Tsukernik
Alexander Tsukernik, Vaughan CA
Patent application number | Description | Published |
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20140367834 | NANOSTRUCTURE AND PROCESS OF FABRICATING SAME - A process of fabricating a nanostructure is disclosed. The process is effected by growing the nanostructure in situ within a trench formed in a substrate and having therein a metal catalyst selected for catalyzing the nanostructure growth, under the conditions in which the growth is guided by the trench. Also disclosed are nanostructure systems comprising a nanostructure, devices containing such systems and uses thereof. | 12-18-2014 |
Michael A. Tsukernik, Newton, MA US
Patent application number | Description | Published |
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20150200812 | DETERMINING WHEN TO RELEARN A RELATIONSHIP BETWEEN A NETWORK ADDRESS AND A PORT - A device may receive a packet, via a first port, that identifies a source network address. The device may determine a second port, identified in a data structure, that is associated with the source network address. The second port may be different from the first port. The device may determine an age indicator, stored in the data structure, associated with the source network address and the second port. The device may compare the age indicator to a threshold, and may selectively perform a first action or a second action based on comparing the age indicator to the threshold. The first action may include maintaining, in the data structure, a first indication of a first relationship between the source network address and the second port. The second action may include storing, in the data structure, a second indication of a second relationship between the source network address and the first port. | 07-16-2015 |
Vladimir Tsukernik, West Roxbury, MA US
Patent application number | Description | Published |
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20080258720 | Hybrid wound/etched winding constructs for scanning and monitoring - Combined wound and micro-fabricated winding constructs are described for the inspection of materials and the detection and characterization of hidden features or flaws. These constructs can be configured as sensors or sensor arrays that are surface mounted or scanned over conducting and/or magnetizable test materials. The well-defined geometry obtained micro-fabricated windings and from carefully wound coils with known winding positions permits the use of model based inversions of sensed responses into material properties. In a preferred embodiment, the primary winding is a wound coil and the sense elements are etched or printed. The drive or sense windings can also be mounted under fasteners to improve sensitivity to hidden flaws. Ferrites and other means may be used to guide the magnetic flux and enhance the magnetic field in the test material. | 10-23-2008 |
20100045277 | Magnetic field characterization of stresses and properties in materials - Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined. | 02-25-2010 |