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Morf

Daniel Morf, Buch Am Irchel CH

Patent application numberDescriptionPublished
20110049377CHARACTERIZING RADIOTHERAPY BEAMS BASED ON IMAGE DETECTION ARRAY DATA - A method for determining parameters of a beam is disclosed. As a part of a disclosed method, a beam is received at an image detection array where charges are generated and collected, at a plurality of pixels. Values associated with at least one of a plurality of parameters of the beam are determined by integrating information supplied from each of the pixels. Feedback is generated that represents the values.03-03-2011
20110080990SYSTEMS AND METHODS FOR OBTAINING RECONSTRUCTED IMAGES DURING A TREATMENT SESSION - A medical system includes a treatment radiation source configured to deliver treatment radiation during a treatment session, an imaging system configured to obtain image data during the treatment session, and a processor configured to determine a beam break, and automatically operate the imaging system to obtain the image data during the beam break. A medical system includes a treatment radiation source, an imaging system configured to automatically obtain image data in a beam break that occurs during a treatment session, and a processor configured to automatically operate the treatment radiation source to deliver treatment radiation during the treatment session after the beam break ends.04-07-2011

Patent applications by Daniel Morf, Buch Am Irchel CH

Daniel Morf, Buck Am Irchel CH

Patent application numberDescriptionPublished
20120014618SYSTEM AND METHOD FOR MEASURING X-RAY BEAM PROFILE USING AN AREA DETECTOR - The claimed subject matter describes a novel technique to measure the beam profile using an area detector. In one embodiment, a set of one-dimensional beam profile measurements is performed by taking two images under the same source conditions but at two different positions of the detector, with each position of the detector shifted by a certain distance in the direction corresponding to the direction of the one-dimensional profile measurement. In further embodiments, a set of two-dimensional beam profile measurements is achieved by determining a second set of one-dimensional profiles from the same sampling points in a second direction and building a two-dimensional map of the beam profile by correlating the first one-dimensional profile measurement with the second one-dimensional profile measurement.01-19-2012

Daniel Morf, Irchel CH

Patent application numberDescriptionPublished
20120097858METHOD AND APPARATUS FOR MULTI-LAYERED HIGH EFFICIENCY MEGA-VOLTAGE IMAGER - A multi-layered mega-voltage digital imager is disclosed. In one embodiment, the radiation to particle conversion and particle to electricity conversion is paired as a modular entity. The entity is replicated on top of each other as a layered unit to build an imager with increased resolution and efficiency. Due to this paired replication, sub-images from each replicated pair may be selectively combined and processed to enhance the quality of the image. By varying and adding components at each layer, a different dose rate, and increased resolution, energy sensitivity and efficiency are achieved. The multilayered approach is cost effective and removes problems associated with traditional high efficient MV imagers used for high energy radiations.04-26-2012

Philipp Oliver Morf, Zurich CH

Patent application numberDescriptionPublished
20080210085METHOD FOR PURIFYING EXHAUST GASES FROM A WASTE INCINERATION PLANT - The present disclosure relates to a method for purifying exhaust gases from a waste incineration plant by utilizing a sorption method in a circulating fluidized bed. According to the disclosure, the mass flow of the supplied fresh sorbent is regulated as a function of the concentration of fresh sorbent and/or at least one sorbed pollutant in the recirculated solid matter.09-04-2008

Thomas Morf, Rueschlikon CH

Patent application numberDescriptionPublished
20100101638Using 3d integrated diffractive gratings in solar cells - A multi-junction opto-electronic device including a stack of wavelength selective absorption layers is proposed. The absorption layers include each a first layer with a grating of a specific pitch defining the wavelength of the incident light to be absorbed within a subjacent second electrically active layer itself on a third electrically inactive layer. The second electrically active layer within the different absorption layers is in electrical connection with lateral contacts to extract the electrical charge carriers generated by the absorbed incident light within the active layer. The grating within the first layer of the absorption layers is defined by periodic stripes of specific width depending on the wavelength to be absorbed by the respective absorption layers. The period of the stripes alignment is defined by the pitch of the grating. Advantageously, ordinary silicon technology can be used.04-29-2010