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Noffke
Gary Noffke, York, PA US
| Patent application number | Description | Published |
|---|---|---|
| 20100007513 | Communication Protocol For Remotely Controlled Laser Devices - A laser device operating system includes a laser device generating a laser beam when receiving a remote control unit command signal. The remote control unit operates in a public or private mode. In public mode the remote control unit generates a command signal transmitted to the laser device. In private mode the remote control unit generates a unique identifier prepended to the command signal. The laser device operates in a laser device public or private mode. In public mode the laser device responds to the remote control unit command signal or the command signal if transmitted by a second remote control unit. In private mode the laser device operates only upon receipt of the command signal and unique identifier, preventing laser device operation by the second remote control unit if the second unit does not include the unique identifier with the command signal. | 01-14-2010 |
Patrick James Noffke, Devon Park AU
| Patent application number | Description | Published |
|---|---|---|
| 20080289528 | INSPECTION SYSTEM FOR INSPECTING AN IMPRINTED SUBSTRATE ON A PRINTING PRESS - An inspection system for inspecting an imprinted substrate on a printing press has a light source, a contact image sensor, and a processor. The light source is configured to illuminate a portion of the substrate which has been imprinted with different colors at a plurality of printing units of the printing press. The contact image sensor has a plurality of sensing elements. Each sensing element senses light reflected by a corresponding region on the substrate to produce data representative of the corresponding region printed on the substrate. The processor is configured to receive the data representative of the imprinted substrate and to compare the data representative of the corresponding region printed on the substrate with stored reference data. | 11-27-2008 |
| 20100264338 | INSPECTING AN IMPRINTED SUBSTRATE ON A PRINTING PRESS - A method of inspecting an imprinted substrate on a printing press comprises illuminating a portion of the substrate which has been imprinted with different colors at a plurality of printing units of the printing press. The method further comprises sensing light reflected by the substrate using a contact image sensor to produce data representative of the imprinted substrate, and comparing the data representative of the printed substrate with stored reference data. | 10-21-2010 |
Patrick James Noffke, Hartland, WI US
| Patent application number | Description | Published |
|---|---|---|
| 20080297861 | IMAGE PROCESSING OF A PORTION OF MULTIPLE PATCHES OF A COLORBAR - An image processing apparatus for use with a printed substrate is disclosed. The image processing apparatus comprises an imaging device configured to receive light reflected from a portion of multiple patches of a colorbar on the printed substrate and configured to process color data from the light reflected from the portion of multiple patches of the colorbar. | 12-04-2008 |
| 20100128318 | MEASURING COLOR ON A MOVING SUBSTRATE - An image processing apparatus for use with a printed image on a moving substrate is provided. The image processing apparatus includes a first imaging device configured to process spatial data which indicates a position of color patches printed along an edge portion of the printed image on the moving substrate. The image processing apparatus further includes a second imaging device configured to process at least one of densitometric data and colorimetric data of the color patches of the printed image. The first imaging device and second imaging device acquire image data from substantially the same position on the substrate at substantially the same time. The image processing apparatus further includes a processor configured to monitor a color of the printed image on the moving substrate based on the spatial data and the at least one of densitometric data and colorimetric data. | 05-27-2010 |