| Patent application number | Description | Published |
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| 20080246956 | Method Of Instrument Standardization For A Spectroscopic Device - In a spectroscopic process a sample for producing a test spectral line or spectrum of at least one component contained in the sample is stimulated and the transmitted and/or emitted electromagnetic rays are used to create the test spectral line or spectrum. In order to improve such a spectroscopic process to such an extent that variations of certain parameters, which alter the shape and/or occurrence of a spectral line, are compensated, a comparison spectral line or spectrum of a known comparison material is produced under substantially the same parameters as the sample. The comparison spectral line or spectrum is compared with an ideal comparison spectral line or spectrum in order to calculate a transfer function, and | 10-09-2008 |
| 20080309926 | SYSTEMS AND METHODS FOR REDUCING DETECTED INTENSITY NON UNIFORMITY IN A LASER BEAM - A method of increasing the spatial uniformity of the detected intensity of a beam of light from a laser in a system including the laser and a light detector. In one embodiment the method includes the steps of generating a beam of light with the laser; and moving the beam of light and the light detector relative to each other, such that the detector averages the spatial intensity of the beam of light over time. In another embodiment the invention relates to a system for increasing the detected spatial uniformity of the intensity of a beam of light. In one embodiment the system comprises a light detector; a laser source for generating the beam of light; and a means for moving the beam of light and the detector relative to one another such that the detector averages the intensity of the light beam over time. | 12-18-2008 |
| 20090213382 | OPTICAL RESONANCE ANALYSIS UNIT - An array surface plasmon resonance (SPR) analysis instrument comprising a reflective SPR sensor array, a light source assembly arranged to project a collimated beam of light onto the reflective SPR sensor array to provide a reflected array image of the sensor array, and to scan the incident angle of the collimated beam of light over an angular range, and a detector assembly oriented to receive the reflected array image of the sensor array over the angular range, the detector assembly comprises a two-dimensional detector sensing element that is tilted with respect to the optical axis of the lens assembly in accordance with the Scheimpflug condition, and a lens assembly for focusing the reflected array image of said SPR sensor array onto said tilted detector sensing element. The lens assembly comprises an objective section which is arranged to produce a virtual image of the tilted reflected array at infinity, followed by an imaging section arranged to transform the virtual image of the tilted reflected array into a real tilted image on the tilted detector sensing element. | 08-27-2009 |
| 20100332174 | METHOD AND APPARATUS FOR QUANTITATING SURFACE-BINDING OPTICAL RESONANCE PROFILES - Empirical Profile Fits are used to quantitate Surface-binding Optical Resonance profiles. The EPF process has two stages, Calibration and Fit. In the Calibration stage, a calibration surface-binding optical resonance scan is obtained with relatively fine angle or wavelength spacing over a range sufficient to include full resonance profiles for all regions. Smoothed, subsampled empirical profiles for each Region of Interest are generated by the main calibration module, together with first derivative curves and diagnostic information. Properties returned may include approximate resonance position, depth, and width. In the Fit stage, individual ROI scans are used for measurement of resonance shifts relative to the empirical profile. The fitting module identifies the region of the experimental scan encompassing the resonance and fits that region using the previously stored empirical profiles, quantifying and returning the desired values, including the shift in the resonance as compared to its location at calibration, estimated absolute angles or wavelengths, time of resonance minimum, and additional diagnostic and quality information. Optionally, data obtained from either Calibration or Fit stages may be exported for analysis on other systems. In a preferred embodiment, Instrument Control and Data Acquisition Software sets internal parameters in the EPF Calibration module and sends raw data from a calibration scan to the EPF Calibration module, which funnels the data through a Subsampler and a Savitsky-Golay smoothing routine before taking derivatives and characterizing the data to create an empirical profile for the chip. The empirical profiles are then optionally stored. Next, Instrument Control and Data Acquisition Software sets internal parameters in the EPF Fitting module and sends raw data from a run-time scan performed utilizing the chip to the EPF Fitting module, which qualifies it, queries the EPF Calibration module for the empirical profile for the chip, and fits the curve, iterating when necessary. Results from the fitting process are then returned and thereby provided to the user. | 12-30-2010 |
| 20110085168 | Luminescence Reference Standards - The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis. | 04-14-2011 |
