| Patent application number | Description | Published |
|---|
| 20080277760 | INTEGRATED CIRCUIT DEVICE HAVING OPENINGS IN A LAYERED STRUCTURE - An integrated circuit device includes a substrate with a first layer situated on the substrate. The first layer defines a first opening with a cover layer deposited on the first layer and coating a sidewall portion of the first opening. A second layer is situated on the cover layer. The second layer defines a second opening extending through the second layer and through the cover layer to connect the first and second openings. | 11-13-2008 |
| 20090008694 | Integrated circuit and corresponding manufacturing method - The present invention provides an integrated circuit including a field effect transistor formed in an active area segment of a semiconductor substrate, the transistor comprising:
| 01-08-2009 |
| 20090085084 | Integrated Circuit and Methods of Manufacturing the Same - A method of manufacturing an integrated circuit includes forming landing pads in an array region of a substrate, individual ones of the landing pads being electrically coupled to individual ones of portions of devices formed in the substrate in the array region. The method also includes forming wiring lines within a peripheral region of the substrate. Forming the landing pads and forming the wiring lines includes a common lithographic process being effective in both the array and peripheral regions. The wiring lines and the landing pads of the integrated circuit are self-aligned. | 04-02-2009 |
| 20090121315 | METHOD FOR PRODUCING AN INTEGRATED CIRCUIT AND ARRANGEMENT COMPRISING A SUBSTRATE - Embodiments of the invention relate to an integrated circuit comprising a carrier, having a capacitor with a first electrode and a second electrode. The first electrode has a dielectric layer A layer sequence is arranged on the carrier, the capacitor being introduced in said layer sequence, wherein the layer sequence has a first supporting layer and a second supporting layer arranged at a distance above the first supporting layer, wherein the first and the second supporting layer adjoin the first electrode of the capacitor. Methods of manufacturing the integrated circuit are also provided. | 05-14-2009 |
| 20090140307 | CONDUCTIVE LINE COMPRISING A CAPPING LAYER - An integrated circuit includes a conductive line, the conductive line having a conductive layer made of a metal or a first compound including a metal and a capping layer made of a second compound comprising the metal, the capping layer being in contact with the conductive layer, the first compound being different from the second compound. | 06-04-2009 |
| 20090294907 | SEMICONDUCTOR COMPONENT WITH MIM CAPACITOR - A structure and method of forming a capacitor is described. In one embodiment, the capacitor includes a cylindrical first electrode having an inner portion bounded by a bottom surface and an inner sidewall surface, the first electrode further having an outer sidewall, the first electrode being formed from a conductive material. An insulating fill material is disposed within the inner portion of the first electrode. A capacitor dielectric is disposed adjacent at least a portion of the outer sidewall of the first electrode. A second electrode is disposed adjacent the outer sidewall of the first electrode and separated therefrom by the capacitor dielectric. The second electrode is not formed within the inner portion of the first electrode. | 12-03-2009 |
| 20090303780 | INTEGRATED CIRCUIT INCLUDING AN ARRAY OF DIODES COUPLED TO A LAYER OF RESISTANCE CHANGING MATERIAL - An integrated circuit includes an array of diodes and an electrode coupled to each diode. The integrated circuit includes a layer of resistance changing material coupled to the electrodes and bit lines coupled to the layer of resistance changing material. The layer of resistance changing material provides a resistance changing element at each intersection of each electrode and each bit line. | 12-10-2009 |
| 20100027325 | INTEGRATED CIRCUIT INCLUDING AN ARRAY OF MEMORY CELLS AND METHOD - An integrated circuit including an array of memory cells and method. In one embodiment, each memory cell includes a resistively switching memory element and a selection diode for selecting one cell from the plurality of memory cells. The memory element is coupled with its top to a first selection line and with its bottom side to the selection diode, the diode further being coupled to the bottom side of a second selection line. | 02-04-2010 |
| 20100032635 | ARRAY OF LOW RESISTIVE VERTICAL DIODES AND METHOD OF PRODUCTION - An integrated circuit comprising an array of memory cells and a corresponding production method are described. Each memory cell comprises a resistively switching memory element and a vertical selection diode coupled to a selection line in a selection line trench for selecting one cell from the plurality of memory cells. A selection line is coupled to the vertical selection diode at one vertical sidewall of the selection line trench. | 02-11-2010 |
| 20100090263 | MEMORY DEVICES INCLUDING SEMICONDUCTOR PILLARS - One embodiment relates to an integrated circuit that includes a memory array of pillars arranged in rows and columns. The pillars are separated from one another by row trenches and column trenches. The column trenches include a pair of parallel column trenches. A first trench of the pair includes two parallel bit lines coupled to pillars adjacent to the first trench. A second trench of the pair is free of bit lines. Other methods, devices, and systems are also disclosed. | 04-15-2010 |
| 20100090264 | INTERCONNECT STRUCTURE FOR SEMICONDUCTOR DEVICES - One embodiment relates to an integrated circuit formed on a semiconductor body having interconnect between source/drain regions of a first and second transistor. The interconnect includes a metal body arranged underneath the surface of the semiconductor body. A contact element establishes electrical contact between the metal body and the source/drain regions of the first and second transistor. The contact element extends along a connecting path between the source/drain regions of the first and second transistors. Other methods, devices, and systems are also disclosed. | 04-15-2010 |
