Seito
Akira Seito, Tokyo JP
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20080303173 | SEMICONDUCTOR DEVICE, A METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND A TESTING METHOD OF THE SAME - A semiconductor device for SiP or PoP for downsizing, a method of manufacturing it, and a testing method suitable for SiP and PoP in which the simplification of a system and the enhancement of its efficiency are achieved are provided. A first semiconductor device including a first memory circuit determined as non-defective and a second semiconductor device including a second memory circuit and a signal processing circuit carrying out signal processing according to a program, determined as non-defective are sorted. The sorted devices are assembled as an integral semiconductor device. On a board for testing, a clock signal equivalent to the actual operation of the semiconductor device is supplied. A test program for conducting a performance test on the first memory circuit is written from a tester to the second memory circuit of the second semiconductor device. In the signal processing circuit, a performance test is conducted on the first memory circuit according to the written test program in correspondence with the clock signal. The result of failure/no-failure determination in this performance test is outputted to the tester. | 12-11-2008 |
20110018573 | Semiconductor Device, A Method of Manufacturing A Semiconductor Device and A Testing Method of the Same - A semiconductor device for SiP or PoP for downsizing, a method of manufacturing it, and a testing method suitable for SIP and PoP in which the simplification of a system and the enhancement of its efficiency are achieved are provided. A first semiconductor device including a first memory circuit determined as non-defective and a second semiconductor device including a second memory circuit and a signal processing circuit carrying out signal processing according to a program, determined as non-defective are sorted. The sorted devices are assembled as an integral semiconductor device. On a board for testing, a clock signal equivalent to the actual operation of the semiconductor device is supplied. A test program for conducting a performance test on the first memory circuit is written from a tester to the second memory circuit of the second semiconductor device. In the signal processing circuit, a performance test is conducted on the first memory circuit according to the written test program in correspondence with the clock signal. The result of failure/no-failure determination in this performance test is outputted to the tester. | 01-27-2011 |
Akira Seito, Akishima JP
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20080293167 | FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE - A memory test is carried out on semiconductor integrated circuit devices including a semiconductor memory at low cost with efficiency. In a test burn-in system, twenty-four test boards are processed in sequence with time differences, and the test boards are circulated one by one. In this case, the memory test is conducted with the sequence of single board processing: the test is started with a test board in which semiconductor integrated circuit devices have been embedded, and semiconductor integrated circuit devices are discharged, beginning with a test board that has undergone the test. | 11-27-2008 |
Shigemitsu Seito, Nanae JP
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20110156220 | MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE - A method to prevent contamination of the principal surface side in a process of grinding the back surface side of a semiconductor wafer. At an intersection of a scribe region of a semiconductor wafer whose back surface side is to be ground, a plurality of insulating layers is laminated over the principal surface in the same manner as an insulating layer constituting a wiring layer laminated over a device region. Moreover, in the same layer as an uppermost wiringdisposed at the uppermost layer among a plurality of the wiring layers formed for a device region, a metal pattern is formed. Furthermore, a second insulating layer covering the uppermost wiring is also formed over the metal pattern so as to cover the same. | 06-30-2011 |
20130017669 | MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE - A method to prevent contamination of the principal surface side in a process of grinding the back surface side of a semiconductor wafer. At an intersection of a scribe region of a semiconductor wafer whose back surface side is to be ground, a plurality of insulating layers is laminated over the principal surface in the same manner as an insulating layer constituting a wiring layer laminated over a device region. Moreover, in the same layer as an uppermost wiring disposed at the uppermost layer among a plurality of the wiring layers formed for a device region, a metal pattern is formed. Furthermore, a second insulating layer covering the uppermost wiring is also formed over the metal pattern so as to cover the same. | 01-17-2013 |
Tsutomu Seito, Gunma JP
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20100111939 | MONOCLONAL ANTIBODY AND USE THEREOF - The purpose of the invention is to provide an antibody which recognizes OPN N-half but does not recognize the full-length OPN, and its use. A monoclonal antibody which is characterized in that it recognizes a protein or polypeptide in which the C-terminal amino acid sequence is YGLR (SEQ ID NO: 1) and it substantially does not recognize a protein or polypeptide which has an amino acid sequence of YGLR outside of the C-terminal, as well as a method for measuring OPN N-half utilizing the said antibody, a method for diagnosing diseases relating to OPN N-half, a method for judging the severity of said disease, and a method for treating said diseases, are provided. | 05-06-2010 |
20100323375 | AGENT AND METHOD FOR DIAGNOSIS ON THE OCCURRENCE OF ALZHEIMER'S DISEASE OR THE TENDENCY TO DEVELOP ALZHEIMER'S DISEASE - Disclosed are: an agent, an apparatus and a method for the diagnosis of a disease associated with the abnormality in γ-secretase; a method for providing information for the diagnosis of a disease associated with the abnormality in γ-secretase; a method for monitoring the condition or the degree of progression of a disease associated with the abnormality in γ-secretase; and a method for determining the therapeutic effect of a therapeutic agent on a disease associated with the abnormality in γ-secretase. More specifically disclosed are: a diagnostic agent for a disease associated with the abnormality in γ-secretase, which comprises an antibody capable of recognizing a digestion product of an alcadein with α-secretase or γ-secretase or a fragment of the antibody; and others. | 12-23-2010 |
20110129524 | THERAPEUTIC AGENT FOR CANCER, AND METHOD FOR TREATMENT OF CANCER - [Problems] To provide a technique which enables an effective antibody therapy for cancer which targets for FGFR1 without the need of using any effective antibody having high specificity and a potent cell-killing activity. | 06-02-2011 |
Tsutomu Seito, Takasaki-Shi JP
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20110312000 | MONOCLONAL ANTIBODY AND USE THEREOF - The purpose of the invention is to provide an antibody which recognizes OPN N-half but does not recognize the full-length OPN, and its use. A monoclonal antibody which is characterized in that it recognizes a protein or polypeptide in which the C-terminal amino acid sequence is YGLR (SEQ ID NO: 1) and it substantially does not recognize a protein or polypeptide which has an amino acid sequence of YGLR outside of the C-terminal, as well as a method for measuring OPN N-half utilizing the said antibody, a method for diagnosing diseases relating to OPN N-half, a method for judging the severity of said disease, and a method for treating said diseases, are provided. | 12-22-2011 |
Tsutomu Seito, Fujioka-Shi JP
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20120219552 | ANTIBODY RECOGNIZING TURN STRUCTURE IN AMYLOID BETA - Provided is a therapeutic method exclusively targeting an amyloid β protein (Aβ) having a specific turn structure of Aβ. Specifically provided is an antibody which specifically recognizes an amyloid β having a turn structure at amino acids positions 22 and 23. Also provided are a medicinal composition comprising, as the active ingredient, an antibody specifically recognizing a toxic conformer of amyloid β, an assay kit for a toxic conformer of amyloid β, a diagnostic for Alzheimer's disease, etc. | 08-30-2012 |
20140135483 | SOLUBLE INTEGRIN ALPHA-4 MUTANT - The present invention addresses the problem of providing a novel substance capable of interfering with various functions of integrin α4, and/or providing a novel substance capable of interfering with both integrin α4 and integrin α9. The present invention provides an integrin α4 mutant peptide having one portion of the extracellular domain of human integrin α4, and the like, and in concrete terms relates to a peptide and the like having the amino acid sequence of Sequence No. 4 through 9, and a pharmaceutical composition comprising as the active ingredient the same peptide. | 05-15-2014 |