Patent application number | Description | Published |
20090058457 | REDUNDANT CRITICAL PATH CIRCUITS TO MEET PERFORMANCE REQUIREMENT - Method, system, IC and design structure for meeting a performance requirement using redundant critical path circuits, are disclosed. In one embodiment, the IC includes a plurality of redundant critical path circuits, wherein at least one of the plurality of redundant critical path circuits meeting a performance requirement is operational and the others are non-operational. | 03-05-2009 |
20090058504 | SELF-POWERED VOLTAGE ISLANDS ON AN INTEGRATED CIRCUIT - The present disclosure is directed to self-powered voltage islands on an integrated circuit. A structure in accordance with an embodiment includes: an integrated circuit including a power source; a voltage island; and an on-board power source provided on the voltage island for powering the voltage island independently of the power source of the integrated circuit. | 03-05-2009 |
20090113358 | MECHANISM FOR DETECTION AND COMPENSATION OF NBTI INDUCED THRESHOLD DEGRADATION - The embodiments of the invention provide a design structure for detection and compensation of negative bias temperature instability (NBTI) induced threshold degradation. A semiconductor device is provided comprising at least one stress device having a voltage applied to its gate node and at least one reference device having a zero gate-to-source voltage. A controller is also provided to configure node voltages of the device and/or the reference device to reflect different regions of device operations found in digital and analog circuit applications. Moreover, the controller measures a difference in current between the stress device and the reference device to determine whether NBTI induced threshold degradation has occurred in the stress device. The controller also adjusts an output power supply voltage of the stress device until a performance of the stress device matches a performance of the reference device to account for the NBTI induced threshold degradation. | 04-30-2009 |
20090119625 | Structure for System Architectures for and Methods of Scheduling On-Chip and Across-Chip Noise Events in an Integrated Circuit - A design structure integrated circuit (IC) system architectures that allow for the reduction of on-chip or across-chip transient noise budgets by providing a means to avoid simultaneous high current demand events from at least two functional logic blocks, i.e., noise contributors, are disclosed. Embodiments of the IC system architectures include at least one noise event arbiter and at least two noise contributor blocks. A method of scheduling on-chip noise events to avoid simultaneous active transient noise events may include, but is not limited to: the noise event arbiter receiving simultaneously multiple requests-to-operate from multiple noise contributors; the noise event arbiter determining when each noise contributor may execute operations based on a pre-established dI/dt budget; and the noise event arbiter notifying each noise contributor as to when permission is granted to execute its operations. | 05-07-2009 |
20090144673 | PARTIAL GOOD SCHEMA FOR INTEGRATED CIRCUITS HAVING PARALLEL EXECUTION UNITS - Processing engines (PE's) disposed on the substrate. Each processing engine includes a measurement and storage unit, and a PE controller coupled to each of the processing engines. The processing engines perform self-tests and store the results of the self-tests in the measurement and storage unit. The PE controller reads the results and selects a sub-set of processing engines based on the results and an optimization algorithm. | 06-04-2009 |
20090150726 | METHOD AND SYSTEM FOR EXTENDING THE USEFUL LIFE OF ANOTHER SYSTEM - Disclosed are embodiments of a method and an associated first system for extending product life of a second system in the presence of phenomena that cause the exhibition of both performance degradation and recovery properties within system devices. The first system includes duplicate devices incorporated into the second system (e.g., on a shared bus). These duplicate devices are adapted to independently perform the same function within that second system. Reference signal generators, a reference signal comparator, a power controller and a state machine, working in combination, can be adapted to seamlessly switch performance of that same function within the second system between the duplicate devices based on a measurement of performance degradation to allow for device recovery. A predetermined policy accessible by the state machine dictates when and whether or not to initiate a switch. | 06-11-2009 |
20090152591 | Design Structure for an On-Demand Power Supply Current Modification System for an Integrated Circuit - A design structure for a circuit that selectively connects an integrated circuit to elements external to the integrated circuits. The circuit includes and input/output element that selectively connects an input/output pin as a function of a power requirement or a signal bandwidth requirement of the integrated circuit. The input/output element includes one or more switching devices that connect the input/output pin to an external element, such as a power supply or external signal path. The input/output element also includes one or more switching devices that connect the input/output pin to an internal element, such as a power network or internal signal line. | 06-18-2009 |
