Patent application number | Description | Published |
20090192746 | Methods for Altering One or More Parameters of a Measurement System - Methods for altering one or more parameters of a measurement system are provided. One method includes analyzing a sample using the system to generate values from classification channels of the system for a population of particles in the sample. The method also includes identifying a region in a classification space in which the values for the populations are located. In addition, the method includes determining an optimized classification region for the population using one or more properties of the region. The optimized classification region contains a predetermined percentage of the values for the population. The optimized classification region is used for classification of particles in additional samples. | 07-30-2009 |
20090237658 | Methods for Altering One or More Parameters of a Measurement System - Methods for altering one or more parameters of a measurement system are provided. One method includes analyzing a sample using the system to generate values from classification channels of the system for a population of particles in the sample. The method also includes identifying a region in a classification space in which the values for the populations are located. In addition, the method includes determining an optimized classification region for the population using one or more properties of the region. The optimized classification region contains a predetermined percentage of the values for the population. The optimized classification region is used for classification of particles in additional samples. | 09-24-2009 |
20100017358 | Methods, Storage Mediums, and Systems for Configuring Classification Regions Within a Classification Matrix of an Analysis System and for Classifying Particles of an Assay - Methods and systems are provided which include configurations for the reassigning unit locations of a classification matrix at which two or more classification regions overlap as non-classification regions. In addition, methods and systems are provided which include configurations for mathematically creating classification regions which may be characterized by values which more accurately correspond to measured values of particles. Other embodiments of methods and systems include configurations for acquiring data corresponding to measurable parameters of a particle and identifying a location within a classification matrix to which at least some of the data corresponds. Such methods and systems further include configurations for translating either the data corresponding to the identified unit location or a target space located at known locations within the classification matrix a preset number of predetermined coordinate paths until a conclusion that the particle may be classified to particular particle category or a reject class is attained. | 01-21-2010 |
20100228513 | Systems and Methods for Performing Measurements of One or More Materials - Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof. | 09-09-2010 |
20100241360 | Methods, Data Structures, and Systems for Classifying Microparticles - Methods, data structures, and systems for classifying particles are provided. In particular, the methods and systems are configured to acquire a first set of data corresponding to measurable parameters of a microparticle and identify a location of a look-up table to which the first set of data corresponds, wherein the look-up table is framed by values associated with at least one of the measurable parameters. Furthermore, the methods and systems are configured to determine whether the first set of data fits one or more predefined algorithms respectively indicative of a different microparticle classification associated with the identified location of the look-up table. The methods and systems are further configured to classifying the microparticle within at least one predefined categorization based upon the determination of whether the first set of data fits the one or more predefined algorithms. | 09-23-2010 |
20110106495 | Methods for Altering One or More Parameters of a Measurement System - Methods for altering one or more parameters of a measurement system are provided. One method includes analyzing a sample using the system to generate values from classification channels of the system for a population of particles in the sample. The method also includes identifying a region in a classification space in which the values for the populations are located. In addition, the method includes determining an optimized classification region for the population using one or more properties of the region. The optimized classification region contains a predetermined percentage of the values for the population. The optimized classification region is used for classification of particles in additional samples. | 05-05-2011 |
20120002875 | Methods and Systems for Image Data Processing - Methods, storage mediums, and systems for image data processing are provided. Embodiments for the methods, storage mediums, and systems include configurations to perform one or more of the following steps: background signal measurement, particle identification using classification dye emission and cluster rejection, inter-image alignment, inter-image particle correlation, fluorescence integration of reporter emission, and image plane normalization. | 01-05-2012 |
20120002882 | Methods and Systems for Image Data Processing - Methods, storage mediums, and systems for image data processing are provided. Embodiments for the methods, storage mediums, and systems include configurations to perform one or more of the following steps: background signal measurement, particle identification using classification dye emission and cluster rejection, inter-image alignment, inter-image particle correlation, fluorescence integration of reporter emission, and image plane normalization. | 01-05-2012 |
20120008869 | Methods and Systems for Image Data Processing - Methods, storage mediums, and systems for image data processing are provided. Embodiments for the methods, storage mediums, and systems include configurations to perform one or more of the following steps: background signal measurement, particle identification using classification dye emission and cluster rejection, inter-image alignment, inter-image particle correlation, fluorescence integration of reporter emission, and image plane normalization. | 01-12-2012 |
20120028366 | FLOW CYTOMETER AND FLUIDIC LINE ASSEMBLY WITH MULTIPLE INJECTION NEEDLES - A flow cytometer is provided which includes an interrogation flow cell and a plurality of assay fluidic lines extending into the interrogation flow cell. A method of operating such a flow cytometer includes priming the interrogation flow cell with a sheath fluid and injecting different assay fluids into a flow of the sheath fluid through the plurality of fluidic lines. A fluidic line assembly is provided which includes a plurality of capillary tubes coupled to a base section configured for coupling to an interrogation flow cell assembly of a flow cytometer. The capillary tubes are dimensionally configured such that when the fluidic line assembly is arranged within the flow cytometer and fluid is dispensed from one or more of the capillary tubes at a given pressure differential with respect to an encompassing sheath fluid within the interrogation flow cell the fluid is substantially centrally aligned within the interrogation flow cell. | 02-02-2012 |
20130022502 | Systems and Methods for Performing Measurements of One or More Materials - Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof. | 01-24-2013 |
20140219528 | Methods and Systems for Image Data Processing - Methods, storage mediums, and systems for image data processing are provided. Embodiments for the methods, storage mediums, and systems include configurations to perform one or more of the following steps: background signal measurement, particle identification using classification dye emission and cluster rejection, inter-image alignment, inter-image particle correlation, fluorescence integration of reporter emission, and image plane normalization. | 08-07-2014 |