Patent application number | Description | Published |
20090002696 | STANDARD FOR WAVELENGTH AND INTENSITY FOR SPECTROMETERS - The description relates to a standard for wavelength and intensity for spectrometers, particularly for calibrating and testing measurement heads in spectrometers which are usable primarily in the near infrared region (NIR) of the spectrum. The standard comprises a holder and a plate body arranged in the holder. The plate body is made of transparent plastic with high strength and dimensional stability over a large temperature range. The plastic has distinct absorption bands throughout the entire NIR range and has a chemical structure and composition ensuring an extensive moisture barrier against water absorption and water release in a reliable and stable manner over time. The plate body advantageously comprises an amorphous, transparent copolymer based on cyclic and/or linear olefins. | 01-01-2009 |
20090103089 | SPECTROMETER WITH A SLIT FOR INCIDENT LIGHT AND FABRICATION OF THE SLIT - A spectrometer including an entrance slit and the production of the entrance slit. The spectrometer includes a housing, an entrance slit, and an imaging diffraction grating inside the housing for splitting and imaging the light onto an optoelectric detector. The detector is arranged inside the housing. The housing and the base plate are connected to each other by mutually cooperating positioning members. The entrance slit, the positioning members of the base plate and the holding members for receiving and mounting the detecting device are integral parts of the base plate and are produced from the base plate in a precise manner, in a suitable form and in defined mutual positions by, for example, laser cutting or liquid jet cutting. The positioning members of the base plate and/or the holding members for the detecting device can be provided as resilient elements. | 04-23-2009 |
20090168060 | Spectrometric Measurement System and Method for Compensating for Veiling Glare - The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point. | 07-02-2009 |
20100063681 | METHOD AND ARRANGEMENT FOR THE STEERING OF A VEHICLE - The invention relates to a method by which image data from the terrain lying in front of a vehicle ( | 03-11-2010 |
20100108188 | Arrangement for Filling a Container with Bulk Material - The invention relates to an arrangement for filling a container ( | 05-06-2010 |
20100321686 | DEVICE FOR OPTICAL SPECTROSCOPY AND MECHANICAL SWITCH FOR SUCH A DEVICE - The disclosure provides a device for optical spectrometry, wherein the reference beam and the measuring beam between the deflector and the detector input, in particular between the deflector output and the detector or between a device connecting the optical paths and the detector exhibit the same (the identical) etendue and the same (the identical) optical axis. | 12-23-2010 |
20110007311 | METHOD AND ARRANGEMENT FOR THE TIME-RESOLVED SPECTROSCOPY USING A PHOTON MIXING DETECTOR - The present invention relates to a solution for time-resolved spectroscopy, wherein the sample to be analyzed is illuminated by a modulated light source, and the spectrum reflected therefrom is recorded in a time-resolved manner and evaluated. In the method according to the invention for time-resolved spectroscopy, a sample to be analyzed is irradiated by a modulated light source having short light pulses, and the radiation emitted by the sample is represented via imaging optical elements and a spectral-selective element on a sensor disposed in the image plane, and the signals thereof are evaluated by a control and regulating unit, and/or stored. The sensor disposed in the image plane is a PMD sensor, which in addition to the intensity values also determines the running times of the radiation emitted by the sample, and forwards the same to the control and regulating unit. Although PMD sensors were originally intended for object recognition, particularly in traffic, the use thereof in many other technical fields is conceivable and advantageous. The solution provided herein describes the use of PMD sensors in spectroscopy, particularly for the time-resolved analysis of samples. However, the use of PMD sensors is also possible in Raman spectrometry, or for the measurement of luminescence, such as for differentiating phosphorescence and fluorescence light. | 01-13-2011 |
20110007319 | Arrangement for Determining the Reflectivity of a Sample - The invention relates to an arrangement for measuring the reflectivity of the direct or scattered reflection of a sample ( | 01-13-2011 |
20110255075 | Spectrometric assembly and method for determining a temperature value for a detector of a spectrometer - The invention relates to a spectrometric assembly and method for determining a temperature value for a detector of a spectrometer. It is conventional to record the detector temperature in an optoelectronic detector using a thermal temperature sensor in order to compensate for temperature fluctuations. Due to the finite distance between the detector and the temperature sensor, the accuracy of the temperature detection is limited. According to the invention, the detector temperature should be recordable at high accuracy and with little effort. In addition to means for spectral division of incident tight and an optical detector for spectrally resolved detection of a spectral range of the divided light, a second optical detector is provided for detection of a partial range of this spectral range as a reference detector, wherein sensitivity of the reference detector is substantially temperature-independent. The ratio of the signals of both detectors is a highly accurate measurement for the relative temperature of the first detector due to the temperature independence of the sensitivity of the reference detector, and can be determined with little effort. | 10-20-2011 |
20120081509 | OPTICAL INSTRUMENT SYSTEM AND METHOD - An optical instrument system produces and analyzes images of the surrounding area. The system includes an overview lens with a symmetry axis which produces a first circular image of the surrounding area. The system also includes an observation lens which captures a second image of the surrounding area, and which is pivotal over 360° about the symmetry axis, and which is spaced apart a predetermined distance from the overview lens. The observation lens has an optical axis which is perpendicularly to the symmetry axis. The system includes an imaging optics system which reproduces the images of the surrounding area as overview image and observation image on a surface detector. A control unit controls the observation lens. An evaluation unit analyzes the images, and, for selected objects, which are detected both in the overview image and also in the observation image, determines the distance to said objects. | 04-05-2012 |
20120105847 | SPECTROMETRIC MEASUREMENT SYSTEM AND METHOD FOR COMPENSATING FOR VEILING GLARE - The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point. | 05-03-2012 |
20130271764 | MEASUREMENT DEVICES AND APPARATUSES FOR SPECTROSCOPIC EXAMINATION OF SAMPLES - A measurement device for spectroscopic examination of samples comprises a cavity extending in a longitudinal direction, a first opening to face a sample, a plurality of second openings for capturing light originating from the sample and at least one third opening for coupling light into the cavity. Such a measurement device is particularly suitable for spectroscopic examinations of planar samples. | 10-17-2013 |
20130293886 | Flange for Closing Off an Optical Device Against a Sample Stream, and an Optical Device for Partial Immersion in a Sample Stream - In an arrangement to optically illuminate and/or to perform measurements in a sample stream through a flange which is arranged in the sample stream and closes off a hollow space against the sample stream, there is a continuous loss of material due to abrasion of wall particles, and the flange therefore has to be exchanged on a regular basis. The invention has the purpose of reducing the wear on the flange. To meet this objective, a part of the wall extending along a closed loop around the hollow space ( | 11-07-2013 |
20140339438 | DEVICES AND METHODS FOR SPECTROSCOPIC ANALYSIS - The present invention relates to devices and methods for spectrometric analysis of light-emitting samples. The device comprises a particle beam source, which generates a primary particle beam directed to the sample in such a way that the primary particle beam is incident on the sample and photons are released from the sample due to the interaction between primary particle beam and sample material. Moreover, the device comprises a plurality of light-pickup elements, which are suitable for capturing the photons released from the sample, wherein the light-pickup elements capture the photons emitted in the respectively assigned solid-angle range. Furthermore, the device comprises conduction elements, which are embodied to forward captured photons to an evaluation unit, and an analysis system, which comprises a plurality of evaluation units in such a way that photons captured by each light-pickup element are analyzed spectrally. | 11-20-2014 |