20090152594 | On-Demand Power Supply Current Modification System and Method for an Integrated Circuit - A circuit that selectively connects an integrated circuit to elements external to the integrated circuits. The circuit includes an input/output element that selectively connects an input/output pin as a function of a power requirement or a signal bandwidth requirement of the integrated circuit. The input/output element includes one or more switching devices that connect the input/output pin to an external element, such as a power supply or external signal path. The input/output element also includes one or more switching devices that connect the input/output pin to an internal element, such as a power network or internal signal line. | 06-18-2009 |
20090249091 | SECONDARY POWER UTILIZATION DURING PEAK POWER TIMES - The invention generally relates to the utilization of electric power, and more particularly to systems and methods for selectively utilizing secondary power sources during peak power times. A method includes receiving a notification of a peak power time, and discontinuing use of a primary power supply and beginning use of a secondary power supply based upon the notification. | 10-01-2009 |
20090273239 | SEMICONDUCTOR POWER DISTRIBUTION AND CONTROL SYSTEMS AND METHODS - A system for dynamic integrated circuit power distribution and control is disclosed. The system includes an external power consumption target generator configured to generate a power dissipation target for one or more integrated circuits. The system also includes a first integrated circuit that includes an IC power control unit coupled to the external power consumption target generator. The first integrated circuit also includes a first plurality of functional units, each functional unit of the first plurality including a unit power level control and a first power control grid coupling the IC power control unit to one or more of the first plurality of functional units. The IC power control unit is configured to generate a mode control signal which places at least one of plurality of functional units into a first mode of operation based upon the power consumption target. | 11-05-2009 |
20090276644 | STRUCTURE FOR SEMICONDUCTOR POWER DISTRIBUTION AND CONTROL - A design structure for dynamic integrated circuit power distribution and control is disclosed. The design structure includes an external power consumption target generator configured to generate a power dissipation target for one or more integrated circuits. The design structure also includes a first integrated circuit that includes an IC power control unit coupled to the external power consumption target generator. The first integrated circuit also includes a first plurality of functional units, each functional unit of the first plurality including a unit power level control and a first power control grid coupling the IC power control unit to one or more of the first plurality of functional units. The IC power control unit is configured to generate a mode control signal which places at least one of plurality of functional units into a first mode of operation based upon the power consumption target. | 11-05-2009 |
20100191385 | SYSTEM FOR PREDICTION AND COMMUNICATION OF ENVIRONMENTALLY INDUCED POWER USEAGE LIMITATION - Disclosed are a power management system and associated method that not only initiate a “greenout” to avoid the negative impact of high loads (i.e., to avoid high power cost, negative environmental impact, brownouts, and ultimately blackouts), but can also predict the initiation of such a “greenout”. Predicting the initiation of a “greenout” and communicating the prediction to one or more of the various electronic devices connected to the power grid allows the electronic device(s) to take preparatory action to avoid and/or limit any negative impact that may be caused by the “greenout”. | 07-29-2010 |
20120126836 | MICROELECTROMECHANICAL STRUCTURE (MEMS) MONITORING - A MEMS component is monitored to determine its status. Sensors are deployed to sense the MEMS component and produce detection signals that are analyzed to determine the MEMS component state. An indicator device alerts a user of the status, particularly if the MEMS component has failed. Additionally, the MEMS component monitoring system may be practiced as a design structure encoded on computer readable storage media as part of a circuit design system. | 05-24-2012 |
