Patent application number | Description | Published |
20090255363 | PARALLEL MECHANISM - A parallel mechanism includes a base, actuators attached to the base, a plurality of arms coupled together in parallel, and a sensing device. Each of the arms has a first link, one end of which is coupled to the actuator, a second link through which the other end of the first link and a bracket are coupled together, a ball joint through which one end of the second link and the other end of the first link are swingably coupled together, and a ball joint through which the other end of the second link and the bracket are swingably coupled together. Each of the ball joints includes a ball stud including a ball-shaped head, a socket swingably holding the ball-shaped head of the ball stud, and a conductive member interposed between the ball-shaped head and the socket. The sensing device senses when at least one of the plurality of ball joints is loose, based on whether or not the ball stud and the socket are electrically continuous with one another. | 10-15-2009 |
20090255364 | PARALLEL MECHANISM - A parallel mechanism has a plurality of arms. Each of the arms has a ball joint. The ball joint includes a ball stud with a shaft portion and ball-shaped head, and a socket swingably and pivotally movably holding the ball-shaped head of the ball stud. The socket includes a semispherical recess portion holding the ball-shaped head from a top portion to an equator thereof, and an extending portion which is smoothly continuous with the semispherical recess portion and which extends from the equator of the ball-shaped head to the shaft portion side. The inner diameter of an opening in the extending portion is equal to or larger than the diameter of the ball-shaped head. | 10-15-2009 |
20090301253 | PARALLEL MECHANISM - A parallel mechanism includes a base portion, a bracket to which an end effecter is attached, a plurality of actuators attached to the base portion, a plurality of arms through which the plurality of actuators and the bracket are coupled together in parallel, and a control device arranged to control the actuators. When the end effecter in a stopped state is moved to a target position, the control device is arranged to control the actuators so that a level of acceleration at which the end effecter is accelerated is higher than a level of deceleration at which the end effecter is decelerated. | 12-10-2009 |
20110316467 | PARALLEL MECHANISM - A parallel mechanism includes a base portion, a bracket to which an end effecter is attached, a plurality of actuators attached to the base portion, a plurality of arms through which the plurality of actuators and the bracket are coupled together in parallel, and a control device arranged to control the actuators. When the end effecter in a stopped state is moved to a target position, the control device is arranged to control the actuators so that a level of acceleration at which the end effecter is accelerated is higher than a level of deceleration at which the end effecter is decelerated. | 12-29-2011 |
20120168088 | Filament Winding Apparatus - Provided is a filament winding apparatus ( | 07-05-2012 |
20140037413 | Suction Chuck and Workpiece Transfer Apparatus Including the Same - Provided is a suction chuck that is lightweight and that sucks and releases a thin plate workpiece in such a manner that the thin plate workpiece is not in contact with an edge of the chuck. A suction chuck according to an embodiment of the present invention includes a main body having a flat plate shape, and an opposing surface. Compressed air passages are formed within the main body. The opposing surface is a surface of the main body at the side facing the workpiece. The opposing surface has a plurality of recesses formed therein. The plurality of recesses serve as a sucking element for generating a negative pressure by ejecting the compressed air. The opposing surface is formed with a shape similar to the shape of the workpiece (or with a shape that corresponds to the shape of the workpiece being offset outward) such that the shape of the opposing surface is able to completely cover the shape of the workpiece when seen along a direction perpendicular to the opposing surface. The recesses are arranged such that all of the recesses are coverable by the shape of the workpiece when seen along the direction perpendicular to the opposing surface. | 02-06-2014 |
Patent application number | Description | Published |
20130015368 | INSPECTION APPARATUS AND INSPECTION METHODAANM NAKANISHI; HidetoshiAACI Kyoto-shiAACO JPAAGP NAKANISHI; Hidetoshi Kyoto-shi JPAANM TONOUCHI; MasayoshiAACI Suita-shiAACO JPAAGP TONOUCHI; Masayoshi Suita-shi JPAANM KAWAYAMA; IwaoAACI Suita-shiAACO JPAAGP KAWAYAMA; Iwao Suita-shi JP - A technology of inspecting a photoexcited carrier generation area of a photo device in a non-contact manner is provided. An inspection apparatus inspects a photovoltaic cell panel in which the photo device is formed. The inspection apparatus includes an irradiation part that irradiates the photovoltaic cell panel with pulsed light from a light receiving surface side and a detecting part (detector) that detects electric field intensity of a terahertz wave pulse, which is generated according to the irradiation of the pulsed light. | 01-17-2013 |
20130083319 | SEMICONDUCTOR INSPECTION METHOD AND SEMICONDUCTOR INSPECTION APPARATUS - A semiconductor inspection apparatus ( | 04-04-2013 |
