Patent application number | Description | Published |
20090302880 | Wide Area Soft Defect Localization - Various apparatus and methods of testing a semiconductor chip for soft defects are disclosed. In one aspect, a method of testing a semiconductor chip that has a surface and plural circuit structures positioned beneath the surface is provided. An external stimulus is applied to a series of fractional portions of the surface to perturb portions of the plural circuit structures such that at least one of the series of fractional portions is smaller than another of the series of fractional portions. The semiconductor chip is caused to perform a test pattern during the application of external stimulus to each of the fractional portions to determine if a soft defect exists in any of the series of fractional portions. | 12-10-2009 |
20100012828 | Infrared Sensor and Method of Calibrating the Same - An infrared sensor system and a method of calibrating the system are disclosed. In one aspect, a method includes determining a transmission of a transmissive window and a transmission of a transmissive fluid. In addition, an infrared emission of the transmissive window is determined along with an infrared emission of the transmissive fluid for at least one temperature. In a system that has an infrared sensor and an optical pathway to the infrared sensor, the transmissive window and the transmissive fluid are placed in the optical pathway. A semiconductor chip is placed in the optical pathway proximate the transmissive fluid. Radiation from the optical pathway is measured with the infrared sensor. An emissivity of the semiconductor chip is determined using the measured radiation and the determined transmissions and emissions of the transmissive window and the transmissive fluid. | 01-21-2010 |
20100019786 | Method and Apparatus for Nano Probing a Semiconductor Chip - Various methods and apparatus for electrically probe testing a semiconductor chip with circuit perturbation are disclosed. In one aspect, a method of testing is provided that includes contacting a first nano probe to a conductor structure on a first side of a semiconductor chip. The semiconductor chip has plural circuit structures. A external stimulus is applied to a selected portion of the first side of the semiconductor chip to perturb at least one of the plural circuit structures. The semiconductor chip is caused to perform a test pattern during the application of the external stimulus. An electrical characteristic of the semiconductor chip is sensed with the first nano probe during performance of the test pattern. | 01-28-2010 |
20100091584 | MEMORY DEVICE AND METHODS THEREOF - A memory device is disclosed that includes multiple bit cells, whereby each bit cell is capable of being programmed to more than two states. A value stored at the memory device is determined by comparing the information stored at three or more of the bit cells. In an embodiment, the bit cell includes a silicon-on-insulator (SOI) metal oxide semiconductor field effect transistor (FET) device, and the information stored at the bit cell can be represented by a corresponding level of charge stored in the body of the device. | 04-15-2010 |
20110037107 | Silicon Photon Detector - A silicon photon detector device and methodology are provided for detecting incident photons in a partially depleted floating body SOI field-effect transistor ( | 02-17-2011 |
Patent application number | Description | Published |
20090119343 | Dynamic reduction of dimensions of a document vector in a document search and retrieval system - The method and system of the invention involves processing each new document ( | 05-07-2009 |
20110218823 | Method and System for Determining Precursors of Health Abnormalities from Processing Medical Records - Medical reports are converted to document vectors in computing apparatus and sampled by applying a maximum variation sampling function including a fitness function to the document vectors to reduce a number of medical records being processed and to increase the diversity of the medical records being processed. Linguistic phrases are extracted from the medical records and converted to s-grams. A Haar wavelet function is applied to the s-grams over the preselected time interval; and the coefficient results of the Haar wavelet function are examined for patterns representing the likelihood of health abnormalities. This confirms certain s-grams as precursors of the health abnormality and a parameter can be calculated in relation to the occurrence of such a health abnormality. | 09-08-2011 |
20120303670 | CLOUD COMPUTING METHOD FOR DYNAMICALLY SCALING A PROCESS ACROSS PHYSICAL MACHINE BOUNDARIES - A cloud computing platform includes first device having a graph or tree structure with a node which receives data. The data is processed by the node or communicated to a child node for processing. A first node in the graph or tree structure determines the reconfiguration of a portion of the graph or tree structure on a second device. The reconfiguration may include moving a second node and some or all of its descendant nodes. The second and descendant nodes may be copied to the second device. | 11-29-2012 |
20130339373 | METHOD AND SYSTEM OF FILTERING AND RECOMMENDING DOCUMENTS - Disclosed is a method and system for discovering documents using a computer and providing a small set of the most relevant documents to the attention of a human observer. Using the method, the computer obtains a seed document from the user and generates a seed document vector using term frequency-inverse corpus frequency weighting. A keyword index for a plurality of source documents can be compared with the weighted terms of the seed document vector. The comparison is then filtered to reduce the number of documents, which define an initial subset of the source documents. Initial subset vectors are generated and compared to the seed document vector to obtain a similarity value for each comparison. Based on the similarity value, the method then recommends one or more of the source documents. | 12-19-2013 |
20150067857 | IN-SITU TRAINABLE INTRUSION DETECTION SYSTEM - A computer implemented method detects intrusions using a computer by analysing network traffic. The method includes a semi-supervised learning module connected to a network node. The learning module uses labeled and unlabeled data to train a semi-supervised machine learning sensor. The method records events that include a feature set made up of unauthorized intrusions and benign computer requests. The method identifies at least some of the benign computer requests that occur during the recording of the events while treating the remainder of the data as unlabeled. The method trains the semi-supervised learning module at the network node in-situ, such that the semi-supervised learning modules may identify malicious traffic without relying on specific rules, signatures, or anomaly detection. | 03-05-2015 |