Patent application number | Description | Published |
20110241726 | ON-DIE TERMINATION CIRCUIT - An on-die termination circuit includes a reference period signal generation circuit that generates a reference period signal according to a level of a reference voltage, a first period signal generation circuit that generates a first period signal according to a voltage level of a pad, a period comparison circuit that compares a period of the first period signal with a period of the reference period signal and count a plurality of driving signals, and a driver circuit that drives the pad in response to the plurality of driving signals. | 10-06-2011 |
20110267124 | CLOCK SIGNAL DUTY CORRECTION CIRCUIT - A clock signal duty correction circuit includes: a first transition timing control unit configured to generate a first control signal for controlling a rising timing of a duty correction clock signal by using a clock signal; a second transition timing control unit configured to generate a second control signal for varying a falling timing of the duty correction clock signal by using the clock signal according to a code signal; and a differential buffer unit configured to generate the duty correction clock signal, whose rising time or falling time is adjusted, in response to the first control signal and the second control signal. | 11-03-2011 |
20130041612 | INTERNAL CONTROL SIGNAL REGURATION CIRCUIT - An internal control signal regulation circuit includes a programming test unit configured to detect an internal control signal in response to an external control signal and generate a selection signal, test codes and a programming enable signal; and a code processing unit configured to receive the test codes or programming codes in response to the selection signal and regulate the internal control signal. | 02-14-2013 |
20130043901 | ON-DIE TERMINATION CIRCUIT - An on-die termination circuit includes a reference period signal generation circuit that generates a reference period signal according to a level of a reference voltage, a first period signal generation circuit that generates a first period signal according to a voltage level of a pad, a period comparison circuit that compares a period of the first period signal with a period of the reference period signal and count a plurality of driving signals, and a driver circuit that drives the pad in response to the plurality of driving signals. | 02-21-2013 |
20130342245 | RESET SIGNAL GENERATION APPARATUS - A reset signal generation apparatus includes a reset signal generation unit and a reset signal expansion unit. The reset signal generation unit enables a reset signal and an enable signal in response to a reset input signal, and disables the reset signal in response to a pulse width extension signal. The reset signal expansion unit generates the pulse width extension signal that is enabled for a predetermined time, in response to the enable signal. | 12-26-2013 |
20130342250 | DELAY CONTROL CIRCUIT AND CLOCK GENERATION CIRCUIT INCLUDING THE SAME - A clock generation circuit includes a delay line, which delays an input clock and generates a delayed clock, a delay modeling unit, which delays the delayed clock by a modeled delay value and generates a feedback clock, a phase detection unit, which compares phases of the input clock and the feedback clock and generates a phase detection signal, a filter unit, which receives the phase detection signal and generates phase information, generates an update signal when a difference between the numbers of phase detection signals with a first and a second level generated is greater than or equal to a threshold value, and generates the update signal after a lapse of a predetermined time when the difference is less than the threshold value, and a delay line control unit, which sets a delay value of the delay line in response to the update signal and the phase information. | 12-26-2013 |
20140002149 | CLOCK GENERATION CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME | 01-02-2014 |
20140002154 | DELAY CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME | 01-02-2014 |
20140003161 | SEMICONDUCTOR APPARATUS AND TEST CIRCUIT THEREOF | 01-02-2014 |