Patent application number | Description | Published |
20090206861 | SEMICONDUCTOR INSPECTING DEVICE - In a semiconductor inspecting device having a contact to be electrically connected to an electrode pad formed in a semiconductor device which is an object to be measured, and a substrate provided with the contact, the contact is provided obliquely to a main surface of the substrate. | 08-20-2009 |
20100133677 | SEMICONDUCTOR CHIP STACKED BODY AND METHOD OF MANUFACTURING THE SAME - A plurality of chip sealing bodies stacked on a wiring substrate with a connection terminal. The chip sealing body includes a semiconductor chip having a semiconductor integrated circuit, a pad and a conductive connecting material, and a resin sealing the semiconductor chip. The chip sealing body is shaped into a cubic form in which a portion of the conductive connecting material except an end portion located on an external device side and all surfaces of semiconductor chip is sealed by the resin and the end portion of the conductive connecting material located on the external device side is exposed from the cubic form. A conductive bonding wire connects the end portions of the conductive connecting materials and the connection terminal respectively. A resin sealing material seals the plurality of chip sealing bodies, the conductive bonding wire, and the wiring substrate. | 06-03-2010 |
20100320598 | SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF - A semiconductor device includes a stacked chip structure provided on a board and made up of semiconductor chips that are stacked via insulators. Each semiconductor chip has an integrated circuit surface, pads provided on the integrated circuit surface, and conductive connecting members having a wave shape with first ends electrically connected to the pads, and second ends extending outwardly from the at least one edge part and electrically connected to the connection terminals on the board. | 12-23-2010 |
20110062596 | SEMICONDUCTOR CHIP STACKED STRUCTURE AND METHOD OF MANUFACTURING SAME - A method of making a semiconductor chip stacked structure includes dicing a semiconductor wafer into semiconductor chips, the semiconductor chips respectively having a first surface and a second surface opposite thereto, the semiconductor chips having integrated circuits and pads on the first surfaces, arranging the semiconductor chips at intervals on a film having adhesive property, connecting the pads through joining members, sealing with resin the joining members and surfaces of the semiconductor chips excluding the second surfaces to produce a chip sealing structure, dividing the chip sealing structure to produce separate chip sealing structures having ends of the joining members exposed at surfaces thereof, removing the film to expose the second surfaces, stacking the chip sealing structures one over another and connecting the exposed ends of the joining members through a bonding wire to produce a chip stacked structure, and mounting the chip stacked structure on a wiring substrate. | 03-17-2011 |
20140125372 | PROBE CARD AND METHOD OF MANUFACTURING THE SAME - A probe card includes a wiring substrate including an opening portion and a connection pad arranged on an upper face of the wiring substrate located on the periphery of the opening portion, a resin portion formed in the opening portion of the wiring substrate, and the resin portion formed of a material having elasticity, a contact terminal arranged to protrude from the lower face of the resin portion, and wire buried in the resin portion and connecting the contact terminal and the connection pad, wherein the contact terminal is formed of an end part of the wire, and is formed integrally with the wire. | 05-08-2014 |
20140151891 | SEMICONDUCTOR PACKAGE - A semiconductor package includes: a first wiring substrate; a first spacer on the first wiring substrate, wherein the first spacer has a rectangular shape; a second spacer on the first wiring substrate to be separated from the first spacer, wherein the second spacer has a rectangular shape; a second wiring substrate on the first spacer and the second spacer and having a first surface and a second surface which is opposite to the first surface, wherein the second wiring substrate has opposed sides; a first semiconductor chip on the first surface of the second wiring substrate; and a second semiconductor chip on the second surface of the second wiring substrate to be disposed between the first spacer and the second spacer. The opposed long sides of the first and second spacers are substantially parallel with the opposed sides of the second wiring substrate. | 06-05-2014 |
20140264417 | WIRING BOARD AND LIGHT EMITTING DEVICE - There is provided a wiring board for mounting a light emitting element thereon. The wiring board includes: an insulating layer; a wiring pattern on the insulating layer; a reflecting layer on the insulating layer to cover the wiring pattern, wherein the light emitting element is to be mounted on a surface of the reflecting layer; and a silica film on the surface of the reflecting layer. | 09-18-2014 |
20140370365 | BATTERY AND METHOD FOR PRODUCING THE SAME - A battery includes a supporting substrate, resin layers, and a plurality of cells. Each resin layer includes a first resin and has 0.5 MPa to 10 MPa in tensile strength. The cells are stacked on the supporting substrate with the resin layers between the cells. | 12-18-2014 |
20150022229 | PROBE CARD AND METHOD OF MANUFACTURING THE SAME - A probe card, includes, a wiring substrate having an opening portion and including a first connection pad and a second connection pad, the first connection pad being arranged at a periphery of the opening portion, the second connection pad being arranged to be adjacent to the first connection pad, a resin portion formed inside the opening portion of the wiring substrate, a first wire buried in the resin portion and having one end connected to the first connection pad and the other end constituting a first contact terminal protruding from a lower face of the resin portion, and a second wire buried in the resin portion and having one end connected to the second connection pad and the other end constituting a second contact terminal protruding from the lower face of the resin portion, wherein diameters of the first contact terminal and the second contact terminal are equal to diameters of the first wire and the second wire in the resin portion, and the first contact terminal and the second contact terminal are gathered but divided from each other such that the pair of first and second contact terminals touch one electrode pad of a test object. | 01-22-2015 |
20150022230 | PROBE CARD AND METHOD OF MANUFACTURING THE SAME - A probe card includes a wiring substrate including an opening portion, a first connection pad, and a second connection pad arranged in an opposite area to the first connection pad, a resin portion formed in the opening portion, a first wire buried in the resin portion, in which one end is connected to the first connection pad and other end constitutes a first contact terminal, and a second wire buried in the resin portion, in which one end is connected to the second connection pad and other end constitutes a second contact terminal, wherein the first and second wires extend on one line, and the first and second contact terminals are arranged on the one line, and the first and second contact terminals are gathered to be separated such that the first and second contact terminals touch one electrode pad of a text object with a pair. | 01-22-2015 |