Nevius
Bill Nevius, Lafayette, CO US
Patent application number | Description | Published |
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20110217694 | FLOW CYTOMETRY-BASED SYSTEMS AND METHODS FOR DETECTING MICROBES - In various embodiments, the present disclosure describes methods and systems for detecting microbes in a sample. The methods are generally applicable to quantifying the number of target bacteria in a sample counted from a detection region of a flow cytometer histogram. The detection methods can be employed in the presence of other microorganisms and other non-target microbe components to selectively quantify the amount of a target microbe. The methods are advantageous over those presently existing for testing of foodstuffs and diagnostic evaluation in their speed, accuracy and ease of use. Various swab collection devices and kits useful for practicing the present disclosure are also described herein. | 09-08-2011 |
Phillip E. Nevius, Arlington, MA US
Patent application number | Description | Published |
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20150100848 | DETECTING AND CORRECTING HARD ERRORS IN A MEMORY ARRAY - Hard errors in the memory array can be detected and corrected in real-time using reusable entries in an error status buffer. Data may be rewritten to a portion of a memory array and a register in response to a first error in data read from the portion of the memory array. The rewritten data may then be written from the register to an entry of an error status buffer in response to the rewritten data read from the register differing from the rewritten data read from the portion of the memory array. | 04-09-2015 |
Timothy Alfred Nevius, Saline, MI US
Patent application number | Description | Published |
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20110252864 | Emissions Test System And Method - An emission test system may include at least one controller configured to determine, directly or indirectly, a quantity of diluted exhaust sample in a container at the completion of an emissions test, and to cause additional diluent gas to be added to the container based on the determined quantity. | 10-20-2011 |
20120304737 | Emissions Test System And Method - An emission test system may include at least one controller configured to determine, directly or indirectly, a quantity of diluted exhaust sample in a container at the completion of an emissions test, and to cause additional diluent gas to be added to the container based on the determined quantity. | 12-06-2012 |