Wiltse
Daniel L. Wiltse, Davenport, IA US
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20140041351 | Header Height Control System - A header height control system having an operator input device for selecting a desired height of travel of an agricultural harvesting head above the ground, and wherein the system controls the agricultural harvesting head height based at least upon a header height control algorithm that is selected based at least upon the desired height of travel. | 02-13-2014 |
Garry Ronald Wiltse, Drummond Island, MI US
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20120024211 | ARTICULATED MARINE VEHICLE - Stabilizers ( | 02-02-2012 |
Heather Rachelle Wiltse, Bloomington, IN US
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20100185951 | HYBRID SYNCHRONOUS/ASYNCHRONOUS MEANS FOR SHARING USER INTERACTIONS ACROSS MULTIPLE DEVICES - In an aspect of the invention, a method of communication comprises: establishing an asynchronous communication stream between a first user and a second user; and sending clipped dynamic content from the second user to the first user via the asynchronous communication stream, the clipped dynamic content selected and extracted from a web page by the second user. | 07-22-2010 |
Jeff Wiltse, Sheridan, WY US
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20160053920 | Conduit Support Assemblies and Methods - Conduit support assemblies of the present disclosure can include: a rim configured to encompass a plurality of conduit; a plurality of brackets above the rim and extending toward the center of the rim, each of the brackets having a curved opening configured to receive one of the plurality of conduit; and a center cap configured to couple with the plurality of brackets. Conduit support assemblies may also include: a hub defining a plurality of recesses between extensions emanating from a center of the hub, each of the recesses defining an arcuate portion proximate the center of the hub and opposing linear portions extending toward an outward perimeter of the hub; and a plurality of brackets above the hub and extending toward the center of the hub, each of the brackets having a curved opening wherein when coupled to the hub form a complete circular opening configured to embrace conduit. These assemblies can be used to form other assemblies. | 02-25-2016 |
John M. Wiltse, Lake Oswego, OR US
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20100171377 | GIMBAL SYSTEM - A gimbal system. The gimbal system may include space-saving features configured to accommodate one or more payload components, thus increasing the payload capacity of the gimbal ball without necessarily increasing the outer dimensions of the gimbal ball. Alternatively, or in addition, the gimbal system may include a motor configured to move at least one gimbal relative to another gimbal about a first axis, with the motor peripherally mounted distal the axis. | 07-08-2010 |
20110102924 | SPATIALLY EFFICIENT KINEMATIC MIRROR MOUNT - A spatially efficient kinematic mirror mount for mounting a mirror or other optical element to a housing. The kinematic mirror mount may include three spaced-apart constraint structures, positioned at or near the outer perimeter or circumference of the mirror. The constraint structures constrain the mirror to lie within a plane, typically the x-y plane defined by the orientation of the housing, substantially without overconstraining the mirror. To accomplish this, each of the three constraint structures may constrain the mirror in the x-y plane by independently providing a tangential constraint to the mirror. The constraint structures may include a tab, coupled to the mirror by a flexure, and a fastening assembly for securing the tab to the housing. | 05-05-2011 |
Mark Wiltse, Redwood City, CA US
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20080204678 | Temperature effects on overlay accuracy - A method for reducing overlay error in a photolithographic process, by providing a substrate having a permanent layer with a first pattern disposed therein, coating the substrate with photoresist, exposing the photoresist to a second pattern, while measuring temperatures at a plurality of different first positions across the substrate, developing the second pattern in the photoresist, measuring overlay errors between the first and second patterns at a plurality of different second positions across the substrate, correlating the overlay errors with temperatures by position on the substrate, determining any relationship indicated between the correlated overlay errors and temperatures, and adjusting at least one temperature controlling aspect of the photolithographic process in response to any relationship determined. | 08-28-2008 |
20090056441 | PROCESS CONDITION MEASURING DEVICE - An instrument for measuring a parameter comprises a substrate, a plurality of sensors carried by and distributed across a surface of the substrate that individually measure the parameter at different positions, an electronic processing component carried by the substrate surface, electrical conductors extending across the surface connected to the sensors and the electronic processing component, and a cover disposed over the sensors, electronic processing component and conductors. The cover and substrate have similar material properties to a production substrate processed by a substrate processing cell. The instrument has approximately the same thickness and/or flatness as the production substrate. The instrument may be subjected a substrate process and one or more parameters may be measured with the instrument during the process. The behavior of a production wafer in the substrate process may be characterized based on measurements of the parameters made with the one or more sensors. | 03-05-2009 |
20100080957 | Surface Coating - A corrosion barrier is provided, disposed on a substrate. The corrosion barrier includes a vapor corrosion inhibitor (VCI) material and an anti-wetting barrier having a nano-particle composite structure. | 04-01-2010 |
20130029433 | PROCESS CONDITION MEASURING DEVICE - An instrument comprises a substrate, a plurality of sensors distributed at positions across the substrate's surface, at least one electronic processing component on the surface, electrical conductors extending across the surface and connected to the sensors and processing component, and a cover disposed over the sensors, processing component and conductors. The cover and substrate have similar material properties to a production substrate. The cover is configured to electromagnetically shield the sensors, conductors, or processing component. The instrument has approximately the same thickness and/or flatness as the production substrate. It is emphasized that this abstract is provided to comply with rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims. | 01-31-2013 |
Mark Wiltse, Taipei TW
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20100112845 | ELECTRICAL ADAPTER FOR A CONNECTOR HAVING A RETENTION LATCH - An electrical adapter is provided for engaging a connector plug. The adapter comprises a male end, a female end, and a retention member. The male end is disposed at one end of the adapter for connecting the adapter to a female receptacle corresponding to the connector plug. The female end is disposed at another end of the adapter for engaging the connector plug. The female end comprises a top cap having a button disposed thereon. The retention member comprises a holder section, an energy storage section, and an energy release section. The holder section holds the connector plug. The energy storage section stores energy resulting from when the connector plug engages the retention member. When engaged by the button, the energy release section releases the energy stored in the energy storage section such that the connector plug automatically ejects from the adapter. | 05-06-2010 |