Patent application number | Description | Published |
20080283285 | Circuit Arrangement - A circuit arrangement comprising a set of signal layers, a set of first power layers, a set of second power layers, a set of signal vias, a set of first power vias, a set of second power vias, wherein a signal via of the set of signal vias provides a signal path for a high-frequency (HF) signal current, wherein at least a power via of the set of first power vias and at least a power via of the set of second power vias provide return paths for return currents associated with the signal current, wherein the return path provided by the power via of the set of second power vias is connected with a power layer of the set of second power layers, wherein at least one power layer of the set of first power layers is arranged between the power layer of the set of second power layers and each signal layer of the set of signal layers. | 11-20-2008 |
20100036632 | SYSTEM AND METHOD FOR EVALUATING HIGH FREQUENCY TIME DOMAIN IN EMBEDDED DEVICE PROBING - A system and associated method for evaluating a high-frequency signal at a point of interest on a signal path from a remote signal at a remote pickup point on the signal path. The point of interest is located on a device under test that is coupled to test equipment via the signal path. The high-frequency signal at the point of interest is calculated from the remote signal at the remote pickup point with an inverse transfer function that eliminates degradation effects on the high-frequency signal that is transferred through the signal path. The inverse transfer function may be calculated from measurements acquired in a test signal transfer through a reference path that simulates electrical properties of the signal path, or configured to a predetermined function if electrical properties of the signal path are known. | 02-11-2010 |
20100109679 | METHOD FOR DETERMINING THE CURRENT RETURN PATH INTEGRITY IN AN ELECTRIC DEVICE CONNECTED OR CONNECTABLE TO A FURTHER DEVICE - A method for determining current return path integrity in an electric device with a plurality of signal lines and supply lines. A library with at least one reference signal pattern of a near end crosstalk signal on a defined signal line arising from an input signal on another defined signal line is provided, a predetermined signal to a selected signal line of the electric device is applied, the near end crosstalk signal on at least one further signal line of the electric device is detected, said near end crosstalk signal is compared with the corresponding reference signal pattern from the library, and if there is a deviation between the near end crosstalk signal and the corresponding reference signal pattern, an information that there is any defect in the electric device is displayed. | 05-06-2010 |
20110238349 | EVALUATING HIGH FREQUENCY TIME DOMAIN IN EMBEDDED DEVICE PROBING - A system and associated method for evaluating a high-frequency signal at a point of interest on a signal path from a remote signal at a remote pickup point on the signal path. The point of interest is located on a device under test that is coupled to test equipment via the signal path. The high-frequency signal at the point of interest is calculated from the remote signal at the remote pickup point with an inverse transfer function that eliminates degradation effects on the high-frequency signal that is transferred through the signal path. The inverse transfer function may be calculated from measurements acquired in a test signal transfer through a reference path that simulates electrical properties of the signal path, or configured to a predetermined function if electrical properties of the signal path are known. | 09-29-2011 |
20120013353 | Method And System For Impedance Measurement In An Integrated Circuit - A method for determining a power supply impedance profile (|Z(f)|) at a predetermined load location within an electronic system. A repetitive activity (such as a modulated clock tree signal) is applied in the load location, and the local power supply voltage (U(t)) caused by this repetitive activity is measured. Rather than measuring the corresponding current consumption (I(t)) caused by the repetitive activity, the current consumption is calculated analytically. The local power supply impedance profile (|Z(f)|) is calculated as the ratio of the frequency-domain voltage and current consumption magnitudes (|U(f)|, |I(f)|) of the measured power supply voltage (U(t)) and the calculated current consumption (I(t)). | 01-19-2012 |
20120013356 | Method And System For Performing Self-Tests In An Electronic System - A method and system for performing a self-test of power supply quality for an integrated circuit chip within an electronic system. The electronic system is subjected to a well-defined repetitive activity, such as by using an amplitude modulated system clock tree. With the repetitive activity causing current consumption within the chip, time-domain local power supply voltage (U(t)) is measured for a location on the chip. A set of time-domain measured voltage data (U(t)) is accumulated and transformed into the frequency domain to yield a local voltage profile (U(f)). The local voltage profile (U(f)) is compared with a reference voltage profile (U | 01-19-2012 |
20120130657 | MEASURING POWER CONSUMPTION IN AN INTEGRATED CIRCUIT - A method for determining power consumption of a power domain within an integrated circuit is presented. In a first step, a local power supply impedance profile (Z(f)) of this power domain is determined. Subsequently, a local time-resolved power supply voltage (U(t)) is measured while a well-defined periodic activity is executed in power domain. A set of time-domain measured voltage data (U(t)) is thus accumulated and transformed into the frequency domain to yield a voltage spectrum (U(f)). A current spectrum I(t) is calculated from this voltage profile (U(f)) by using the power supply impedance profile Z(f) of this power domain as I(t)=F | 05-24-2012 |
20120146674 | DETERMINING LOCAL VOLTAGE IN AN ELECTRONIC SYSTEM - A system for measuring a test voltage level (V | 06-14-2012 |
20120293185 | DETERMINING THE CURRENT RETURN PATH INTEGRITY IN AN ELECTRIC DEVICE CONNECTED OR CONNECTABLE TO A FURTHER DEVICE - A method for determining current return path integrity in an electric device with a plurality of signal lines and supply lines. A library with at least one reference signal pattern of a near end crosstalk signal on a defined signal line arising from an input signal on another defined signal line is provided, a predetermined signal to a selected signal line of the electric device is applied, the near end crosstalk signal on at least one further signal line of the electric device is detected, said near end crosstalk signal is compared with the corresponding reference signal pattern from the library, and if there is a deviation between the near end crosstalk signal and the corresponding reference signal pattern, an information that there is any defect in the electric device is displayed. | 11-22-2012 |
20120296590 | EVALUATING HIGH FREQUENCY TIME DOMAIN IN EMBEDDED DEVICE PROBING - A method and associated system for evaluating a high-frequency signal (S | 11-22-2012 |
20130343200 | NETWORK POWER FAULT DETECTION - Network power fault detection. At least one first network device is instructed to temporarily disconnect from a power supply path of a network, and at least one characteristic of the power supply path of the network is measured at a second network device connected to the network while the at least one first network device is temporarily disconnected from the network. | 12-26-2013 |