Vaissiere
Dimitri Vaissiere, Witterdorf FR
Patent application number | Description | Published |
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20130030746 | Calibration Method - A method of calibrating a measurement device, during which at least one given value of a quantity to be measured by the device is provided by a corresponding reference or standard. The indicated measurement indications and the corresponding given values of the measured quantity are recorded, at least one predefined characteristic property of at least one of the measurement indications is determined and compared to corresponding threshold range. Each threshold range was previously determined based on a statistically representative distribution of the values of the respective property determined based on measurement indications derived during execution of a statistically representative number of performances of measurements according to the respective operation procedure with measurement devices of the same type as the device under calibration. A potentially impaired measurement property of the device under calibration is indicated if at least one determined characteristic property exceeds the respective threshold. | 01-31-2013 |
Dimitri Vaissiere, Wittersdorf FR
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20140338420 | Method of Determining a Calibration or Maintenance Time Interval - A method of determining a calibration or maintenance time interval, comprising the steps of: determining a criticality of the specific device, based on the criticality setting a reliability target for the device, wherein the reliability target denominates the probability of the device to be compliant according to a predefined criterion at the end of the calibration or maintenance time interval; defining compliancy ranges for a measurable degree of compliance of the device; selecting a reliability model for a reliability of the device as a function of a normalized time interval and a set of at least one parameter from a variety of predefined reliability models, determining a separate set of parameters for the selected reliability model for each of the compliancy ranges based on prescribed reliability expectation values for each of the error ranges, which a reliability function associated with this error range shall comply to at at least one predefined normalized time, determining the degree of compliance of the specific measurement device and based on the degree of compliance determining the corresponding compliancy range; determining a normalized calibration or maintenance time as the time, at which a reliability function given by the selected reliability model and the set of parameters determined for this compliancy range equals the reliability target; and determining the next calibration or maintenance time interval based on a product of this normalized calibration or maintenance time and a given reference time interval. | 11-20-2014 |
Dimitri Vaissiere, Wittersdorf DE
Patent application number | Description | Published |
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20140352399 | Method of In Line Verification of a Flow Meter - A method of in line verification of a flow meter installed in a flow line by means of one or two ultrasonic clamp on flow meters to be installed in line with the flow meter u | 12-04-2014 |
20150019151 | Method of Determining a Calibration Time Interval for a Calibration of a Measurement Device - A method of determining a calibration time interval for a calibration of a measurement device for measuring a quantity to be measured, which allows a safe optimization of calibration time intervals between consecutive calibrations. Performing a first calibration of the device at a first calibration time; adjusting, repairing or replacing the device and restarting the method from the beginning in case the first measurement error exceeds a predetermined error range including zero; performing a second calibration of the device at a second calibration time, adjusting, repairing or replacing the device and restarting the method from the beginning in case the second measurement error exceeds a maximum permissible error; determining the calibration time, at which a third calibration of the device shall be performed, and which is determined based on the first and the second measurement error, a probability density function for determining a measurement error of the device solely due to a calibration uncertainty inherent to the first calibration, a probability density function for determining a measurement error of the device solely due to a calibration uncertainty inherent to the second calibration, and the first and the second calibration time. | 01-15-2015 |