Patent application number | Description | Published |
20090042180 | SYSTEM FOR SAMPLING AND TRACKING PLANT MATERIAL - A system and method for processing, i.e., sampling and tracking, plant material requires the ability to identify each plant in a plurality of plants. Initially, samples are taken from selected plants and are collected in respective storage locations in a magazine. During sampling, the identity of the plant source for each plant sample is stored. Further, the identity of each storage location receiving a plant sample is stored. Subsequently, the samples are transferred from the storage locations and are placed in respective wells of a receiving member for further downstream processing. Again, the identity of each well receiving a plant sample is stored. As a result, a plant sample in a well can be traced back to its plant source. | 02-12-2009 |
20110213492 | TRANSFER STATION FOR PLANT MATERIAL SAMPLING AND TRACKING SYSTEM - Systems and methods for processing plant material samples and a transfer station designed for use in such systems and methods. In one embodiment, the system includes a controller, a plant-material sampling device, and a transfer station. The plant-material sampling device is configured to communicate with the controller and to read an identifier of a plant. The sampling device also has a removable magazine, and is designed to take at least one plant sample from multiple plants, place such samples in the magazine, and track the identity of the plant from which each sample is taken. The transfer station is configured to hold, at multiple positions, multiple magazines and multiple trays such that the positions of the magazines are mirrored by the positions of the trays, read an identifier of each magazine, read an identifier of each tray, map storage locations for each one of the magazines to storage locations of one of the trays, and sequentially unload plant samples from the magazines to the trays. | 09-01-2011 |
20140347446 | METHOD AND APPARATUS FOR IC 3D LEAD INSPECTION HAVING COLOR SHADOWING - A system for three-dimensional inspection of leads mounted on an integrated circuit device includes an integrated circuit device, a first light source having a first color, a second light source having a second color different from the first color, a RGB color camera and a processor. The first light source is disposed at an acute angle to the integrated circuit device, and is configured to illuminate the leads such that lead shadows are created in a first color plane. The second light source is disposed in front of a surface of the integrated circuit device on which the leads are mounted, and is configured to illuminate the leads in a second color plane. The camera is configured to image the illuminated leads and lead shadows. The processor is configured to analyze the first and second color planes of a single image to detect three-dimensional bent leads. | 11-27-2014 |