Patent application number | Description | Published |
20100290304 | VOLTAGE STABILIZATION CIRCUIT AND SEMICONDUCTOR MEMORY APPARATUS USING THE SAME - A voltage stabilization circuit of a semiconductor memory apparatus includes an operation speed detecting unit configured to detect an operation speed of the semiconductor memory apparatus to generate a detection signal, and a voltage line controlling unit configured to interconnect a first voltage line and a second voltage line in response to the detection signal. | 11-18-2010 |
20100332925 | SEMICONDUCTOR MEMORY APPARATUS AND METHOD OF TESTING THE SAME - A semiconductor memory apparatus according to the embodiment includes a test mode controller, a first data alignment unit, a decoder, a test executing unit and a second data alignment unit. The test mode controller is configured to generate test enable signals in response to a test mode setting signal and a read command. The first data alignment unit is configured to parallely align first input data that are input in series, generate first alignment data, and transmit it to the first data driver. The decoder is configured to decode the first alignment data in response to the test enable signal and generate the decoding signal. The test executing unit is configured to execute the preset test mode in response to the decoding signal. The second data alignment unit is configured to parallely align second input data, which are input in series, in response to the test enable signal, generate second alignment data, and transmit it to a second data driver. | 12-30-2010 |
20110235443 | VOLTAGE STABILIZATION CIRCUIT AND SEMICONDUCTOR MEMORY APPARATUS USING THE SAME - A voltage stabilization circuit of a semiconductor memory apparatus includes an operation speed detecting unit configured to detect an operation speed of the semiconductor memory apparatus to generate a detection signal, and a voltage line controlling unit configured to interconnect a first voltage line and a second voltage line in response to the detection signal. | 09-29-2011 |
20120204070 | SEMICONDUCTOR MEMORY APPARATUS AND METHOD OF TESTING THE SAME - A method of testing a semiconductor memory apparatus is provided. The data alignment units other than the one data align unit being tested are deactivated. Serial data is input to the activated data alignment unit to generate parallel data. The parallel data is decoded. A test mode signal corresponding to the decoded result is enabled to perform the test. Different serial data is input where the test mode signal is enabled to generate and decode parallel data. Both tests are then performed simultaneously based on a test mode signal corresponding to a result of the decoded parallel data. | 08-09-2012 |
20120217991 | IMPEDANCE CONTROL CIRCUIT AND INTEGRATED CIRCUIT CHIP INCLUDING THE SAME - A circuit, including a first impedance unit having an impedance value based on a first impedance code and configured to drive a first node coupled with a resistor with a first voltage, a first code generation unit configured to generate the first impedance code so that an impedance value of the first impedance unit and an impedance value of the resistor are at a ratio of X:Y, dummy impedance units that receive the first impedance code and drive a second node with the first voltage, a second impedance unit having an impedance value based on a second impedance code and configured to drive the second node with a second voltage, and a second code generation unit configured to generate the second impedance code so that an overall impedance value of the dummy impedance units and an impedance value of the second impedance unit are at a ratio of X:Y | 08-30-2012 |
20130038363 | DELAY LOCKED LOOP - A delay locked loop includes a delay adjusting unit configured to delay a first clock signal in outputting a second clock signal phase-locked with the first clock signal and generate a delay control signal in response to the first clock signal and the second clock signal and a variable delay line configured to output a third clock signal by delaying the first clock signal in response to the delay control signal. | 02-14-2013 |
20130082755 | FILTERING CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT HAVING THE SAME - A filtering circuit includes jitter determination reference control unit configured to determine a jitter determination reference in correspondence to an operation mode and output a control signal in response to the jitter determination reference, and a filtering unit configured to set the jitter determination reference in response to the control signal and determine whether an input signal is maintained during a sample period in response to the set jitter determination reference. | 04-04-2013 |
20130114352 | SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device includes a pipe latch circuit configured to receive parallel input data and output serial data or set an output terminal of the pipe latch circuit at a predetermined voltage level in response to an enable signal, and a synchronization circuit configured to output an output data of the pipe latch circuit in synchronization with an internal clock. | 05-09-2013 |
20130162321 | SEMICONDUCTOR DEVICE - A semiconductor device includes an information generation circuit configured to generate first information, an information multiplexing circuit configured to multiplex the first information and second information, and an information driving circuit configured to drive an output pad in response to an output signal of the information multiplexing circuit. | 06-27-2013 |
20140111251 | SEMICONDUCTOR DEVICE - A semiconductor device includes an information generation circuit configured to generate first information, an information multiplexing circuit configured to multiplex the first information and second information, and an information driving circuit configured to drive an output pad in response to an output signal of the information multiplexing circuit. | 04-24-2014 |