Patent application number | Description | Published |
20080238441 | Vector Network Analyzer-Noise Figure Measurement - A noise receiver is included in a network analyzer block diagram such that noise power and S-parameters measurements can be made almost simultaneously without mechanical switching in the test set. Additionally, a variable mismatch device tuner that is used by the network analyzer for S-parameter calibrations, is further used during the noise figure measurements method to remove the effect of source match variations so that the expected noise figure performance of the DUT when connected to a desired input (probably 50 ohms) can be determined. | 10-02-2008 |
20090167323 | Dynamic Range Recovery for Pulse-Modulated Measurements - A system composed of an RF input, a receiver system and, connected in series between the RF input and the receiver, an amplifier, a gate switch and a bandpass filter. The receiver system is operable to determine the characteristic of the DUT based on an RF input signal received from the DUT. The amplifier receives and amplifies the RF input signal to generate an amplified signal at a power level that exceeds the maximum input power of the receiver system. The bandpass filter is configured to select from the gated signal a selected signal comprising a wanted frequency component. The band-pass filter has a rise-time in relation to the ON time of the gate switch such that the selected signal has a maximum power that does not exceed the maximum input power of the receiver system. In another embodiment, the system additionally comprises a mixer interposed between the RF input and the amplifier. | 07-02-2009 |
20120153933 | METHOD AND SYSTEM FOR PRODUCING A SIGNAL WITH A POWER CHANGE DETERMINED BY A PHASE OR FREQUENCY DIFFERENCE BETWEEN TWO SIGNAL SOURCES - A system and method for determining the linearity of a device-under-test combine a first periodic signal and a second periodic signal to produce a combined signal, wherein the second periodic signal has at least one of a phase difference and a frequency difference with respect to the first periodic signal, and applying the combined signal to an input of the device-under-test. The linearity of the device-under-test is determined from an output signal of the device-under-test based on the at least one of the phase difference and frequency difference between the first periodic signal and the second periodic signal. | 06-21-2012 |