20130153793 | ELECTROMAGNETIC RADIATION GENERATING ELEMENT, ELECTROMAGNETIC RADIATION GENERATING DEVICE, AND METHOD OF GENERATING ELECTROMAGNETIC RADIATION - An electromagnetic radiation generating device is a device that generates electromagnetic wave pulses from a plane surface. The electromagnetic radiation generating device includes an electromagnetic radiation generating element, a light irradiating unit. The electromagnetic radiation generating element includes: a depletion layer forming body formed by stacking a p-type silicon layer and an n-type silicon layer in a planar pattern; a light receiving surface electrode formed on one surface of the depletion layer forming body, the light receiving surface electrode including a plurality of parallel electrode parts that are equally spaced while a forming distance is maintained between the parallel electrode parts, the forming distance corresponding to the wavelength of the electromagnetic wave pulses generated from the depletion layer forming body; and a rear surface electrode formed on the opposite surface of the depletion layer forming body. | 06-20-2013 |
20130222004 | INSPECTION APPARATUS AND INSPECTION METHOD - An inspection apparatus inspects a photovoltaic cell panel in which the photo device is formed. The inspection apparatus includes: an irradiation part that irradiates the photovoltaic cell panel with pulsed light (pump light) emitted from a femtosecond laser; a detecting part that detects an electromagnetic wave pulse, which is generated from the photovoltaic cell panel according to the irradiation of the pump light; and a continuous light irradiation part that irradiates a portion, which is irradiated with the pump light in the photovoltaic cell panel, with continuous light. | 08-29-2013 |
20140002125 | INSPECTING DEVICE AND INSPECTING METHOD | 01-02-2014 |
20140239182 | INSPECTING DEVICE AND INSPECTING METHOD - An inspecting device inspects an inspecting target that is a semiconductor device or a photo device. The inspecting device includes: a stage for holding an inspecting target; a femtosecond laser for emitting pulsed light; a galvano mirror for obliquely irradiating the inspecting target with the pulsed light, while changing an optical path of the pulsed light, to scan the inspecting target with the pulsed light; and a detection part for detecting an electromagnetic wave emitted non-coaxially with the pulsed light from the inspecting target in accordance with the illumination with the pulsed light. | 08-28-2014 |
20140253911 | INSPECTING DEVICE AND INSPECTING METHOD - An inspecting device includes: an irradiation part for dividing pulsed light emitted from a femtosecond laser into measurement pump light and measurement probe light, to irradiate a solar cell; a detection part for detecting an electromagnetic wave emitted from the solar cell in accordance with the irradiation with the measurement probe light; and a measurement delay part for delaying the time of arrival of the measurement probe light at the solar cell relatively to the measurement pump light. The irradiation part is provided with a galvano mirror for scanning with the measurement probe light a wide range which is wider than an irradiated range (pump light spot) being irradiated with the measurement pump light in a solar cell. | 09-11-2014 |
20150015297 | PHOTO DEVICE INSPECTION APPARATUS AND PHOTO DEVICE INSPECTION METHOD - A photo device inspection apparatus is an apparatus for inspecting a solar cell panel, which is a photo device. The photo device inspection apparatus includes an irradiation part configured to irradiate the solar cell panel with pulsed light radiated from a femtosecond laser, which is a light source, an electromagnetic wave detection part configured to detect a pulse of an electromagnetic wave radiated from the solar cell panel in response to irradiation with the pulsed light, and a current detection part configured to detect a current generated by the solar cell panel in response to irradiation with the pulsed light. | 01-15-2015 |
20150053869 | INSPECTION APPARATUS AND INSPECTION METHOD - An inspection apparatus is an apparatus for inspecting a solar cell panel. The inspection apparatus includes: an excitation light irradiation part for irradiating the solar cell panel with pulsed light for causing the solar cell panel to radiate an electromagnetic wave pulse; a detection part for detecting the electromagnetic wave pulse radiated from the solar cell panel in response to irradiation with the pulsed light; and a temperature changing part for changing a temperature of the solar cell panel at a part irradiated with the pulsed light. | 02-26-2015 |
Patent application number | Description | Published |
20120162984 | LIGHT-EMITTING ELEMENT UNIT AND METHOD OF MANUFACTURING LIGHT-EMITTING ELEMENT UNIT, LIGHT-EMITTING ELEMENT PACKAGE, AND LIGHTING DEVICE - A light emitting element unit according to the present invention includes a semiconductor light emitting element that has a surface, a back surface, and a side surface, where the surface or the back surface is a light extracting surface from which light generated inside is emitted, a submount which has a bottom wall and a side wall, has a recess portion defined by the bottom wall and the side wall, and supports the semiconductor light emitting element by the bottom wall in a position in which the light extracting surface is directed upward at the recess portion, and has an inclined surface on the side wall, inclined at a predetermined angle with respect to the bottom wall so as to face the side surface of the semiconductor light emitting element, and a light reflecting film formed on the inclined surface of the submount. | 06-28-2012 |
20120181561 | LIGHT-EMITTING ELEMENT - A light-emitting element, a light-emitting element unit and a light-emitting element package are provided, which are each reduced in reflection loss and intra-film light absorption by suppressing multiple light reflection in a transparent electrode layer and hence have higher luminance. The light-emitting element | 07-19-2012 |