Patent application number | Description | Published |
20130194871 | NAND FLASH MEMORY UNIT, NAND FLASH MEMORY ARRAY, AND METHODS FOR OPERATING THEM - A NAND flash memory unit is described, including a string of memory cells connected in series, S/D regions coupled to two terminals of the string, at least one select transistor couple between a terminal of the string and an S/D region, and at least one erase transistor couple between the at least one select transistor and an S/D region. The select transistor is for selecting the string of memory cells. The erase transistor is for reducing Vt-shift of the select transistor. | 08-01-2013 |
20140047160 | DATA WRITING METHOD, AND MEMORY CONTROLLER AND MEMORY STORAGE APPARATUS USING THE SAME - A data writing method for writing data into a memory cell of a rewritable non-volatile memory module, and a memory controller and a memory storage apparatus using the same area provided. The method includes recording a wear degree of the memory cell and adjusting an initial write voltage and a write voltage pulse time corresponding to the memory cell based on the wear degree thereof. The method further includes programming the memory cell by applying the initial write voltage and the write voltage pulse time, thereby writing the data into the memory cell. Accordingly, data can be accurately stored into the rewritable non-volatile memory module by the method. | 02-13-2014 |
20140050024 | DATA READING METHOD, AND CIRCUIT, REWRITABLE NON-VOLATILE MEMORY MODULE AND MEMORY STORAGE APPARATUS USING THE SAME - A data reading method for a rewritable non-volatile memory module, a memory controller using the method, and a memory storage apparatus using the method are provided. The method includes applying a bias for reading data to a target word line electrically connected to a target memory cell and applying a bias for selecting bit lines to a target bit line electrically connected to the target memory cell. The method also includes applying a first bias to at least one word line adjacent to the target word line and applying a second bias to other word lines, and the first bias is lower than the second bias. The method further includes outputting a corresponding value according to a conduction state of a channel of the target memory cell. Accordingly, the method can effectively increase the gate controllability of the memory cell to prevent read errors. | 02-20-2014 |
20140156912 | MEMORY MANAGEMENT METHOD, AND MEMORY CONTROLLER AND MEMORY STORAGE APPARATUS USING THE SAME - A memory management method and a memory controller and a memory storage apparatus using the same are provided. The method includes applying different detection biases to read data stored in physical pages of a rewritable non-volatile memory module and calculating the number of error bits according the read data. The method further includes estimating a value of a wearing degree of each physical page according to the calculated number of error bits and operating the rewritable non-volatile memory module according to the value of the wearing degree of each physical page. Accordingly, the method can effectively identify the wearing degree of the rewritable non-volatile memory module and operate the rewritable non-volatile memory module by applying a corresponding management mechanism, so as to prevent data errors. | 06-05-2014 |
20140160844 | MEMORY REPAIRING METHOD, AND MEMORY CONTROLLER AND MEMORY STORAGE APPARATUS USING THE SAME - A memory repairing method for a rewritable non-volatile memory module and a memory controller and a memory storage apparatus are provided. The method includes monitoring a wear degree of the rewritable non-volatile memory module; determining whether the wear degree of the rewritable non-volatile memory module is larger than a threshold; and heating the rewritable non-volatile memory module such that the temperature of the rewritable non-volatile memory module lies in between 100° C.˜600° C. if the wear degree of the rewritable non-volatile memory module is larger than the threshold. Accordingly, deteriorated memory cells in the rewritable non-volatile memory module can be repaired, thereby preventing data loss. | 06-12-2014 |
20140239380 | NAND FLASH MEMORY UNIT AND NAND FLASH MEMORY ARRAY - A NAND flash memory unit is described, including a string of memory cells connected in series, S/D regions coupled to two terminals of the string, at least one select transistor couple between a terminal of the string and an S/D region, and at least one erase transistor couple between the at least one select transistor and an S/D region. The select transistor is for selecting the string of memory cells. The erase transistor is for reducing Vt-shift of the select transistor. | 08-28-2014 |
20140286105 | NAND FLASH MEMORY UNIT, OPERATING METHOD AND READING METHOD - A NAND flash memory unit, an operating method and a reading method are provided. The NAND flash memory unit includes a plurality of gate layers, a tunnel layer, a charge trapping layer, a conductor layer and a second dielectric layer. A first dielectric layer is included between two adjacent gate layers among the gate layers. The tunnel layer, the charge trapping layer, the conductor layer, and the second dielectric layer penetrate the gate layers. The charge trapping layer is disposed between the tunnel layer and the gate layers, and the second dielectric layer is disposed between the conductor layer and the tunnel layer. Therefore, an erasing speed may be increased; the charge trapping layer may be repaired; the controllability of the gate layers may be increased. | 09-25-2014 |
20140293696 | DATA READING METHOD, AND CONTROL CIRCUIT, MEMORY MODULE AND MEMORY STORAGE APPARATUS AND MEMORY MODULE USING THE SAME - A data reading method for a rewritable non-volatile memory module is provided. The method includes applying a test voltage to a word line of the rewritable non-volatile memory module to read a plurality of verification bit data. The method also includes calculating a variation of bit data identified as a first status among the verification bit data, obtaining a new read voltage value set based on the variation, and updating a threshold voltage set for the word line with the new read voltage value set. The method further includes using the updated threshold voltage set to read data from a physical page formed by memory cells connected to the word line. Accordingly, storage states of memory cells in the rewritable non-volatile memory module can be identified correctly, thereby preventing data stored in the memory cells from losing. | 10-02-2014 |
20140325118 | DATA WRITING METHOD, MEMORY CONTROLLER AND MEMORY STORAGE APPARATUS - A data writing method for writing data into a physical erasing unit and a memory controller and a memory storage apparatus using the data writing method are provided. The method includes dividing the data into a plurality of information frames in a unit of one physical programming unit. The method also includes writing the information frames in sequence into at least one physical programming unit constituted by memory cells disposed on at least one first word line and programming the storage state of memory cells disposed on at least one second word line following the first word line to an auxiliary pattern. Accordingly, the method effectively prevents data stored in the physical erasing unit, which is not full of data, from being lost due to a high temperature. | 10-30-2014 |
20150067446 | DECODING METHOD, MEMORY STORAGE DEVICE AND REWRITABLE NON-VOLATILE MEMORY MODULE - A decoding method, a memory storage device and a rewritable non-volatile memory module are provided. The method includes: reading a plurality of bits from the rewritable non-volatile memory module according to a reading voltage; performing a parity check of a low density parity check (LDPC) algorithm on the bits to obtain syndromes, and each of the bits is corresponding to at least one of the syndromes; determining whether the bits have an error according to the syndromes; if the bits have the error, obtaining a syndrome weight of each of the bits according to the syndromes corresponding to each of the bits; obtaining an initial value of each of the bits according to the syndrome weight of each of the bits; and performing a first iteration decoding of the LDPC algorithm on the bits according to the initial values. Accordingly, the decoding speed is increased. | 03-05-2015 |