Patent application number | Description | Published |
20080224720 | Support Member Assembly for Conductive Contact Members - Provided is a support member assembly suitable for use in a contact probe head comprising a support member formed with a plurality of holder holes for supporting conductive contact members in a mutually parallel relationship, and a reinforcing member integrally formed with the support member and extending in a part of the support member devoid of any holder holes. The reinforcing member increases the overall mechanical strength of the support member assembly, and prevents the thermal deformation of the support member. Because the holder holes are formed in the support member made of material suitable for forming holes, such as plastic material and ceramic material, the holder holes can be formed at high precision and at low cost. | 09-18-2008 |
20090093161 | Conductive-contact holder and conductive-contact unit - A conductive-contact holder base accommodates at least a signal conductive-contact that is a conductive contact for performing input and output of a signal for a predetermined circuit configuration and a ground conductive-contact that is a conductive contact for supplying a ground potential to the predetermined circuit configuration. A holder base is formed of a conductive material, including a first opening for accommodating the signal conductive-contact; and a second opening for accommodating the ground conductive-contact while maintaining an electrical connection with the ground conductive-contact. An insulating member covers an inner surface of the first opening. | 04-09-2009 |
20090183898 | Conductive Contact and Method of Manufacturing Conductive Contact - A shape of a cross-section perpendicular to a longitudinal direction of a main body section of a conductive contact is anisotropic. | 07-23-2009 |
20090183908 | Method for Manufacturing Conductive Contact Holder, and Conductive Contact Holder - A method for manufacturing a conductive contact holder includes forming, from an insulating material, a holder member for holding a plurality of conductive contacts; forming, from a conductive material, a substrate having a hollow portion to which the holder member can be fitted; and fixing the holder member formed from the insulating material by fitting the substrate into the hollow portion of the substrate formed from the conductive material. | 07-23-2009 |
20100087075 | CONDUCTIVE CONTACT HOLDER, CONDUCTIVE CONTACT UNIT, AND METHOD OF MANUFACTURING CONDUCTIVE CONTACT HOLDER - A conductive contact holder includes a holder substrate and a holding member. The holder substrate is made of a conductive material and has an opening for holding a conductive contact for inputting and outputting a signal to and from a circuit structure. The holding member is formed by filling the opening with an insulating material, smoothing the surface of the insulating material, and forming a hole through the insulating material for inserting the conductive contact. | 04-08-2010 |
20100123476 | CONDUCTIVE CONTACT - A conductive contact includes a first plunger | 05-20-2010 |
20100219536 | CONNECTING TERMINAL, SEMICONDUCTOR PACKAGE, WIRING BOARD, CONNECTOR, AND MICROCONTACTOR - A connecting terminal, a semiconductor package, a wiring board, a connector, and a microcontactor that can achieve a stable contact with a contact target are provided. To achieve the object and to establish an electrical connection to a contact target by making a physical contact with the contact target, there are provided a plurality of conductive terminal-forming members each having a terminal portion, which is extended in a band shape and at least a part of a surface of which forms a curved surface. Each terminal portion is configured so that a part of which is laminated on a part of at least one terminal portion in a thickness direction. All the terminal portions may be laminated at respective tip portions in the thickness direction. | 09-02-2010 |
20100327897 | WIRING SUBSTRATE AND PROBE CARD - A wiring substrate that allows wiring at a fine pitch and has a coefficient of thermal expansion close to the coefficient of thermal expansion of silicone, and a probe card that includes the wiring substrate are provided. To this end, there are provided a wiring substrate that includes a ceramic substrate having a coefficient of thermal expansion of 3×10 | 12-30-2010 |
20110123827 | LATHE MACHINING MEMBER - A cylindrical core portion, at least a part of which is made of a noble metal alloy and which has a diameter larger than a maximum diameter of a shape obtained by lathe machining, and a hollow-cylindrical peripheral portion, which is made of a material different from the material of the core portion, are included. The core portion is arranged in a hollow portion of the peripheral portion with no space. The material applied to the peripheral portion is a free-cutting material selected from a group of, for example, free-cutting brass, free-cutting phosphor bronze, free cutting nickel silver, and free-cutting beryllium copper. The noble metal alloy applied to the core portion is, for example, alloy mainly consisting of silver, palladium, gold, platinum, zinc, copper, iron, and nickel, alloy mainly consisting of palladium, silver, and copper, or alloy mainly consisting of silver, platinum, zinc, gold, and copper. | 05-26-2011 |
20110128025 | ELECTRICAL CONTACT MEMBER AND CONTACT PROBE - An electrical contact member and a contact probe that are durable and economical are provided. For this purpose, an outer peripheral portion, which has a symmetrical shape with respect to a central axis in a longitudinal direction and has a hollow portion, and a core portion, which has an approximate bar shape extending in the longitudinal direction and filling the hollow portion, are included. One of the outer peripheral portion and the core portion is made of a noble metal alloy, and the other is made of a conductive material other than the noble metal alloy. The one of the outer peripheral portion and the core portion, which is made of the noble metal alloy, projects further than the other at one end portion in the longitudinal direction. | 06-02-2011 |
20110227596 | PROBE-UNIT BASE MEMBER AND PROBE UNIT - A probe-unit base member having high rigidity and requiring no troublesome operations for its manufacture and a probe unit are provided. To achieve the purpose, the probe-unit base member includes a conductive substrate | 09-22-2011 |
20120019277 | SPRING WIRE ROD, CONTACT PROBE, AND PROBE UNIT - A spring wire rod includes a wire core that is made of a conductive material having an electrical resistivity of equal to or lower than 5.00×10 | 01-26-2012 |
20130099814 | CONTACT PROBE AND PROBE UNIT - A contact probe includes a conductive first plunger including, on a same axis, a distal end portion, a flange portion, a boss portion, and a base end portion, a conductive second plunger including, on the same axis, a second distal end portion and a boss portion, and a coil spring including a coarsely wound portion formed by winding at a predetermined pitch with an inner diameter equal to or larger than a diameter of the boss portion of the first plunger and a tightly wound portion formed by tightly winding with an inner diameter substantially equal to a diameter of the boss portion of the second plunger, so that the first plunger and the second plunger are connected to each other on the same axis. | 04-25-2013 |