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Nobutaka Itoh, Kawasaki JP

Nobutaka Itoh, Kawasaki JP

Patent application numberDescriptionPublished
20090240648EVALUATION METHOD OF NUMERIC ANALYSIS - An evaluation method including associating the function blocks of the same kind in the first data and the second data is provided. The evaluation method includes specifying a specified function block from the function blocks, creating third data based on the first data and the specified function block of the second data, executing numeric analysis on the third data, comparing a numeric analysis data of the first data with a numeric analysis data of the third data and storing or displaying a comparison result.09-24-2009
20090324095ANALYSIS-MODEL-PRODUCING APPARATUS AND ANALYSIS-MODEL-PRODUCING METHOD - An analysis-model-producing apparatus for producing an analysis model from a shape model, comprising means for specifying a deletion method for deleting, from geometric shape data constituting the shape model, geometric shape data that is unnecessary to production of an analysis model, and means for deleting unnecessary data, using the specified deletion method.12-31-2009
20090325401CONNECTOR, ELECTRONIC DEVICE, AND METHOD OF MANUFACTURING ELECTRONIC DEVICE - A connector includes a contact pin in which a free end projecting from a supporting member comes into contact with an electrode of a first object and a second object, and a bending part is provided onto a base end such that the connector has an inclination against the first object and the second object. The rigidity of the bending parts is selectively set to be high by selectively increasing a thickness of the bending part.12-31-2009
20090326883ANALYZER, ANALYSIS METHOD, AND ANALYSIS PROGRAM PRODUCT - A first generation portion divides an object to be analyzed into a plurality of finite elements to generate element division data. A first calculation portion defines and calculates a plurality of meshes dividing the object to be analyzed into units larger than the finite elements. A second generation portion assumes that a friction layer which has a thickness of “0” and a friction coefficient between a conductive material and a composite material of a predetermined value less than 1 exists at the interface between the conductive material and the composite material, and the second generation portion generates mesh data. A second calculation portion uses various solvers to calculate the physical amounts produced in the object to be analyzed on the basis of the mesh data and outputs the analysis result. In other words, the second calculation portion performs a simulation of the behavior of the object to be analyzed. The simulation is performed within an arbitrary temperature range set by a user.12-31-2009
20100023299ANALYSIS APPARATUS - An analysis apparatus includes an assignor assigning a physical property value corresponding to the kind of a material to each of regions formed by dividing a structural data representing a structure of a multilayer substrate, a determiner determining whether or not the each of the region belongs to a predetermined region in a layer of a predetermined kind, and a physical property value changer changing the physical property value of the region belonging to a predetermined region in a layer of a predetermined kind.01-28-2010
20100289500SUBSTRATE STRUCTURE - A substrate includes a first plate member; a plurality of first electrodes provided on the major surface of the first plate member, the first electrodes including at least one electrode for circuit connection and at least one monitor electrode separate from the electrode for circuit connection; a second plate member; a plurality of second electrodes provided on the major surface of the second plate member; a plurality of solder members provided between the first electrodes and the second electrodes for electrical connection therebetween, repeatedly; and a detector for detecting an electrical disconnection between at least one of the monitor electrode and the second electrode.11-18-2010
20110085305ELECTRONIC DEVICE, WASHER AND METHOD FOR MANUFACTURING WASHER - An electronic device includes, a circuit board including a through hole, a member including a screw hole, a screw including a screw body having an outer diameter smaller than an inner diameter of the through hole and a screw head having an outer diameter larger than the inner diameter of the through hole, wherein the screw body penetrates through the through hole to engage with the screw hole and the screw head is disposed on an opposite side of the circuit board to the member, and a first washer provided between the screw head and the circuit board, the first washer including a first washer body and a plurality of first washer legs extending from the first washer body toward the circuit board, the first washer legs being in contact with the circuit board and having a characteristic of reducing stress on the circuit board upon being heated.04-14-2011
20110208485BONDING MODEL GENERATION APPARATUS AND BONDING MODEL GENERATION METHOD - A bonding surface extraction unit extracts, with reference to bonding information, data of a first bonding surface corresponding to a bottom surface of a bonding model from data of a first partial model and data of a second bonding surface corresponding to a top surface of the bonding model from data of a second partial model. The first partial model is a model of a pad included in a circuit board. The second partial model is a model of an electrode included in a component. The electrode is to be bonded to the pad with a bonding material. A bonding model generation unit generates a side surface establishing a link between outlines of the first bonding surface and the second bonding surface, and obtains data of the bonding model on the basis of a shape formed with the side surface, the first bonding surface, and the second bonding surface.08-25-2011

Patent applications by Nobutaka Itoh, Kawasaki JP