Patent application number | Description | Published |
20100117658 | TESTABLE INTEGRATED CIRCUIT AND TEST DATA GENERATION METHOD - An integrated circuit (IC) is disclosed that comprises a circuit portion ( | 05-13-2010 |
20100229061 | Cell-Aware Fault Model Creation And Pattern Generation - Cell-aware fault models directly address layout-based intra-cell defects. They are created by performing analog simulations on the transistor-level netlist of a library cell and then by library view synthesis. The cell-aware fault models may be used to generate cell-aware test patterns, which usually have higher defect coverage than those generated by conventional ATPG techniques. The cell-aware fault models may also be used to improve defect coverage of a set of test patterns generated by conventional ATPG techniques. | 09-09-2010 |
20100251045 | High Speed Clock Control - On-chip high speed clock control techniques for testing circuits with multiple clock systems are disclosed. The techniques allow certain (e.g. compatible) high speed clocks to be activated with predefined waveforms during a capture period of a logic test, based on a clock control signal. The clock control signal may be supplied via a JTAG control port or via a scan chain load port. The clock control signal may also be generated by a BIST controller. The techniques may ensure glitch-free transitions from slow speed clocks during a shift period to fast speed clocks during a capture period. | 09-30-2010 |
20100253381 | On-Chip Logic To Support In-Field Or Post-Tape-Out X-Masking In BIST Designs - Techniques for masking unknown and irrelevant response values that may be produced by a BIST process. Masking circuitry is provided for selectively masking the response values obtained from a BIST process. The operation of the selective masking circuitry is controlled by a programmable mask circuitry controller that can be programmed after the integrated circuit has been manufactured. A user can analyze an integrated circuit after it has been manufactured to identify irrelevant and unknown data values in a BIST process. After the irrelevant and unknown data values have been identified, the user can program the programmable mask controller to have the selective masking circuitry mask the identified irrelevant and unknown data values. | 10-07-2010 |
20100275075 | Deterministic Logic Built-In Self-Test Stimuli Generation - Techniques for storing and using compressed restrict values for selected scan chains and flip-flops, such that the states that need to be applied to those flip flops need not be solved by a linear equation system solver, such as a linear equation system solver provided by an automatic test pattern generation (ATPG) tool. Selected restrict values can then be injected into test patterns for those flip-flop combinations that need to be set in a certain shift cycle or those flip-flops that need to be initialized one after another (e.g., for serial settings in one scan chain). | 10-28-2010 |
20100299567 | On-Chip Logic To Support Compressed X-Masking For BIST - Techniques are provided for X-masking using at least some masking information provided by on-chip logic, in lieu of masking information provided from off of the integrated circuit being tested. The masking information is provided by a masking information source on the integrated circuit being tested, such as, for example, a read-only memory (ROM) circuit, that feeds the masking information to the X-masking logic. With these implementations of the invention, it is possible to perform X-masking independent from any external data, thus enabling X-masking for a logic built-in self-test without requiring an external testing device. | 11-25-2010 |
20110047425 | On-Chip Logic To Log Failures During Production Testing And Enable Debugging For Failure Diagnosis - On-chip logic includes a shadow register cross-coupled with a multiple input shift/signature register (MISR). The shadow register facilitates debugging by shifting out a test signature while resetting the MISR with a fault-free signature. The on-chip logic may further include comparator circuitry to produce an output signal by comparing the test signature with the fault-free signature or by first compressing the test signature and then comparing the compressed test signature with the compressed fault-free signature. | 02-24-2011 |
Patent application number | Description | Published |
20100102978 | Closing System Comprising a Force Sensor - The invention relates to a closing system comprising at least one door provided with at least one displaceable closure element and a closure element receiving member. The at least one closing element of the door lock projects into the closing element receiving member when the closing system is in the closed state. The invention also relates to a keyless entry system for controlling the access of a chamber door, and to a method for controlling the closing state of the closing system comprising at least one door provided with a displaceable closing element and a closing element receiving member, whereby the at least one closing element of the door lock projects into closing element receiving member when the closing system is in the closed state, a force sensor and an evaluation unit. The closing system can be switched, in the closed state, from a first operational state to a second operational state. | 04-29-2010 |
20110187130 | Door Opening Mechanism With Automatic Adjustment Of The Door Opening Latch - The invention describes a remote-actuable door opener for installation in a door having a preferably positionally fixed door frame and having a door leaf movably mounted thereon. The door leaf has a movable door opener catch ( | 08-04-2011 |
20120174337 | CLOSING DEVICE FOR A DOOR - A door closing device for a door is described. The device includes an externally powered and/or spring force-powered catch device F for mounting to the stationary door frame TR or the door leaf TF. The catch device has a movably mounted catch element F and an externally powered and/or force storage means-powered drive assembly M connected to the catch element F. It is essential that the catch element F can be connected to and disconnected from the counterpart element, for example the lock latch S, so that the catch element F can be brought into engagement with the counterpart element S for pulling the door leaf TF shut and can be brought out of engagement with the counterpart element S outside of the pulling-shut movement. | 07-12-2012 |
Patent application number | Description | Published |
20100047840 | Polypeptide markers for the diagnosis of bladder cancer - A method for the diagnosis of bladder cancer (BC) and/or for determining a tumor stage of bladder cancer, comprising the step of determining the presence or absence or amplitude of at least six polypeptide markers in a sample, wherein said polypeptide markers are selected from markers 1 to 836, which are characterized by the values for the molecular masses and migration times (CE time). | 02-25-2010 |
20100062537 | Polypeptide Markers for the Diagnosis and Evaluation of Pelvi-Ureteric Junction Obstruction (PUJO) - A process for diagnosing pelvi-ureteric junction obstruction (PUJO), comprising the step of determining the presence or absence of at least one polypeptide marker in a sample, wherein said polypeptide marker is selected from markers 1 to 277 (frequency markers), or of determining the amplitude of at least one polypeptide marker selected from markers 278-308 (amplitude markers), which are characterized by values for the molecular masses and migration times (CE times). | 03-11-2010 |
20100200401 | Polypeptide Markers for the Early Recognition of the Rejection of Transplanted Kidneys - A method for recognizing rejection after a kidney transplantation (NTx), comprising the step of determining the presence or absence of at least one polypeptide marker in a sample, wherein said polypeptide marker is selected from markers 1 to 242 (frequency markers), or determining the amplitude of at least one polypeptide marker selected from markers 243 to 767 (amplitude markers), which are characterized by the values for the molecular masses and migration times (CE time). | 08-12-2010 |
20150122650 | POLYPEPTIDE MARKERS FOR THE DIAGNOSIS OF BLADDER CANCER - A method for the diagnosis of bladder cancer (BC) and/or for determining a tumor stage of bladder cancer, comprising the step of determining the presence or absence or amplitude of at least six polypeptide markers in a sample, wherein said polypeptide markers are selected from markers 1 to 836, which are characterized by the values for the molecular masses and migration times (CE time). | 05-07-2015 |
20150126405 | POLYPEPTIDE MARKERS FOR THE EARLY RECOGNITION OF THE REJECTION OF TRANSPLANTED KIDNEYS - A method for recognizing rejection after a kidney transplantation (NTx), comprising the step of determining the presence or absence of at least one polypeptide marker in a sample, wherein said polypeptide marker is selected from markers 1 to 242 (frequency markers), or determining the amplitude of at least one polypeptide marker selected from markers 243 to 767 (amplitude markers), which are characterized by the values for the molecular masses and migration times (CE time). | 05-07-2015 |