Patent application number | Description | Published |
20080231940 | Laser drawing method and apparatus - A method of laser drawing includes steps of causing laser light from a light source to be incident to an acousto-optical diffraction element, and deflecting the light incident to the element by changing a frequency of a high frequency signal to be inputted to the element to diffract the light, thereby changing a diffraction angle of the diffracted light, and condensing the diffracted light emerging from the element on an object to be processed as an optical spot, thereby scanning the object with the optical spot. A diffracted light intensity control table for controlling a light intensity of the diffracted light so as to be constant independent of the diffraction angle of the diffracted light is prepared in advance, and in the deflecting step, the light intensity of the diffracted light is controlled based on the diffracted light intensity control table. | 09-25-2008 |
20080233361 | PATTERN-FORMED SUBSTRATE, PATTERN-FORMING METHOD, AND DIE - A pattern-formed substrate is provided. The pattern-formed substrate includes a substrate base, an organic thin film and an inorganic resist film stacked on the substrate base in this order, and patterns having predetermined aspect ratios formed on the organic thin film and the inorganic resist film, respectively. The pattern of the organic thin film is formed by selective etching using the pattern of the inorganic resist film as a mask. | 09-25-2008 |
20090101847 | OPTICAL MEASURING DEVICE, OPTICAL MEASURING APPARATUS AND FINE PARTICLE MEASURING APPARATUS USING OPTICAL MEASURING DEVICE - Disclosed herein is an optical measuring device, including: a plurality of microfluidic channels extending in parallel to each other; and a scanning section configured to scan a plurality of measuring light beams in a scanning direction in which the microfluidic channels are juxtaposed to optically measure fine particles introduced into the microfluidic channels. | 04-23-2009 |
20090108214 | OPTICAL DETECTION METHOD AND OPTICAL DETECTION APPARATUS FOR A FINE PARTICLE - Disclosed herein is an optical detection method and optical detection apparatus, the apparatus including: a light irradiation section configured to irradiate a laser beam upon one of fine particles which are successively fed in a flow path; and a light detection section configured to detect fluorescent light and/or scattered light generated from any of the fine particles upon which the laser beam is irradiated; the method including the steps of: irradiating a laser beam upon one of fine particles which are successively fed in a flow path; and detecting fluorescent light and/or scattered light generated from the fine particle; wherein the laser beam being formed as a pulse laser beam whose pulse intensity is modulated such that one laser beam or two or more laser beams having different wavelengths are irradiated by a plural number of times upon one fine particle with the intensity varied. | 04-30-2009 |
20090116005 | FINE PARTICLE MEASURING METHOD, SUBSTRATE FOR MEASUREMENT, AND MEASURING APPARATUS - A fine particle measuring method of performing optical measurement of fine particles introduced into a plurality of sample fluidic channels provided at predetermined distances on a substrate by scanning light to the sample fluidic channels is disclosed. The method includes: sequentially irradiating the light to at least two or more reference regions provided together with the sample fluidic channels; detecting a change of optical property occurring in the light due to the reference regions; and controlling timing of emission of the light to the sample fluidic channels. | 05-07-2009 |
20090189302 | METHOD FOR MANUFACTURING MICROLENS AND METHOD FOR MANUFACTURING SOLID-STATE IMAGE SENSOR - A method for manufacturing a microlens includes forming a microlens by pressing a microlens mold having a reverse shape of a microlens formed therein on a microlens-forming film formed on a substrate to transfer the reverse shape of the microlens to the microlens-forming film. The microlens mold is formed by irradiating an inorganic resist film which is formed on a mold substrate with exposure light by relative two-dimensional scanning, and etching an exposed region of the inorganic resist film to form the reverse shape of the microlens. The irradiation intensity of the exposure light is adjusted to correspond to the depth of the reverse shape of the microlens from the surface of the inorganic resist film on the basis of profile data of the reverse shape of the microlens. | 07-30-2009 |
20090231648 | HOLOGRAM SUBSTRATE, METHOD FOR PRODUCING SAME, AND ELECTRONIC DEVICE - A hologram substrate includes a hologram section arranged on a surface of the hologram substrate, the hologram section having an uneven pattern configured to form a holographic image, in which the uneven pattern is a depth-modulated pattern and has smooth boundaries between projections and depressions. | 09-17-2009 |
