Patent application number | Description | Published |
20140029616 | DYNAMIC NODE CONFIGURATION IN DIRECTORY-BASED SYMMETRIC MULTIPROCESSING SYSTEMS - Systems and methods that allow for dynamically deconfiguring, reconfiguring and/or otherwise configuring nodes (e.g., processors) in a symmetric multiprocessing system (e.g., a symmetric multiprocessor) in a manner that avoids, or at least limits, inefficiencies such as renumbering of node IDs, system reboots, SW configuration handle changes, and the like. In one arrangement, a number of modules, tables and/or the like that are configured to generate node IDs and/or convert node IDs from one form to another form can be intelligently implemented within an SMP to allow the various processes and/or components of an SMP to utilize the node IDs in a more efficient manner. For instance, as SDs in an SMP are often configured to work with CNIDs (e.g., for use in determining at which node a particular requested cache line resides), any node GNIDs that are sent to the SD for processing can first be converted into corresponding CNIDs. | 01-30-2014 |
20140040526 | COHERENT DATA FORWARDING WHEN LINK CONGESTION OCCURS IN A MULTI-NODE COHERENT SYSTEM - Systems and methods for efficient data transport across multiple processors when link utilization is congested. In a multi-node system, each of the nodes measures a congestion level for each of the one or more links connected to it. A source node indicates when each of one or more links to a destination node is congested or each non-congested link is unable to send a particular packet type. In response, the source node sets an indication that it is a candidate for seeking a data forwarding path to send a packet of the particular packet type to the destination node. The source node uses measured congestion levels received from other nodes to search for one or more intermediate nodes. An intermediate node in a data forwarding path has non-congested links for data transport. The source node reroutes data to the destination node through the data forwarding path. | 02-06-2014 |
Patent application number | Description | Published |
20110037138 | Semiconductor Device having variable parameter selection based on temperature and test method - A semiconductor device that may include temperature sensing circuits is disclosed. The temperature sensing circuits may be used to control various parameters, such as internal regulated supply voltages, internal refresh frequency, or a word line low voltage. In this way, operating specifications of a semiconductor device at worst case temperatures may be met without compromising performance at normal operating temperatures. Each temperature sensing circuit may include a selectable temperature threshold value as well as a selectable temperature hysteresis value. In this way, temperature performance characteristics may be finely tuned. Furthermore, a method of testing the temperature sensing circuits is disclosed in which a current value may be monitored and temperature threshold values and temperature hysteresis values may be thereby determined. | 02-17-2011 |
20110044118 | Semiconductor Device having variable parameter selection based on temperature and test method - A semiconductor device that may include temperature sensing circuits is disclosed. The temperature sensing circuits may be used to control various parameters, such as internal regulated supply voltages, internal refresh frequency, or a word line low voltage. In this way, operating specifications of a semiconductor device at worst case temperatures may be met without compromising performance at normal operating temperatures. Each temperature sensing circuit may include a selectable temperature threshold value as well as a selectable temperature hysteresis value. In this way, temperature performance characteristics may be finely tuned. Furthermore, a method of testing the temperature sensing circuits is disclosed in which a current value may be monitored and temperature threshold values and temperature hysteresis values may be thereby determined. | 02-24-2011 |
20110044119 | Semiconductor Device having variable parameter selection based on temperature and test method - A semiconductor device that may include temperature sensing circuits is disclosed. The temperature sensing circuits may be used to control various parameters, such as internal regulated supply voltages, internal refresh frequency, or a word line low voltage. In this way, operating specifications of a semiconductor device at worst case temperatures may be met without compromising performance at normal operating temperatures. Each temperature sensing circuit may include a selectable temperature threshold value as well as a selectable temperature hysteresis value. In this way, temperature performance characteristics may be finely tuned. Furthermore, a method of testing the temperature sensing circuits is disclosed in which a current value may be monitored and temperature threshold values and temperature hysteresis values may be thereby determined. | 02-24-2011 |
20110044372 | Semiconductor Device having variable parameter selection based on temperature and test method - A semiconductor device that may include temperature sensing circuits is disclosed. The temperature sensing circuits may be used to control various parameters, such as internal regulated supply voltages, internal refresh frequency, or a word line low voltage. In this way, operating specifications of a semiconductor device at worst case temperatures may be met without compromising performance at normal operating temperatures. Each temperature sensing circuit may include a selectable temperature threshold value as well as a selectable temperature hysteresis value. In this way, temperature performance characteristics may be finely tuned. Furthermore, a method of testing the temperature sensing circuits is disclosed in which a current value may be monitored and temperature threshold values and temperature hysteresis values may be thereby determined. | 02-24-2011 |
20110046912 | Semiconductor Device having variable parameter selection based on temperature and test method - A semiconductor device that may include temperature sensing circuits is disclosed. The temperature sensing circuits may be used to control various parameters, such as internal regulated supply voltages, internal refresh frequency, or a word line low voltage. In this way, operating specifications of a semiconductor device at worst case temperatures may be met without compromising performance at normal operating temperatures. Each temperature sensing circuit may include a selectable temperature threshold value as well as a selectable temperature hysteresis value. In this way, temperature performance characteristics may be finely tuned. Furthermore, a method of testing the temperature sensing circuits is disclosed in which a current value may be monitored and temperature threshold values and temperature hysteresis values may be thereby determined. | 02-24-2011 |
