Tim Pollock, Ballwin US
Tim Pollock, Ballwin, MO US
Patent application number | Description | Published |
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20080259325 | VISION INSPECTION SYSTEM DEVICE AND METHOD - A course material that is applied to a substrate during fabrication of a composite item is inspected by a system that includes a vision assembly. The vision assembly includes an area light, a line generator, a sensor, and an image processor. The area light illuminates an area of the course material. The line generator generates a line of illumination across the area. The sensor captures an image of the area. The image processor analyzes the image. The image processor is configured to identify debris on the course material in response to the area light being activated and the image processor is configured to identify placement aberrations in response to the line generator being activated. | 10-23-2008 |
20080277042 | IN-PROCESS VISION DETECTION OF FLAWS AND FOD BY BACK FIELD ILLUMINATION - A flaw and foreign object debris (FOD) detection system ( | 11-13-2008 |
20080278716 | IN-PROCESS VISION DETECTION OF FLAWS AND FOD BY BACK FIELD ILLUMINATION - A flaw and foreign object debris (FOD) detection system ( | 11-13-2008 |
20080289742 | IN-PROCESS VISION DETECTION OF FLAWS AND FOD BY BACK FIELD ILLUMINATION - A flaw and foreign object debris (FOD) detection system ( | 11-27-2008 |
20090000723 | IN-PROCESS VISION DETECTION OF FLAW AND FOD CHARACTERISTICS - An inspection system ( | 01-01-2009 |
20090002693 | IN-PROCESS VISION DETECTION OF FLAW AND FOD CHARACTERISTICS - An inspection system ( | 01-01-2009 |
20100204929 | In-Process Vision Detection of Flaw and FOD Characteristics - An inspection system ( | 08-12-2010 |
20130010309 | In-Process Vision Detection of Flaw and FOD Characteristics - An inspection system ( | 01-10-2013 |
20130124110 | IN-PROCESS VISION DETECTION OF FLAW AND FOD CHARACTERISTICS - An inspection system ( | 05-16-2013 |