Nevshupa
Roman Nevshupa, Guipuzcoa ES
Patent application number | Description | Published |
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20120279321 | FORCE MEASURING DEVICE - The invention consists of a measurement device for measuring the force applied by a contact member on the surface of a sample, comprising a vacuum or controlled atmosphere chamber in which there are housed the sample and the contact member, mechanical means for transmitting the force exerted by the contact member in the form of the displacement of one or several flexible members and one or several sensors suitable for measuring said displacement. The device comprises motor-driven linear micropositioners incorporated inside the vacuum or controlled atmosphere chamber for positioning sensor(s). As a result of the system, it is not necessary to break the vacuum to calibrate the sensors, saving time and facilitating the measurement. | 11-08-2012 |
Roman Nevshupa, Eibar (guipúzcoa) ES
Patent application number | Description | Published |
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20130129583 | SAMPLE-SUPPORT ELEMENT FOR ULTRA-HIGH VACUUMS - The invention discloses a sample-support element for ultra-high vacuums comprising a main chamber and a supplementary chamber for the sample holder and the heating/cooling elements, which is pumped by a related pump line. This enables the reduction or total elimination of the negative effect related to the alteration of the residual atmosphere in ultra-high vacuums resulting from heating or cooling the surfaces of the sample holder. | 05-23-2013 |
Roman Nevshupa, Eibar (guipúzcoa) ES
Patent application number | Description | Published |
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20130129583 | SAMPLE-SUPPORT ELEMENT FOR ULTRA-HIGH VACUUMS - The invention discloses a sample-support element for ultra-high vacuums comprising a main chamber and a supplementary chamber for the sample holder and the heating/cooling elements, which is pumped by a related pump line. This enables the reduction or total elimination of the negative effect related to the alteration of the residual atmosphere in ultra-high vacuums resulting from heating or cooling the surfaces of the sample holder. | 05-23-2013 |