Patent application number | Description | Published |
20090231586 | INSPECTION CHIP PRODUCING METHOD AND SPECIMEN DETECTING METHOD - A method of producing an inspection chip includes a microstructure producing step of producing a microstructure where metallic portions having dimensions permitting excitation of surface plasmons are formed and distributed on one surface of a substrate, a specimen attaching step of attaching a specimen to the surfaces of the metallic portions of the microstructure, and a metallic particle attaching step of attaching metallic particles having dimensions permitting excitation of surface plasmons to the metallic portions and the specimen, wherein the specimen is attached to the metallic portions to which no substance capable of specifically binding to the specimen is secured in the specimen attaching step, and/or the metallic particles to which no substance capable of specifically binding to the specimen is secured are attached to the specimen in the metallic particle attaching step. | 09-17-2009 |
20090236512 | MASS SPECTROSCOPE - A mass spectroscope includes a mass analysis device having a surface provided with metallic members capable of exciting plasmons when irradiated by laser light, the mass analysis device allowing an analyte to be attached to the surface, a light radiation unit for irradiating the surface of the mass analysis device with laser light to ionize the analyte attached to the surface and desorb the analyte from the surface, and a detection unit for detecting a mass of the analyte ionized and desorbed from the surface of the mass analysis device from a time of flight of the analyte. The light radiation unit includes a polarization adjusting mechanism for adjusting a polarization direction of the laser light. | 09-24-2009 |
20090242752 | SAMPLE HOLDING DEVICE AND MASS SPECTROSCOPE AND MASS SPECTROSCOPIC METHOD USING THE SAMPLE HOLDING DEVICE - A sample holding device used for a mass spectroscope includes a substrate on which a detection surface is formed, a measuring region formed on the detection surface of the substrate and having placed thereon at least an analyte, and a reference region formed in another region of the detection surface of the substrate except for the measuring region, the reference region having the same configuration as the measuring region except that the former does not have the analyte placed thereon. | 10-01-2009 |
20090248367 | METHOD AND APPARATUS FOR MEASURING RAMAN SIGNALS - A method of measuring Raman signals comprises: an analyte placing step of placing an analyte on a detection surface of a microstructure plate which generates an enhanced electric field when irradiated with excitation light; an irradiating step of irradiating the detection surface with the excitation light so that the enhanced electric field is generated around the detection surface and light is emitted from the analyte and the detection surface to be enhanced by the generated enhanced electric field; a Raman signal obtaining step of detecting the enhanced light to obtain a Raman signal emitted from the analyte and a background signal for use as a reference, the Raman signal and the background signal having respective intensities; and a normalizing step of normalizing the Raman signal from the analyte by dividing the intensity of the Raman signal from the analyte by the intensity of the background signal obtained as the reference. | 10-01-2009 |
20090273780 | RAMAN SPECTRUM DETECTING METHOD AND RAMAN SPECTRUM DETECTING DEVICE - A Raman spectrum detecting method includes a liquid sample contacting step of placing a liquid sample containing a reference substance and a specimen in contact with a detection surface, the reference substance generating a known Raman spectrum having at least one peak therein that is different from peaks in a Raman spectrum generated by the specimen; a scattered light detecting step of irradiating the detection surface in contact with the liquid sample with an excitation light and detecting Raman scattered light occurring from the liquid sample; and a normalizing step of extracting a Raman spectrum signal of the reference substance and a Raman spectrum signal of the specimen from the signal detected in the scattered light detecting step and normalizing a signal intensity of the Raman spectrum signal of the specimen according to an intensity of the Raman spectrum signal of the reference substance. | 11-05-2009 |
20110232762 | METHOD FOR MANUFACTURING PHOTOELECTRIC CONVERSION ELEMENT, AND PHOTOELECTRIC CONVERSION ELEMENT AND THIN-FILM SOLAR CELL - A method for manufacturing a photoelectric conversion element including a step of preparing a substrate and a step of forming a photoelectric conversion layer made of a CIGS-based semiconductor compound on the substrate. The step of forming the photoelectric conversion layer includes exposing the substrate to vapors of (In, Ga) and Se, or a vapor of (In, Ga) | 09-29-2011 |
20120305049 | SOLAR CELL AND SOLAR CELL MANUFACTURING METHOD - A solar cell of a module type in which thin-film solar cells having a light absorbing layer made of a compound semiconductor are joined in series on a single substrate. The substrate includes a base made of a ferritic stainless steel, an aluminum layer formed on at least one surface of the base, and an insulation layer having a porous structure obtained by anodizing a surface of the aluminum layer. The insulation layer exhibits compressive stress at room temperature. | 12-06-2012 |