Patent application number | Description | Published |
20080284448 | TEST APPARATUS AND PIN ELECTRONICS CARD - Provided is a test apparatus that tests a DUT, which includes a driver that outputs a test signal to the DUT, a first transmission path that electrically connects the driver and the DUT, a first FET switch provided on the first transmission path to connect or disconnect the driver and the DUT to or from each other, and a capacitance compensator that detects an output signal from the DUT, and charges or discharges a capacitive component of the first FET switch based on the detected output signal. | 11-20-2008 |
20090051347 | HIGH FREQUENCY DELAY CIRCUIT AND TEST APPARATUS - A high frequency delay circuit operable to output a high frequency signal delayed for a desired delay time. The high frequency delay circuit includes: a variable delay circuit operable to receive a reference signal of which a frequency is lower than the high frequency signal, and to output a delay reference signal delayed from the reference signal for the desired delay time in advance; and a multiplier operable to generate the high frequency signal, of which a frequency is a frequency of the delay reference signal multiplied by a predetermined value, and to output the generated high frequency signal at timing according to a phase of the delay reference signal. | 02-26-2009 |
20090128181 | DRIVER CIRCUIT AND TEST APPARATUS - Provided is a driver circuit that includes a first operational mode and a second operational mode and outputs an output signal according to an input signal, including a first driver section that, in the first operational mode, generates and outputs the output signal according to the input signal and, in the second operational mode, outputs a power supply power having a predetermined voltage and a second driver section that, in the first operational mode, receives the output signal output by the first driver section and outputs the received signal to the outside and, in the second operational mode, generates the output signal according to the input signal and outputs the thus generated signal to the outside. The second driver section includes a first transistor that, in the second operational mode, generates the output signal by operating according to the input signal and receives the power supply power from the first driver section and a second transistor that, in the second operational mode, operates differentially with respect to the first transistor and receives the power supply power from the first driver section commonly with the first transistor. | 05-21-2009 |
20090128182 | DRIVER CIRCUIT AND TEST APPARATUS - Provided is a driver circuit that has a first operational mode and a second operational mode and outputs an output signal according to an input signal. The driver circuit includes a first driver section that, in the first operational mode, generates and outputs the output signal according to the input signal and, in the second operational mode, is controlled to be disabled; a high precision driver section that, in the first operational mode, is controlled to be disabled and, in the second operational mode, outputs a source power having a predetermined voltage; and a second driver section that, in the first operational mode, receives the output signal output by the first driver section and outputs the received signal to the outside and, in the second operational mode, receives the source power from the high precision driver section, generates the output signal according to the input signal, and outputs the thus generated signal to the outside. | 05-21-2009 |
20090134900 | Test apparatus, pin electronics card, electrical device and switch - Provided is a test apparatus for testing a device under test, the test apparatus including: a pattern generating section that inputs a test pattern to the device under test; a judging section that receives an output signal of the device under test, and makes judgment concerning pass/fail of the device under test based on the output signal; an internal circuit that exchanges signals between the device under test and the pattern generating section or the judging section; a first transmission line that connects the internal circuit to the device under test; and a first switch that connects the first transmission line to a ground potential in not testing the device under test, and cuts off the first transmission line from the ground potential in testing of the device under test. | 05-28-2009 |
20090146677 | TEST APPARATUS AND PIN ELECTRONICS CARD - There is provided a test apparatus including a driver that outputs a test signal to a device under test, a first switch that switches whether to connect the driver to the device under test, a comparator that receives an output signal from the device under test via the first switch, and compares a voltage of the output signal with a predetermined reference voltage, a reference voltage input section that inputs the reference voltage into the comparator, a second switch that is provided between the reference voltage input section and the comparator, and a dummy resistance that is connected at one end thereof to a connection point between the comparator and the second switch and at the other end thereof to a predetermined potential. Here, a resistance ratio between an output resistance of the driver and an on-resistance of the first switch is substantially equal to a resistance ratio between the dummy resistance and an on-resistance of the second switch. | 06-11-2009 |
20090158103 | TEST APPARATUS AND TEST METHOD - The apparatus includes a first variable delay circuit that delays a data signal from a device under test (DUT) to output a delay data signal; a second variable delay circuit that delays a clock signal to output a first delay clock signal; a first FF that acquires the delay data signal based on a reference clock; a second FF that acquires the first delay clock signal based on the clock; a first delay adjusting section that adjusts a delay amount of at least one of the first and second variable delay circuits so that the first and second FFs acquire the delay data signal and the first delay clock signal when the signals are changed; a third variable delay circuit that delays the clock signal to output a second delay clock signal; a second delay adjusting section that adjusts a delay amount of the third variable delay circuit based on the acquired first delay clock signal of which a phase is adjusted by the first delay adjusting section when the second delay clock is changed, in order to adjust a phase difference between the first and second delay clock signals to a desired phase difference; a deciding section that decides the quality of the data signal from the DUT based on a result obtained by acquiring the delay data signal when the second delay clock signal is changed. | 06-18-2009 |
20090209210 | DRIVER CIRCUIT AND TEST APPARATUS - Provided is a driver circuit that outputs a transmission signal according to a reception signal received from outside, including a first driver that outputs a voltage according to an input first signal; a second driver that receives the voltage output by the first driver as a power supply voltage and outputs the transmission signal according to the power supply voltage and an input second signal; and a control section that delays both the first signal and the second signal, according to a change of the reception signal, and causes the transmission signal according to the reception signal to be output from the second driver. | 08-20-2009 |
20090322395 | TRANSMISSION PATH DRIVING CIRCUIT - A transmission line driving circuit that can support a high-rate signal transmission and further can perform appropriate loss compensation in accordance with a signal pattern. A transmission line driving circuit | 12-31-2009 |
20100060325 | Driver circuit - A driver circuit includes a main driver which receives an input signal and outputs a first signal corresponding to the input signal, a sub driver which receives the input signal and outputs a non-inverted signal and an inverted signal corresponding to the input signal, a differentiating circuit including resistors and a variable capacity condenser, which outputs signals by differentiating the non-inverted signal and the inverted signal, respectively, and an addition unit which outputs a high frequency emphasized signal given by adding the output signal of the main driver and the signal given by differentiating the non-inverted signal, or a low frequency emphasized signal given by adding the output signal of the main driver and the signal given by differentiating the inverted signal. | 03-11-2010 |
20100109788 | Driver circuit - In a driver circuit | 05-06-2010 |
20100201421 | JITTER GENERATING CIRCUIT - A jitter generating circuit wherein a simple structure can be used to generate a pattern effect jitter. A jitter generating circuit | 08-12-2010 |