20090294702 | OPTICAL MEASURING INSTRUMENT, AND WAVELENGTH CALIBRATION METHOD AND OPTICAL MEASURING METHOD FOR LIGHT DETECTOR - An optical measuring instrument includes: a flow channel for allowing a specimen to be circulated therein; a first light source including a light emitting diode for emitting light to be used for optical adjustment and/or image confirmation in the flow channel; a second light source for irradiating light upon the specimen circulated in the flow channel; and a light detector for detecting the spectrum intensity of the light emitted from the first and second light sources. | 12-03-2009 |
20100020321 | OPTICAL MEASURING DEVICE - An optical measuring device is provided. The optical measuring device irradiates a sample flowing in a channel with light, and detecting light emitted from the sample, wherein the light is applied while scanned at least from one side wall to another side wall of the channel in a direction of width of the channel, and scattered light at a preset threshold value or higher is detected as scattered light from edge parts in the direction of width of the channel. | 01-28-2010 |
20100096560 | OPTICAL MEASURING DEVICE - An optical measuring device includes: a light applying section configured to apply laser light to a sample flowing in a channel; and a fluorescence detecting section configured to detect fluorescence generated from the sample irradiated with the laser light; the fluorescence detecting section including a multichannel photomultiplier tube having a plurality of detection channels capable of simultaneously detecting a plurality of light beams, a light separator configured to separate the fluorescence according to wavelengths to provide the plurality of light beams, the light separator being provided by a transmission grating or a prism, and a telecentric condenser lens configured to receive the plurality of light beams from the light separator and direct the plurality of light beams toward the plurality of detection channels of the multichannel photomultiplier tube so that the optical axes of the plurality of light beams are parallel to each other. | 04-22-2010 |
20110222050 | OPTICAL MEASURING DEVICE AND OPTICAL MEASURING METHOD - Disclosed herein is an optical measuring device including: a light applying section configured to apply exciting light to a sample flowing in a channel; and a scattered light detecting section configured to detect scattered light generated from the sample irradiated with the exciting light on the downstream side of the sample in the traveling direction of the exciting light; the scattered light detecting section including a scattered light separating mask for separating the scattered light into a low numerical aperture component having a numerical aperture not greater than a specific value and a high numerical aperture component having a numerical aperture greater than the specific value; a first detector for detecting the low numerical aperture component; and a second detector for detecting the high numerical aperture component. | 09-15-2011 |
20120153185 | MICROCHIP AND PARTICULATE FRACTIONAL COLLECTION APPARATUS - A microchip includes a sample liquid feed channel permitting a sample liquid containing particulates to flow through, at least one pair of sheath liquid feed channels configured to merge to the sample liquid feed channel from both sides thereof for permitting a sheath liquid to flow through surrounding the sample liquid, a merging channel connected to the sample liquid feed channel and the one pair of the sheath liquid feed channels for permitting the sample liquid and the sheath liquid to merge and flow through the merging channel, a vacuum suction unit for drawing into the particulate subject to collection, connected to the merging channel, and at least one pair of discharge channels formed on both sides of the vacuum suction unit for permitting to flow through from the merging channel. | 06-21-2012 |
20140293273 | OPTICAL MEASURING DEVICE AND OPTICAL MEASURING METHOD - Disclosed herein is an optical measuring device including: a light applying section configured to apply exciting light to a sample flowing in a channel; and a scattered light detecting section configured to detect scattered light generated from the sample irradiated with the exciting light on the downstream side of the sample in the traveling direction of the exciting light; the scattered light detecting section including a scattered light separating mask for separating the scattered light into a low numerical aperture component having a numerical aperture not greater than a specific value and a high numerical aperture component having a numerical aperture greater than the specific value; a first detector for detecting the low numerical aperture component; and a second detector for detecting the high numerical aperture component. | 10-02-2014 |