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Yasuhiro Yoshikawa

Yasuhiro Yoshikawa, Kyoto JP

Patent application numberDescriptionPublished
20090090987Mems element, mems device and mems element manufacturing method - An MEMS element (A04-09-2009
20100000324ACCELERATION SENSOR AND METHOD OF FABRICATING IT - Provided is an acceleration sensor that has high detection sensitivity and that can enhance production efficiency. The acceleration sensor (01-07-2010
20110043375AIR PRESSURE MANAGEMENT DEVICE FOR VEHICLE TIRE AND VEHICLE TIRE CAPABLE OF OUTPUTTING AIR PRESSURE INFORMATION - Vibration electric power generation is carried out by a relative parallel movement of a ferroelectric member including floating electrodes arranged in parallel and a movable member including electrets maintaining a surface electric potential of approximately 100 volts at a temperature of 100° C. and opposed electrode portions alternately arranged, the ferroelectric member and the movable member being provided in a tire.02-24-2011
20110062820Power Generation Apparatus - A power generation apparatus includes a dielectric, a movable member being opposed to the dielectric with a predetermined distance, and an electret and an opposing electrode that are formed on the surface of the movable member facing the dielectric so as to generate a fringe electric field penetrating the dielectric between the two electrodes. When the volume occupancy of the dielectric between the electret and the opposing electrode varies in accordance with a displacement of the movable member, the power generation apparatus outputs the electric charge induced in the opposing electrode as electric current.03-17-2011
20120154504THERMAL PRINTER HEAD AND MANUFACTURING METHOD THEREOF - A thermal printer head that is highly efficient to manufacture is provided, which includes: a first substrate (06-21-2012

Patent applications by Yasuhiro Yoshikawa, Kyoto JP

Yasuhiro Yoshikawa, Tokyo JP

Patent application numberDescriptionPublished
20080237848SEMICONDUCTOR DEVICE - There is provided a semiconductor device which makes equalization of wirings between address system chips easy and reduce the influence of crosstalk noise and capacitive coupling noise among data system wirings for connecting the chips. There are mounted, on a module board, a plurality of stacked memory chips which a data processor chip simultaneously accesses. Address system bonding pads to which a plurality of memory chips correspond are commonly coupled by a wire to a bonding lead at one end of the module board wiring whose other end is coupled by a wire to an address system bonding pads of the data processor. Data system bonding pads of the data processor chip are individually coupled to data system bonding pads of the memory chip. With respect to an arrangement of the plurality of data system bonding pads of the data processor chip, an arrangement of the data system bonding pads to which the memory chip, coupled by the data system wiring, corresponds is made such that memory chips are disposed in an alternating sequence.10-02-2008
20100244238SEMICONDUCTOR DEVICE - There is provided a semiconductor device which makes equalization of wirings between address system chips easy and reduce the influence of crosstalk noise and capacitive coupling noise among data system wirings for connecting the chips. There are mounted, on a module board, a plurality of stacked memory chips which a data processor chip simultaneously accesses. Address system bonding pads to which a plurality of memory chips correspond are commonly coupled by a wire to a bonding lead at one end of the module board wiring whose other end is coupled by a wire to an address system bonding pads of the data processor. Data system bonding pads of the data processor chip are individually coupled to data system bonding pads of the memory chip. With respect to an arrangement of the plurality of data system bonding pads of the data processor chip, an arrangement of the data system bonding pads to which the memory chip, coupled by the data system wiring, corresponds is made such that memory chips are disposed in an alternating sequence.09-30-2010
20100314761SEMICONDUCTOR DEVICE WITH REDUCED CROSS TALK - Mutual inductance from an external output signal system to an external input signal system, in which parallel input/output operation is enabled, is reduced. A semiconductor integrated circuit has a plurality of external connection terminals facing a package substrate, and has an external input terminal and an external output terminal, in which parallel input/output operation is enabled, as part of the external connection terminals. The package substrate has a plurality of wiring layers for electrically connecting between the external connection terminals and module terminals corresponding to each other. A first wiring layer facing the semiconductor integrated circuit has a major wiring for connecting between the external input terminal and a module terminal corresponding to each other, and a second wiring layer in which the module terminals are formed has a major wiring for connecting between an external output terminal and a module terminal corresponding to each other. A major signal wiring of an external output system connected to the external output terminal, which may be a noise source, is made to be in a wiring layer distant from the semiconductor integrated circuit.12-16-2010
20110127671SEMICONDUCTOR DEVICE - There is provided a semiconductor device which makes equalization of wirings between address system chips easy and reduce the influence of crosstalk noise and capacitive coupling noise among data system wirings for connecting the chips. There are mounted, on a module board, a plurality of stacked memory chips which a data processor chip simultaneously accesses. Address system bonding pads to which a plurality of memory chips correspond are commonly coupled by a wire to a bonding lead at one end of the module board wiring whose other end is coupled by a wire to an address system bonding pads of the data processor. Data system bonding pads of the data processor chip are individually coupled to data system bonding pads of the memory chip. With respect to an arrangement of the plurality of data system bonding pads of the data processor chip, an arrangement of the data system bonding pads to which the memory chip, coupled by the data system wiring, corresponds is made such that memory chips are disposed in an alternating sequence.06-02-2011

Patent applications by Yasuhiro Yoshikawa, Tokyo JP

Yasuhiro Yoshikawa, Miyazaki JP

Patent application numberDescriptionPublished
20100213963SEMICONDUCTOR INTEGRATED CIRCUIT TEST METHOD - A wafer of semiconductor integrated circuits with wafer-level chip-scale packages is tested in two stages. The chip-scale packages include conductive posts extending through a sealing layer and capped by terminals. Measurements strongly affected by contact resistance are carried out before the terminals are formed, using a first probe card having probe pins that contact the ends of the conductive posts. Other measurements are carried out after the terminals are formed, using a second probe card having probe pins that contact the terminals. Accurate measurements can be made in this way even if the terminals are lead-free solder bumps with variable contact resistance. Fabrication yields are improved accordingly.08-26-2010

Yasuhiro Yoshikawa, Kanagawa JP

Patent application numberDescriptionPublished
20120206954SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE - There is a need to provide a semiconductor device and an electronic device capable of easily allowing a bypass capacitor to always improve noise suppression on a signal path in order to transmit a reference potential between chips in different power supply noise states. There is provided a specified signal path that connects a control chip and a memory chip mounted on a mounting substrate and transmits a reference potential generated from the control chip. A bypass capacitor is connected to the specified signal path only at a connecting part where a distance from a reference potential pad of the memory chip to the connecting part along the specified signal path is shorter than a distance from a reference potential pad of the control chip to the connecting part along the specified signal path.08-16-2012

Yasuhiro Yoshikawa, Kyoto-Shi JP

Patent application numberDescriptionPublished
20130057110POWER GENERATION DEVICE - Provided is a power generation device having a dielectric body and an electret, where power is generated by varying the distance between the dielectric body and the electret. A first electrode is connected to the electret on a side not facing the dielectric body. The first electrode is connected to a grounding terminal via a load. A second electrode may be connected to the dielectric body on a side not facing the electret. The second electrode may be directly connected to the grounding terminal.03-07-2013