Patent application number | Description | Published |
20100252738 | INSPECTION APPARATUS AND INSPECTION METHOD USING ELECTROMAGNETIC WAVE - An apparatus for acquiring information on a time waveform of a terahertz wave is comprised of a terahertz wave-generating unit, a waveform information-detecting unit, and a delay unit for changing the time after the terahertz wave is generated in the generating unit until it is detected as waveform information of the terahertz wave in the detecting unit, wherein the delay unit is configured so as to change a propagating distance of the terahertz wave generated by the generating unit, and associates waveform information of the terahertz wave, which is detected in the detecting unit, and the propagating distance every terahertz wave generated by the generating unit. | 10-07-2010 |
20100258727 | WAVEFORM INFORMATION ACQUISITION APPARATUS AND WAVEFORM INFORMATION ACQUISITION METHOD - Provided are an apparatus and a method which enable acquisition of a temporal waveform of a propagating terahertz wave by changing a propagation velocity of the terahertz wave. A waveform information acquisition apparatus includes a generation portion for generating a terahertz wave, a propagation portion for allowing the terahertz wave generated by the generation portion to propagate therethrough, a detection portion for detecting waveform information of the terahertz wave, a first delay portion for changing a propagation velocity of the terahertz wave, and a control portion for controlling the first delay portion to change the propagation velocity of the terahertz wave in the propagation portion, and acquires information regarding the temporal waveform of the terahertz wave detected by the detection portion. | 10-14-2010 |
20110267600 | EXAMINING APPARATUS - In an examining apparatus or method, values of thickness and characteristic of an object, or distributions thereof can be simultaneously acquired. The examining apparatus includes a portion | 11-03-2011 |
Patent application number | Description | Published |
20080197286 | DEFLECTION DEVICE AND IMAGING APPARATUS - A deflection device includes a tabular object for transmitting or reflecting an electromagnetic wave, a drive unit for driving the tabular object so as to rotate or perform a translation motion, and an electromagnetic wave irradiation unit for irradiating the tabular object with an electromagnetic wave so that an irradiation area extending in a direction intersecting a direction of the rotation or translation motion of the tabular object is formed. The deflection device is characterized in that, in order to change a direction of transmission or reflection of an electromagnetic wave radiated on the irradiation area by the rotation or translation motion of the tabular object, a plurality of grooves extending in an in-plane direction of the tabular object is provided in a section of the tabular object along a longitudinal direction of the irradiation area, and the plurality of grooves is formed so that intervals of the plurality of grooves which passes through the irradiation area are changed by the rotation or translation motion of the tabular object. | 08-21-2008 |
20080224071 | INSPECTION APPARATUS - The invention is to provide an inspection apparatus causing interactions of plural times between an object and an electromagnetic wave, thereby enabling inspection with a satisfactory sensitivity even for an object of a trace amount. The inspection apparatus detects information from an object 112 based on a change in an electromagnetic wave transmission state caused by plural times of interactions between the electromagnetic wave and the object 112. The inspection apparatus includes a transmission line 16, an electromagnetic wave supplying and detecting unit 111 for supplying the transmission line 16 with the electromagnetic wave and detecting the electromagnetic wave, a reflection unit 110 for reflecting the electromagnetic wave transmitting through the transmission line 16, and an inspection unit 113 for placing the object 112 between the electromagnetic wave supplying and detecting unit 111 and the reflection unit 110, wherein the transmission line 16, the reflection unit 110 and the inspection unit 113 are formed on a same substrate 11. | 09-18-2008 |
20090201030 | Method and apparatus for inspecting an object using terahertz electromagnetic wave - An inspection apparatus including a transmission line for propagating an electromagnetic wave; an electromagnetic wave supply unit for supplying a terahertz wave to the transmission line; an electromagnetic wave detection unit for detecting the terahertz wave from the transmission line; a conductive region; an inspection object supply unit; and a deposition unit. The conductive region is arranged at a site including at least a part of the range to which an electric field distribution of the electromagnetic wave propagating through the transmission line extends. The inspection object supply unit holds and supplies the inspection object to the outside, and the deposition unit deposits the inspection object selectively on the conductive region by electrostatic force. The electromagnetic wave supplied from the electromagnetic wave supply unit and propagated through the transmission line is detected by the electromagnetic wave detection unit to obtain information on the inspection object. | 08-13-2009 |
20090236529 | DETECTING APPARATUS, AND DETECTING METHOD - A detecting apparatus for detecting information of a liquid object or sample includes a transmission path, a THz wave supplying unit, a THz wave detecting unit, and an infiltrative holding member for infiltration and holding of a liquid object. The supplying unit supplies an electromagnetic wave in a frequency range between 30 GHz and 30 THz to the transmission path. The detecting unit detects the THz wave transmitted through the transmission path. The infiltrative holding member is set at a location containing at least a portion in which an electric field distribution of the THz wave propagating along the transmission path extends. | 09-24-2009 |
20100052083 | PHOTOCONDUCTIVE DEVICE - A photoconductive device comprising a photoconductive portion for generating carriers by applied excitation light; a resistance portion in contact with the photoconductive portion; a first conductive portion in contact with the resistance portion; and a second conductive portion that is provided so as to have a gap with respect to the first conductive portion and is in contact with the photoconductive portion. | 03-04-2010 |
20100171835 | IMAGING METHOD AND APPARATUS - An object of examination is irradiated with an electromagnetic wave including a frequency component from 30 GHz to 30 THz and a Fourier transform image of the transmitted or reflected electromagnetic wave from the object of examination is obtained. The obtained Fourier transform image is subjected to a spatial frequency filtering processing. This method can visualize only the part to be visualized in an imaging operation using a terahertz wave. | 07-08-2010 |