Patent application number | Description | Published |
20120123697 | METHOD AND DEVICE FOR IDENTIFYING A MATERIAL OF AN OBJECT - A device for identifying a material of an object including: a source of X photons, and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after scattering in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming a scattering angle. Further, a mechanism adjusts position between the source, the detector, and the object for volume to be at different depths with a constant angle, and a mechanism processes the two magnitudes in two positions and the energy in one position to calculate an attenuation coefficient for estimating the density of the material. | 05-17-2012 |
20120140891 | Method for extracting a primary diffusion spectrum - A method and device for spectrometry analysis and for extracting a primary diffuse spectrum from a diffusion spectrum of diffuse radiation, according to a diffusion angle, coming from a material exposed to incident radiation through a surface, that includes the application of a spectral response function organized in the form of a matrix (M), known as a correlation matrix, of which each value a | 06-07-2012 |
20140286478 | METHOD FOR CHARACTERIZING A MATERIAL - A method for characterizing a material, comprising: arranging a piece of the material near a source of ionizing photons and a detector; irradiating the piece with photons and acquiring, via the detector, two energy spectra of a photon flux that has been diffused into the material at various depths, the ratio of the photon paths in the material before and after diffusion remaining constant; determining a combined attenuation function with the spectra and the paths; selecting a plurality of energy ranges from said function; calculating, in each range, a quantity that is representative of the function; and estimating, from at least two of said quantities, a physical characteristic of the material by comparison with the same quantities obtained from known materials. | 09-25-2014 |
20140348298 | Method Of Analysing A Sample Of Material By Diffractometry And Associated Diffractometer - A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. and The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. measured The spectra are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined. | 11-27-2014 |
20140369473 | Method And Apparatus For Characterising A Material By Scattering Of Electromagnetic Radiation - The invention relates to a device for identifying a material of an object having: a source of X photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after diffusion in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming an angle of diffusion (θ); a configuration for adjusting the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle, a means for processing the two magnitudes in two positions and the energy in on position and for calculating an attenuation factor (μmaterial (E0, E1, ε)), a configuration for estimating the density (p) of the material. | 12-18-2014 |
Patent application number | Description | Published |
20080293636 | Protein Constructs Designed for Targeting and Lysis of Cells - The invention relates to a protein construct, comprising (i) a targeting moiety that is capable of binding to a target cell, and (ii) an effector immunogenic moiety that is capable of triggering an existing, vaccine-induced or natural, immune response. The protein construct, that is preferably in the form of a heteromultimeric protein, is useful for redirecting an immune response that was pre-existing in a patient, toward an undesired target cell. | 11-27-2008 |
20150098943 | PROTEIN CONSTRUCTS DESIGNED FOR TARGETING AND LYSIS OF CELLS - The invention relates to a protein construct, comprising (i) a targeting moiety that is capable of binding to a target cell, and (ii) an effector immunogenic moiety that is capable of triggering an existing, vaccine-induced or natural, immune response. The protein construct, that is preferably in the form of a heteromultimeric protein, is useful for redirecting an immune response that was pre-existing in a patient, toward an undesired target cell. | 04-09-2015 |