20120146684 | SWITCH TO PERFORM NON-DESTRUCTIVE AND SECURE DISABLEMENT OF IC FUNCTIONALITY UTILIZING MEMS AND METHOD THEREOF - Structures and methods are provided for performing non-destructive and secure disablement of integrated circuit (IC) functionality. A structure for enabling non-destructive and secure disablement and re-enablement of the IC includes a micro-electrical mechanical structure (MEMS) initially set to a chip enable state. The structure also includes an activation circuit operable to set the MEMS device to an error state based on a detected predetermined condition of the IC. The IC is disabled when the MEMS device is in the error state. | 06-14-2012 |
20120324255 | SECONDARY POWER UTILIZATION DURING PEAK POWER TIMES - Systems and methods for selectively utilizing secondary power sources during peak power times are provided for. The method includes receiving a notification of a peak power time, and discontinuing use of a primary power supply and beginning use of a secondary power supply based upon the notification. | 12-20-2012 |
20140040844 | Method for Achieving An Efficient Statistical Optimization of Integrated Circuits - Method for performing timing closure of integrated circuits in the presence of manufacturing and environmental variations. The starting design is analyzed using statistical static timing analysis to determine timing violations. Each timing violation in its statistical canonical form is examined. In a first aspect of the invention, the canonical failing slack is inspected to determine what type of move is most likely to fix the timing violation taking into account all relevant manufacturing and environmental variations. In a second aspect of the invention, pre-characterized moves such as insertion of delay pad cells are evaluated for their ability to fix the timing violation without triggering timing, and the best move or set of moves is selected. | 02-06-2014 |
20140096100 | METHOD OF SHARING AND RE-USING TIMING MODELS IN A CHIP ACROSS MULTIPLE VOLTAGE DOMAINS - A method and a system for timing analysis of a VLSI circuit or chip design considering manufacturing and environmental variations, where the design includes multiple instances of a gate or macro instantiated at more than one voltage domain by sharing and re-using abstracts. The timing analysis of the chip includes a macro abstract instantiated in a voltage domain different from the domain during abstract generation. Timing models are re-used across chip voltage domains or across chip designs. Moreover, a statistical timing analysis of a chip design takes into consideration the voltage domains wherein at least one timing abstract model generation time voltage domain condition differs from the macro instantiation domain in the chip. The invention further provides sharing and re-using the statistical timing models or abstracts. | 04-03-2014 |
20140149956 | CORNER SPECIFIC NORMALIZATION OF STATIC TIMING ANALYSIS - A method and a system for expressing results of a timing analysis of an integrated circuit (IC) chip design as relative values to drive efficient chip design closure include: using a computer, performing the timing analysis to compute timing results of the chip design across at least two design corners; applying corner specific normalization equations to the timing analysis results from each of the at least two corners to obtain normalized timing results; and using the timing results ordered and filtered by the normalized timing results of the IC chip design for the design closure prior to chip manufacture. The slacks are normalized to provide insight into the degree of difficulty of the required fixes for that slack across corners. Given multiple analyses, the slacks are fixed in a correct order across corners and paths, avoiding inefficient circuit solutions or cost greater design effort. | 05-29-2014 |
20140166461 | THREE-DIMENSIONAL INTER-CHIP CONTACT THROUGH VERTICAL DISPLACEMENT MEMS - An electrically conducting, vertically displacing microelectromechanical system (MEMS) is formed on a first integrated circuit chip. The first integrated circuit chip is physically connected to a three-dimensional packaging structure. The three-dimensional packaging structure maintains a fixed distance between the first integrated circuit chip and a second integrated circuit chip. A control circuit is operatively connected to the MEMS. The control circuit directs movement of the MEMS between a first position and a second position. The MEMS makes contact with a contact pad on the second integrated circuit chip when it is in the second position forming a conductive path and providing electrical communication between the first integrated circuit chip and the second integrated circuit chip. The MEMS avoids making contact with the contact pad on the second integrated circuit chip when it is in the first position. | 06-19-2014 |
20150077173 | THREE-DIMENSIONAL CHIP STACK FOR SELF-POWERED INTEGRATED CIRCUIT - Structures and methods for self-powered devices are disclosed herein. Specifically, disclosed herein is a stacked, three-dimensional integrated circuit including a power generation die including a power source. The integrated circuit also includes a functional system die including one or more functional components that are powered by power generated by the power source. The power generation die and the functional system die are stacked in a three-dimensional structure. | 03-19-2015 |