Patent application number | Description | Published |
20080295044 | METHOD AND APPARATUS FOR MAPPING DESIGN MEMORIES TO INTEGRATED CIRCUIT LAYOUT - A method and apparatus are provided for receiving a list of design memories, wherein each type of design memory in the list has a name and at least one instance. A pre-placement model is associated with each named memory type in the list. The design memories in the list are mapped to an integrated circuit layout pattern, wherein at least one memory type comprises first and second instances that are mapped differently from one another. After mapping, at least one of the first and second instances is renamed to have a different name than the other. A post-placement model is then associated with each named memory type in the list, including a separate model for each renamed design memory. | 11-27-2008 |
20090094571 | Method and system for outputting a sequence of commands and data described by a flowchart - The present invention is a method and system for outputting a sequence of commands and data described by a flowchart. The method includes steps as follows. A flowchart describing a sequence of commands and data is received. The flowchart includes a plurality of flowchart symbols. Each of the plurality of flowchart symbols is assigned a ROM (read only memory) record. Assigned ROM records are stored in a ROM. A processor is generated to include the ROM, wherein the processor receives as input a CLOCK signal, a RESET signal, an ENABLE signal and N binary inputs x | 04-09-2009 |
20090133003 | COMMAND LANGUAGE FOR MEMORY TESTING - A memory testing system for testing a plurality of memory locations in an electronic memory device is provided. The system includes a programmable memory device integrated into the electronic memory device capable of receiving and storing a compiled memory testing program. A processor is in communication with the programmable memory device to read and execute instructions from the compiled testing program stored in the programmable memory device and a command interpreter is configured to receive data from the processor related to commands to be executed during memory testing. | 05-21-2009 |
20090281969 | Decision Tree Representation of a Function - An arbitrary function may be represented as an optimized decision tree. The decision tree may be calculated, pruned, and factored to create a highly optimized set of equations, much of which may be represented by simple circuits and little, if any, complex processing. A circuit design system may automate the decision tree generation, optimization, and circuit generation for an arbitrary function. The circuits may be used for processing digital signals, such as soft decoding and other processes, among other uses. | 11-12-2009 |
20090309770 | METHODS AND APPARATUS FOR PROGRAMMABLE DECODING OF A PLURALITY OF CODE TYPES - Methods and apparatus are provided for programmable decoding of a plurality of code types. A method is provided for decoding data encoded using one of a plurality of code types, where each of the code types correspond to a communication standard. The code type associated with the data is identified and the data is allocated to a plurality of programmable parallel decoders. The programmable parallel decoders can be reconfigured to decode data encoded using each of the plurality of code types. A method is also provided for interleaving data among M parallel decoders using a communications network. An interleaver table is employed, wherein each entry in the interleaver table identifies one of the M parallel decoders as a target decoder and a target address of a communications network for interleaved data. Data is interleaved by writing the data to the target address of the communications network. The communications network can comprise, for example, a cross-bar switch and/or one or more first-in-first-out buffers. | 12-17-2009 |
20090316507 | Generation Of Test Sequences During Memory Built-In Self Testing Of Multiple Memories - The present invention concerns an apparatus including a modular memory and an address locator circuit. The modular memory may be configured to generate a current address signal, a first data output signal and a second data output signal in response to a first port address signal, a second port address signal, an initial state parameter, a target state parameter, a first port enable signal, a second port enable signal, a write enable signal, a data input signal, a first location signal and a second location signal. The address locator circuit may be configured to generate the first location signal and the second location signal in response to the first port address signal, the second port address signal and the current address signal. | 12-24-2009 |
20100023904 | Method and Apparatus for Generating Memory Models and Timing Database - A method and apparatus are provided for creating and using a memory timing database. A plurality of characterization memories are defined, which can be mapped to a memory resource. Each characterization memory has different memory parameters. A plurality of variants of tiling each characterization memory to the memory resource are also defined. Timing characteristics of each tiling variant of each characterization memory are stored in the memory timing database for the memory resource based on sets of input ramptimes and output loads. | 01-28-2010 |
20120161093 | Via-Configurable High-Performance Logic Block Architecture - A via-configurable circuit block may contain chains of p-type and n-type transistors that may or may not be interconnected by means of configurable vias. Configurable vias may also be used to connect various transistor terminals to a ground line, a power line and/or to various terminals that may provide connections outside of the circuit block. | 06-28-2012 |
20120278775 | Method and Apparatus for Generating Memory Models and Timing Database - A method and apparatus are provided for using a memory timing database. A plurality of characterization memories are defined, which can be mapped to a memory resource. Each characterization memory has different memory parameters. A plurality of variants of tiling each characterization memory to the memory resource are also defined. Timing characteristics of each tiling variant of each characterization memory are stored in the memory timing database for the memory resource based on sets of input ramptimes and output loads. | 11-01-2012 |