the sample in order to determine the irradiation point, and a second observation system which has a smaller depth of field than the first observation system, optically observes a narrow region, and measures the distance from the determined irradiation point by focus adjustment are included. | 02-25-2010 |
20100316187 | X-Ray inspection device and X-Ray inspection method - In order to prevent misdetection and erroneous detection by clearly determining only a contrast caused by a foreign matter, there are provided an X-ray inspection method and an X-ray inspection device including: an X-ray tube ( | 12-16-2010 |
20110222656 | X-ray transmission inspection apparatus and x-ray transmission inspection method - To prevent erroneous detection in detecting a foreign matter, which is caused by a change in distance between a sample and an X-ray detector, provided is an X-ray transmission inspection apparatus including an X-ray tube ( | 09-15-2011 |
20130032728 | TRANSMISSION X-RAY ANALYZER AND TRANSMISSION X-RAY ANALYSIS METHOD - A transmission X-ray analyzer for detecting a transmission X-ray image of a sample that moves relatively in a predetermined scanning direction includes; a time delay and integration (TDI) sensor including a plurality of stages of line sensors including the plurality of two-dimensionally arranged image pickup devices arranged in a direction perpendicular to the predetermined scanning direction, being configured to transfer charge accumulated in one line sensor to an adjacent subsequent line sensor; a shield unit for shielding a part of the image of light entering the TDI sensor by moving back and forth in the predetermined scanning direction, the shield unit being disposed between the TDI sensor and the sample; and a shield unit position control unit for controlling a position of the shield unit so as to shield a predetermined number of stages of line sensors among the plurality of stages of line sensors. | 02-07-2013 |
20130034204 | X-RAY ANALYZER AND X-RAY ANALYSIS METHOD - An X-ray analyzer ( | 02-07-2013 |
20130216024 | TRANSMISSION X-RAY ANALYZER - A transmission X-ray analyzer ( | 08-22-2013 |
Patent application number | Description | Published |
20140286474 | X-Ray Fluorescence Analyzer - An X-ray fluorescence analyzer includes a sample stage having an opening at an X-ray irradiation position, an X-ray source which irradiates a sample placed on the opening with a primary X-ray from below, a detector which detects an X-ray fluorescence generated from the sample, a transparent drop prevention plate supported to be advanced and retracted immediately below the opening, a drive mechanism which advances and retracts the drop prevention plate, an observation camera which observes the drop prevention plate positioned immediately below the opening, and an operation unit which processes an image of the drop prevention plate which is captured by the observation camera. The operation unit detects a foreign matter on the drop prevention plate based on an image difference between images before and after the drive mechanism moves or vibrates the drop prevention plate within an observation range of the observation camera. | 09-25-2014 |
20140294143 | X-Ray Fluorescence Spectrometer - An X-ray fluorescence spectrometer includes: a sample stage configured to place a sample thereon; an X-ray source configured to irradiate the sample with primary X-rays; a detector, which is configured to detect fluorescent X-rays produced from the sample irradiated with the primary X-rays, and which includes an X-ray incident window formed by a window material through which fluorescent X-rays is transmittable; and a gas blowing mechanism configured to blow a gas to at least one of an outer surface of the X-ray incident window and the sample stage. | 10-02-2014 |
20140294144 | Foreign Matter Detector - A foreign matter detector includes an X-ray source which irradiates a sample moving in a constant direction with primary X-rays, a parallel two-dimensional slit which includes a plurality of slits arranged in at least a moving direction of the sample and emits parallel secondary X-rays by extracting a parallel component of secondary X-rays generated from the sample, a dispersing element which disperses the parallel secondary X-rays to obtain a specific X-ray fluorescence, a TDI sensor which receives the X-ray fluorescence, and a control unit which controls the TDI sensor to detect a foreign matter corresponding to the X-ray fluorescence. The control unit integrates a luminance value of the X-ray fluorescence received by the TDI sensor while matching a direction and a speed of charge transfer of the TDI sensor to a direction and a speed of movement of the sample. | 10-02-2014 |
20140294145 | X-Ray Fluorescence Spectrometer - An X-ray fluorescence spectrometer includes: an X-ray source which irradiates a sample with primary X-rays; a light condensing device which condenses the primary X-rays to reduce an irradiation area on the sample; a detector which detects fluorescent X-rays produced from the sample irradiated with the primary X-rays; a housing which accommodates the X-ray source and the light condensing device; a temperature sensor which is disposed in at least one of the X-ray source and the periphery of the X-ray source; at least one external-air fan which is disposed on the housing, and which can exchange internal air with external air; and a control section which drives the external-air fan based on temperature information detected by the temperature sensor, to adjust the ambient temperature around the X-ray source to a constant temperature. | 10-02-2014 |