20120008447 | SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE - A semiconductor device that may include temperature sensing circuits is disclosed. The temperature sensing circuits may be used to control various parameters, such as internal regulated supply voltages, internal refresh frequency, a word line low voltage, or the like. In this way, operating specifications of a semiconductor device at worse case temperatures may be met without compromising performance at normal operating temperatures. Each temperature sensing circuit may include a selectable temperature threshold value as well as a selectable temperature hysteresis value. In this way, temperature performance characteristics may be finely tuned. Furthermore, a method of testing the temperature sensing circuits is disclosed in which a current value may be monitored an temperature threshold values and temperature hysteresis values may be thereby determined. | 01-12-2012 |
20120243574 | SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD - A semiconductor device that may include temperature sensing circuits is disclosed. The temperature sensing circuits may be used to control various parameters, such as internal regulated supply voltages, internal refresh frequency, or a word line low voltage. In this way, operating specifications of a semiconductor device at worst case temperatures may be met without compromising performance at normal operating temperatures. Each temperature sensing circuit may include a selectable temperature threshold value as well as a selectable temperature hysteresis value. In this way, temperature performance characteristics may be finely tuned. Furthermore, a method of testing the temperature sensing circuits is disclosed in which a current value may be monitored and temperature threshold values and temperature hysteresis values may be thereby determined. | 09-27-2012 |
Patent application number | Description | Published |
20100185919 | Enhanced Error Detection in Multilink Serdes Channels - A method for receiving packet data at a communication channel and transmitting the packet data over serial links of the communication channel. The packet data is sliced into n-bit data portions which are concatenated with a header prior to transmitting an n-bit portion across one of the serial links of the communication channel. The header includes a CRC to provide improved error detection. | 07-22-2010 |
20100185926 | Enhanced Error Detection in Multilink Serdes Channels - A method for receiving packet data at a communication channel and transmitting the packet data over serial links of the communication channel. The packet data is sliced into n-bit data portions which are concatenated with a header prior to transmitting an n-bit portion across one of the serial links of the communication channel. The header includes a CRC to provide improved error detection. | 07-22-2010 |
20120293199 | Programmable Priority Encoder - In one embodiment, a programmable priority encoder is configured to receive inputs, including an ordered list of a plurality of input request values each representing either a request or a non-request, and a starting position within the ordered list of the plurality of input request values. The programmable priority encoder is configured to generate an identification of a result position of a first input indicating said request in order from a position identified from the starting position within the ordered list. In one embodiment, the programmable priority encoder includes a hierarchal structure of logic blocks including a plurality of columns of logic blocks; wherein a first-stage column of the plurality of columns of logic blocks is configured to operate on at most N input values; and wherein the ordered list of the plurality of input request values consists of N input request values. | 11-22-2012 |
20120294305 | Frame Handling Within Multi-Stage Switching Fabrics - Various techniques can be used to handle frames within multi-stage switching fabric. For example, in one method, a frame and an associated frame header are received at a switching fabric stage. The associated frame header includes a first field and a second field. The method selects one or more fabric points of exit within the switching fabric stage, based on the second field. The first field is used to select one or more other fabric points of exit within another switching fabric stage, and thus two different fields within the associated frame header specify fabric points of exit. The method then sends the frame to the selected fabric points of exit within the switching fabric stage. | 11-22-2012 |
Patent application number | Description | Published |
20130307792 | GESTURE TOUCH INPUTS FOR CONTROLLING VIDEO ON A TOUCHSCREEN - In general, this disclosure describes novel techniques for controlling video content on a computing device, such as a mobile computing device. For example, a computing device may execute a media application that provides a video output to a presence-sensitive screen of the computing device. During execution of the media application, the presence-sensitive screen may receive a gesture touch input that has motion with respect to the presence-sensitive screen. The computing device may then rewind or fast forward the video output based at least in part on the gesture touch input. The computing device may display, during the rewinding or fast forwarding of the video output, a plurality of frames of the video output concurrently on the presence-sensitive screen in lateral motion corresponding to the rewinding or fast forwarding. | 11-21-2013 |
20140363168 | USE OF VISIBLE CONNECTION BETWEEN DEVICES TO REPRESENT CONNECTIONS AND INTERACTIONS BETWEEN THE DEVICES - A method and apparatus for conveying using a visual representation extending between an electronic device and a target device, information relating to a wireless connection established between the electronic device and a target device. The visual representation may be setup and/or configured based on a determination of the location and/or position of the target device relative to the electronic device. The visual representation may comprise a visual light or laser beam, which may be emitted by a light or laser source in the electronic device, and may be projected at the target device. The conveying of information may comprise color adjustment of the visual representation based on information being conveyed. The conveyed information may relate to the status of the wireless connection and/or the transfer of data over the wireless connection. The electronic device may comprise a handheld mobile communication device, such as, for example, a smartphone or a tablet. | 12-11-2014 |