Verstappen
Frans Verstappen, Milheeze NL
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20130284687 | AUXILIARY TRANSPORT UNIT AND METHOD FOR USE THEREOF - An auxiliary transport unit is provided in particular for pallets, wherein the pallets include a loading base which, during transport, is oriented substantially horizontally. The auxiliary transport unit has a supporting device which, during transport, extends substantially in the vertical direction. The auxiliary transport unit also includes a connecting device which connects the supporting device to at least one first, lower pallet. The auxiliary transport unit also has a holding device which is connected to the supporting device. The holding device is provided for holding at least one second pallet vertically spaced from the at least one first pallet. | 10-31-2013 |
Griet Annie Frans Verstappen, Moltsel BE
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20130296183 | FUNCTIONAL GENOMICS ASSAY FOR CHARACTERIZING PLURIPOTENT STEM CELL UTILITY AND SAFETY - The present invention generally relates set of reference data or “scorecard” for a pluripotent stem cell, and methods, systems and kits to generate a scorecard for predicting the functionality and suitability of a pluripotent stem cell line for a desired use. In some aspects, a method for generating a scorecard comprises using at least 2 stem cell assays selected from: epigenetic profiling, differentiation assay and gene expression assay to predict the functionality and suitability of a pluripotent stem cell line for a desired use. In some embodiments, the scorecard reference data can be compared with the pluripotent stem cells data to effectively and accurately predict the utility of the pluripotent stem cell for a given application, as well as any to identify specific characteristics of the pluripotent stem cell line to determine their suitability for downstream applications, such as for example, their suitability for therapeutic use, drug screening and toxicity assays, differentiation into a desired cell lineage, and the like. | 11-07-2013 |
Leonardus Henricus Marie Verstappen, Weert NL
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20110085162 | Inspection Method and Apparatus - A method and apparatus is used for inspection of devices to detect processing faults on semiconductor wafers. Illuminating a strip of a die along a scan path with a moving measurement spot. Detecting scattered radiation to obtain an angle-resolved spectrum that is spatially integrated over the strip. Comparing the scattering data with a library of reference spectra, obtained by measurement or calculation. Based on the comparison, determining the presence of a fault of the die at the strip. The measurement spot is scanned across the wafer in a scan path trajectory comprising large (constant) velocity portions and the acquisition of the angle-resolved spectrum is taken, and comparisons are done, at full scan speed. If a long acquisition is performed along a strip across the die in the Y direction, then variation in the acquired spectrum resulting from position variation will primarily depend on the X position of the spot. Spot position variation will occur because no alignment of the spot to the wafer is performed along the high-speed scan path trajectory. A library of reference spectra are obtained for a range of scan paths at respective X-positions on the die to allow for variation in the X position of the high-speed measurement spot. | 04-14-2011 |
20110141444 | Inspection Apparatus for Lithography - A scatterometer configured to measure a property of a substrate, includes a radiation source configured to provide a radiation beam; and a detector configured to detect a spectrum of the radiation beam reflected from a target ( | 06-16-2011 |
20110200246 | Method of Measuring Overlay Error and a Device Manufacturing Method - The overlay error of a target in a scribelane is measured. The overlay error of the required feature in the chip area may differ from this due to, for example, different responses to the exposure process. A model is used to simulate these differences and thus a more accurate measurement of the overlay error of the feature determined. | 08-18-2011 |
20140354969 | Methods and Apparatus for Measuring A Property of a Substrate - In the measurement of properties of a wafer substrate, such as Critical Dimension or overlay a sampling plan is produced ( | 12-04-2014 |
Walter Louis Antoine Verstappen, Kontich BE
Patent application number | Description | Published |
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20110196160 | SYNTHESIS OF (2S-CIS)-2-(BROMOMETHYL)-2-(4-CHLOROPHENYL)-1,3 DIOXOLANE-4-METHANOL METHANESULFONATE(ESTER) - The present invention relates to an improved process for the preparation of (2S-cis)-2-(bromomethyl)- | 08-11-2011 |