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Moon-Young
Moon-Young Choi, Seoul KR
| Patent application number | Description | Published |
|---|---|---|
| 20090293058 | VIRTUAL SYSTEM AND METHOD OF RESTRICTING USE OF CONTENTS IN THE VIRTUAL SYSTEM - Provided is a method of restricting use of contents in a virtual system comprising at least one virtual machine implemented by applying virtualization technology to a predetermined device. The method includes: reading a first device identifier from the device in order to identify the device; reading a second device identifier, which is a device identifier allocated to the at least one virtual machine, from the at least one virtual machine; determining whether the first device identifier is identical to the second device identifier; and selectively restricting use of contents in the at least one virtual machine based on a result of the determining. | 11-26-2009 |
Moon-Young Jeon, Seoul KR
| Patent application number | Description | Published |
|---|---|---|
| 20110001818 | THREE DIMENSIONAL SHAPE MEASUREMENT APPARATUS - A three dimensional shape measurement apparatus includes an illumination section and a grating transfer unit. The illumination section includes a light source unit generating a light and a grating unit changing the light generated by the light source unit into a grating pattern light having a grating pattern. The illumination section illuminates the grating pattern light onto a measurement target in a predetermined direction. The grating transfer unit transfers the grating unit in a predetermined inclination direction with respect to an extension direction of the grating pattern and an arrangement direction of the grating pattern. Thus, manufacturing cost may be reduced, and the three dimensional shape measurement apparatus may be easily managed. | 01-06-2011 |
| 20110050893 | APPARATUS AND METHOD FOR MEASURING A THREE-DIMENSIONAL SHAPE - Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner. | 03-03-2011 |
Moon-Young Jeon, Yongin KR
| Patent application number | Description | Published |
|---|---|---|
| 20090051929 | THREE-DIMENSIONAL IMAGE MEASURING APPARATUS - The present invention relates to a three-dimensional image measuring apparatus comprising: an XYZ shaft transfer means mounted onto a base member; a work stage mounted to the base member, for moving a measuring object to a measuring position and thereafter supporting it and having a predetermined reference surface set at a side thereof; an image obtaining means in which it is moved toward X,Y and Z shafts by the XYZ shaft transfer means, scans a grating image by the frequency of N times to a side of the measuring object supported and fixed to the work stage, obtains the changed grating image by the measuring object by N times; a light emitting means mounted to a side of the image obtaining means for generating and emitting light with a predetermined wavelength; and a control unit which irradiates light generated from the light emitting means mounted to a side of the image obtaining means to the reference surface set the side of the work stage, receives the changed grating image obtained from the image obtaining means, thereby producing the three-dimensional image. | 02-26-2009 |
