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Onomura, JP
Kenichi Onomura, Tokyo JP
| Patent application number | Description | Published |
|---|---|---|
| 20090172011 | IMAGE FILE CREATION DEVICE AND IMAGE FILE CREATION METHOD - The invention is an image file creation device for creating a first file with an extension “JPG” from an image data group composed of main image JPEG image data and a plurality of sub-image JPEG image data, the first file including the main image JPEG image data and related information from which existence of a second file related to the first file can be recognized; and creating a second file with an extension “MPF”, for example, the second file including the main image JPEG image data, the plurality of sub-image JPEG image data, and related information from which existence of the first file related to the second file can be recognized. When creating the first file and the second file, the files have the same name except for the extensions. | 07-02-2009 |
Kenichi Onomura, Hino-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20110109771 | IMAGE CAPTURING APPRATUS AND IMAGE CAPTURING METHOD - An image capturing apparatus is provided which can continuously keep track of an object even under changes of the angle of view during enlarged live-view display, as well as an image capturing method for such an image capturing apparatus. Acquisition range of image signals is controlled by the CPU to crop a portion of an object image formed on the image pickup device. Subsequently, the enlarged live-view display is performed in which the image based on the obtained image signals is enlarged and displayed on the display unit. If a zooming operation is performed during the enlarged live-view display, the CPU obtains information regarding the angle of view and updates the acquisition range of the image signals according to the information regarding the angle of view after the change. | 05-12-2011 |
| 20110109774 | IMAGING APPARATUS AND IMAGING METHOD - An imaging apparatus includes an imaging section, an imaging acquisition range control section, a distortion information obtaining section, and a display section. The imaging section includes a lens and obtains an image data by imaging a subject image. The imaging acquisition range control section controls an acquisition range of the image data such that a part of the subject image is read out. The distortion information obtaining section obtains distortion information of the lens. The distortion correction section corrects distortion of the image data in accordance with the distortion information. The display section performs enlarged live-view display operation to display an enlarged image of the corrected image data in the acquisition range. The imaging acquisition range control section updates the acquisition range, when the distortion information is changed while the enlarged live-view display operation is performed, in accordance with the changed distortion information. | 05-12-2011 |
Kouichi Onomura, Kanagawa JP
| Patent application number | Description | Published |
|---|---|---|
| 20100171774 | DISPLAY DEVICE - A display device is disclosed having a plurality of pixels arranged in a matrix, in which a current driven light-emitting element is provided for each pixel, and current supplied to each light-emitting element is controlled based on input image data for each pixel for achieving display, the display device, includes a correction circuit for performing calculations based on the input image data and correction data, and correcting non-uniform luminance caused by variations in display characteristics for each pixel to produce correction data; a panel current detection circuit for detecting a panel current, which is the total current to be supplied to each pixel; and a modification circuit for modifying the correction data in response to a voltage drop due to the panel current to reduce errors in the correction data. | 07-08-2010 |
Kouichi Onomura, Yokohama-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20090160742 | MEASUREMENT OF PIXEL CURRENT IN DISPLAY DEVICE - During image display, pixel current measurement for brightness irregularity correction is carried out. Display is carried out by sequentially writing pixel data in a horizontal direction to pixel sections that are arranged in a matrix shape. Horizontal power supply lines PVDD are arranged for each horizontal line, and power is supplied from these power supply lines to corresponding pixel sections. When carrying out measurement of pixel current by lighting pixel sections one at a time, a horizontal power supply line PVDD of a horizontal line to which the lit pixel belongs is connected to a power supply PVDDb by a switch, and other horizontal power supply lines PVDD are connected to PVDDa. | 06-25-2009 |
| 20090207106 | ORGANIC EL DISPLAY MODULE AND MANUFACTURING METHOD OF THE SAME - On a panel, a plurality of PVDD lines, each of which corresponds to a horizontal line of pixels and supplies power to the pixels of the horizontal line, are provided. A voltage drop correction unit that obtains a voltage drop before reaching the pixel, based on resistance in the plurality of power supply lines and currents flowing therein, and corrects display data so as to cancel the obtained voltage drop of the pixel. A display unevenness correction unit that corrects uneven brightness caused by a variation in a TFT characteristic of the pixel by performing a calculation using display data of the pixel and obtained correction data of the pixel. | 08-20-2009 |
| 20090237334 | CORRECTING BRIGHTNESS VARIATIONS IN ORGANIC ELECTROLUMINESCENT PANEL - An OLED display having a correction circuit for producing corrected image data in response to the first image data and in response to correction data to correct for brightness unevenness due to TFT variations; a memory for storing first image data or correction data; a switch effective in first and second states in response to a function switching signal having first and second conditions, respectively; and circuitry for causing the switch to be in the first state to connect the memory to the image input signal interface and to provide the stored first image data to the panel as the second image data; and for causing the switch to be in the second state to connect the memory to the correction circuit, provide the stored correction data to the correction circuit, and provide the corrected image data to the panel as the second image data. | 09-24-2009 |
| 20090256783 | CURRENT CONTROL IN DISPLAY DEVICE - An electroluminescent display device having a first and a second power supply; a respective power supply line for each row, wherein each power supply line is placed along a horizontal direction and is connected to the respective first electrodes of the driving TFTs of the pixels in the corresponding row; a plurality of switches, each connected to one or more power supply lines, for selectively connecting the corresponding one or more power supply lines to either the first or the second power supply; a gate driver for selecting a gate line; and a selecting circuit for controlling the plurality of switches, wherein the selecting circuit causes the power supply line corresponding to the selected gate line to be connected to the first power supply, and the one or more power supply lines not corresponding to the selected gate line to be connected to the second power supply. | 10-15-2009 |
| 20090256854 | BRIGHTNESS UNEVENNESS CORRECTION FOR OLED - Displaying an image with unevenness correction by measuring Vgs-Id characteristics of the transistors in a subset of pixels; approximating each characteristic using an equation of the form | 10-15-2009 |
Masaaki Onomura, Tokyo JP
| Patent application number | Description | Published |
|---|---|---|
| 20110067625 | CRYSTAL GROWTH METHOD AND APPARATUS - A crystal growth method for forming a semiconductor film, the method includes: while revolving one or more substrates about a rotation axis, passing raw material gas and carrier gas from the rotation axis side in a direction substantially parallel to a major surface of the substrate. The center of the substrate is located on a side nearer to the rotation axis than a position at which growth rate of the semiconductor film formed by thermal decomposition of the raw material gas is maximized. | 03-24-2011 |