Patent application number | Description | Published |
20090003059 | SEGMENTED BIT LINE FOR FLASH MEMORY - A memory device including segmented bit lines with memory cells coupled to a data cache is provided. A segmented bit line includes a bias transistor to selectively connect the bit line to a source line. Further, a physical implementation showing a segmentation pattern of the memory device is also provided. | 01-01-2009 |
20090168513 | MULTIPLE LEVEL CELL MEMORY DEVICE WITH IMPROVED RELIABILITY - The reliability of multiple level cells in a memory device should be increased by programming the ends of the series strings of memory cells differently than the remaining quantity of memory cells of the series string. The end cells closest to select gate source and select gate drain transistors can be programmed as single level cells while the remaining cells of the string are programmed as multiple level cells. Another embodiment can program only one or more cells at the source end of the series string as single level cells. Still another embodiment can skip programming of the cells at either only the source end or both the source end and the drain end of the series string. | 07-02-2009 |
20100195399 | MEMORY SEGMENT ACCESSING IN A MEMORY DEVICE - Methods for programming memory devices, a memory device, and memory systems are provided. According to at least one such method, bit lines a memory segment are read at substantially the same time by coupling a selected memory segment, and at some of the data lines of any intervening segments, to respective data caches. The bit lines of the unselected memory segments that are not used to couple the selected segment to the data caches can be coupled to their respective source lines. Other methods, devices, and systems are also provided. | 08-05-2010 |
20100309730 | MEMORY ERASE METHODS AND DEVICES - Memory devices and erase methods for memories are disclosed, such as those adapted to discharge an erase voltage from a memory block while protecting low voltage string select gate transistors by maintaining the string select gate transistors in a turned on state during discharge. | 12-09-2010 |
20110149654 | NAND Programming Technique - A NAND memory array is programmed applying a programming voltage Vpgm as a double pulse programming pulse if a data pattern associated with memory cells that are to be programmed form a two-sided column-stripe (CS | 06-23-2011 |
20120092933 | MEMORY ERASE METHODS AND DEVICES - Memory devices and erase methods for memories are disclosed, such as those adapted to discharge an erase voltage from a memory block while protecting low voltage string select gate transistors by maintaining the string select gate transistors in a turned on state during discharge. | 04-19-2012 |
20120163076 | SINGLE CHECK MEMORY DEVICES AND METHODS - Memory devices and methods of operating memory devices are shown. Configurations described include circuits to perform a single check between programming pulses to determine a threshold voltage with respect to desired benchmark voltages. In one example, the benchmark voltages are used to change a programming speed of selected memory cells. | 06-28-2012 |
20120218824 | INDEPENDENT WELL BIAS MANAGEMENT IN A MEMORY DEVICE - Methods for programming a memory device, memory devices configured to perform the disclosed programming methods, and memory systems having a memory device configured to perform the disclosed programming methods, for example, are provided. According to at least one such method, multiple independent semiconductor well regions each having strings of memory cells are independently biased during a programming operation performed on a memory device. Reduced charge leakage may be realized during a programming operation in response to independent well biasing methods. | 08-30-2012 |
20120294088 | MEMORY SEGMENT ACCESSING IN A MEMORY DEVICE - Bit lines of a memory segment are read at substantially the same time by coupling a selected memory segment and, at some of the data lines of any intervening segments, to respective data caches. The bit lines of the unselected memory segments that are not used to couple the selected segment to the data caches can be coupled to their respective source lines. | 11-22-2012 |
20130336065 | ARCHITECTURE FOR 3-D NAND MEMORY - Apparatuses are described that include stacked arrays of memory cell strings and their methods of operation. Apparatuses include architectures that reduce the use of several common components, allowing greater device density and smaller device size for a given semiconductor area. | 12-19-2013 |
20140029346 | CHARGE PUMP REDUNDANCY IN A MEMORY - An integrated circuit includes a circuit block to utilize a load current at a load voltage from a power input and two or more charge pump arrays. The outputs of the charge pump arrays are coupled to the power input of the circuit block. The integrated circuit includes one or more modifiable elements to disable one or more of the two or more charge pump arrays. | 01-30-2014 |
20140122773 | PARTIAL PAGE MEMORY OPERATIONS - Apparatuses may include a memory block with strings of memory cells formed in a plurality of tiers. The apparatus may further comprise access lines and data lines shared by the strings, with the access lines coupled to the memory cells corresponding to a respective tier of the plurality of tiers. The memory cells corresponding to at least a portion of the respective tier may comprise a respective page of a plurality of pages. Subsets of the data lines may be mapped into a respective partial page of a plurality of partial pages of the respective page. Each partial page may be independently selectable from other partial pages. Additional apparatuses and methods are disclosed. | 05-01-2014 |
20140351663 | SINGLE CHECK MEMORY DEVICES AND METHODS - Memory devices and methods of operating memory devices are shown. Configurations described include circuits to perform a single check between programming pulses to determine a threshold voltage with respect to desired benchmark voltages. In one example, the benchmark voltages are used to change a programming speed of selected memory cells. | 11-27-2014 |