Patent application number | Description | Published |
20100263914 | Floating Metal Elements in a Package Substrate - A plurality of metal elements formed in an electronic package. The electronic package includes an electronic substrate and a plurality of metal elements disposed in a layer of the substrate. The plurality of metal elements do not serve an electrical function in the layer. Also, each of the plurality of metal elements is floating in the layer. In another embodiment, a method for optimizing the design of a package substrate is provided. The method includes identifying a space in a layer of the substrate that is free of metal and forming a plurality of metal elements in the identified space, where the plurality of metal elements do not serve an electrical function. | 10-21-2010 |
20100270061 | Floating Metal Elements in a Package Substrate - A plurality of metal elements formed in an electronic package. The electronic package includes an electronic substrate and a plurality of metal elements disposed in a layer of the substrate. The plurality of metal elements do not serve an electrical function in the layer. Also, each of the plurality of metal elements is floating in the layer. In another embodiment, a method for optimizing the design of a package substrate is provided. The method includes identifying a space in a layer of the substrate that is free of metal and forming a plurality of metal elements in the identified space, where the plurality of metal elements do not serve an electrical function. | 10-28-2010 |
20110115083 | Semiconductor Package Assembly Systems and Methods using DAM and Trench Structures - A packaging system for preventing underfill overflow includes a package substrate having a solder mask a die attach site, a solder mask dam on the solder mask proximal to the die attach site, and a trench in the solder mask proximal to the die attach site. The trench and the solder mask dam are adapted to constrain flow of an underfill material. | 05-19-2011 |
20120068175 | Method to Optimize and Reduce Integrated Circuit, Package Design, and Verification Cycle Time - A method for fabricating an integrated circuit (IC) product and IC product formed thereby. The method includes designing an IC package having a plurality of IC connection sets, each configured to be connected to a corresponding IC selected from among a plurality of ICs, each having different functionality. Various IC products can be produced depending upon which selected IC is connected to its corresponding connection set, and the IC package can be cut during design to exclude IC connection sets corresponding to ICs that are not selected. By testing the complete IC package, a portion of the complete IC package can be fabricated, cut from the complete IC package, with significantly reduced design and testing requirements. | 03-22-2012 |
20140097512 | HYBRID SEMICONDUCTOR MODULE STRUCTURE - Some implementations provide a structure that includes a first package substrate, a first component, a second package substrate, a second component, and a third component. The first package substrate has a first area. The first component has a first height and is positioned on the first area. The second package substrate is coupled to the first package substrate. The second package substrate has second and third areas. The second area of the second package substrate vertically overlaps with the first area of the first package substrate The third area of the second package substrate is non-overlapping with the first area of the first package substrate. The second component has a second height and is positioned on the second area. The third component is positioned on the third area. The third component has a third height that is greater than each of the first and second heights. | 04-10-2014 |
20150228594 | VIA UNDER THE INTERCONNECT STRUCTURES FOR SEMICONDUCTOR DEVICES - A semiconductor device is provided that has a redistribution layer with reduced resistance. The semiconductor device comprises a plurality of bonding pads on a substrate, a redistribution layer coupled to the bonding pads through a plurality of vias, a dielectric layer over the redistribution layer, that includes an opening that exposes a portion of the redistribution layer. The bonding pads are at least partially under the opening. | 08-13-2015 |
20150313006 | STAGGERED POWER STRUCTURE IN A POWER DISTRIBUTION NETWORK (PDN) - Some novel features pertain to an integrated device that includes a first metal layer and a second metal layer. The first metal layer includes a first set of regions. The first set of regions includes a first netlist structure for a power distribution network (PDN) of the integrated device. The second metal layer includes a second set of regions. The second set of regions includes a second netlist structure of the PDN of the integrated device. In some implementations, the second metal layer further includes a third set of regions comprising the first netlist structure for the PDN of the integrated device. In some implementations, the first metal layer includes a third set of regions that includes a third netlist structure for the PDN of the integrated device. The third set of regions is non-overlapping with the first set of regions of the first metal layer. | 10-29-2015 |
20150364438 | BALANCED CURRENT DISTRIBUTION STRUCTURE FOR LARGE CURRENT DELIVERY - Methods and apparatuses for balancing current delivery. The method couples a low resistance portion of a ball grid array (BGA) to an input portion by at least two vias forming a three-dimensional section. The method couples at least one ball of the BGA to the low resistance portion over a narrow trace. | 12-17-2015 |