Patent application number | Description | Published |
20090146726 | DELAY CIRCUIT WITH CONSTANT TIME DELAY INDEPENDENT OF TEMPERATURE VARIATIONS - A delay circuit has: an inverting receiver with a resistive element, the inverting receiver having an input node for receiving an input signal and an output node coupled to the resistive element; a capacitive element, coupled to the output node of the inverting receiver and the resistive element; a first transistor, having lower turned ON voltage at higher temperature; a second transistor, used for generating a rail to rail signals on a terminal of the first transistor; and an output inverter, having an input node coupled to the first transistor and an output node for outputting an output signal of the delay circuit. Further, a third transistor is used for enhancing pulling low of the output signal of the delay circuit. | 06-11-2009 |
20090147594 | VOLTAGE REGULATOR FOR SEMICONDUCTOR MEMORY - A voltage regulator in a semiconductor memory has: a comparing unit including first and second bias current sources, for comparing an output voltage with first and second reference voltages under control of a first signal, the second bias current source being ON under control of a second signal; and a driver active element, coupled to the comparing unit, for outputting the output voltage. Before sensing operations, the output voltage is reset to the second reference voltage. During the sensing operations, the output voltage is maintained at the first reference voltage and the second signal is asserted for turning ON the second bias current source for raising speed of the comparing unit. After the sensing operations, the output voltage is reset to the second reference voltage. | 06-11-2009 |
20110188322 | MEMORY DEVICE WITH DATA PATHS FOR OUTPUTTING COMPRESSED DATA - A memory device is provided. The memory device includes a plurality of memory array banks, a bus, a data buffer, and four data paths. The data buffer provides data from the memory array banks to an external node. The first data path includes a first compression module for compressing the data from the memory array banks to the bus. The second data path transmits the data from the memory array banks to the bus. The third data path includes a second compression module for compressing data from the bus to the data buffer. The fourth data path transmits the data from the bus to the data buffer. | 08-04-2011 |
20110211398 | MEMORY DEVICE AND ASSOCIATED MAIN WORD LINE AND WORD LINE DRIVING CIRCUIT - A main word line driving circuit for driving word lines in a memory device comprises first and second level shifting units and an inverting unit. The first level shifting unit is configured to convert a decode signal into a first operative signal, and the second level shifting unit is configured to convert the decode signal into a second operative signal. The inverting unit is configured to receive the first and second operative signals. A supply voltage of the first level shifting unit is selectively switched to a first bias voltage when the plurality of word lines are selected or partially selected and switched the output voltage to a second bias voltage when the plurality of word lines are deselected. | 09-01-2011 |
20110211407 | SEMICONDUCTOR MEMORY DEVICE AND ASSOCIATED LOCAL SENSE AMPLIFIER - A semiconductor memory device comprises a plurality of memory cells, a bit line sense amplifier, a local sense amplifier, and a sense amplifier. The memory cells are connected between a word line and a bit line pair, and the bit line sense amplifier is configured to amplify voltages of data from the bit line pair and then transmits the data to a local data line pair. The local sense amplifier is configured to amplify voltages of the data from the local data line pair and transmit the data to a global data line pair in response to first and second control signals, and the sense amplifier is configured to amplify the voltages of the data from the global data line pair and transmit the data to an input/output line pair during a read operation. The local sense amplifier comprises a first read circuit, a second read circuit, and a write circuit, and when the memory device performs the read operation, the data is transmitted from the first read circuit to the write circuit via the second read circuit. | 09-01-2011 |
20110211417 | MEMORY DEVICE WITH PSEUDO DOUBLE CLOCK SIGNALS AND THE METHOD USING THE SAME - A method for operating a memory device with pseudo double clock signals comprises the steps of: generating an even clock signal and an odd clock signal, wherein the clock rates of both the even clock signal and the odd clock signal are half that of the input clock signal, and the even clock signal is the inverse signal of the odd clock signal; if the logic level of the even clock signal is | 09-01-2011 |
20110227624 | DUTY CYCLE CORRECTION CIRCUIT - A duty cycle correction circuit comprises first and second pulse generators, a clock dividing unit, a detecting unit, and a pulse width control unit. The first pulse generator is configured to generate a first edge of a first pulse signal in synchronization with a first edge of a first clock signal, and the second pulse generator is configured to generate a first edge of a second pulse signal in synchronization with a second edge of the first pulse signal. The clock dividing unit is configured to generate a second clock signal by dividing the frequency of the first clock signal. The detecting unit is configured to generate a detecting signal according to the second clock signal and a time interval between the first edge of the first pulse signal and a second edge of the second pulse signal. In particular, pulse widths of the first and second pulse signals are the same and are adjustable according to a control signal from the pulse width control unit. | 09-22-2011 |
20110228620 | TESTING METHOD FOR SEMICONDUCTOR MEMORY DEVICE - A method comprises simultaneously writing a test bit to a plurality of memory cells in the selected sections of a memory array corresponding to column address signals; individually and successively reading output bits from the memory cells in one of the selected sections of a designated row of the memory array corresponding to column address signals and row address signals; and error-checking the output bits with the test bit, wherein the memory array comprises the plurality of memory cells arranged in rows and columns and the memory cells of each row are divided into a plurality of sections. | 09-22-2011 |
20110235451 | DYNAMIC RANDOM ACCESS MEMORY AND METHOD OF DRIVING DYNAMIC RANDOM ACCESS MEMORY - A dynamic RAM which includes a first inverter, a second inverter, a sense amplifier, a first pair of switches, a pair of bit lines, and a dynamic RAM cell. The first inverter receives a first driving signal. A power end of the first inverter is coupled to a first voltage source. The second inverter receives a second driving signal output from the first inverter. A power end of the second inverter is coupled to a second voltage source. The sense amplifier senses and amplifies a voltage difference between a first sensing signal and a second sensing signal. A power end of the sense amplifier is coupled to a third voltage source, wherein a voltage value of the second voltage source is between a voltage value of the first voltage source and a voltage value of the third voltage source. | 09-29-2011 |
20110239046 | TEST CIRCUIT FOR INPUT/OUTPUT ARRAY AND METHOD AND STORAGE DEVICE THEREOF - The invention provides a test circuit for n input/output arrays. Each of the n input/output arrays has M pairs of input/output. The test circuit includes M write drivers and M comparing circuits. The i | 09-29-2011 |
20130021862 | DRAM AND METHOD FOR TESTING THE SAME IN THE WAFER LEVEL BURN-IN TEST MODE - A dynamic random-access memory (DRAM) and a method for testing the DRAM are provided. The DRAM includes a memory cell, a bit line associated with the memory cell, a local buffer, and a bit line sense amplifier (BLSA). The local buffer receives a first power voltage as power supply. The local buffer provides a ground voltage to the bit line when a data signal is de-asserted and provides the first power voltage to the bit line when the data signal is asserted. The BLSA receives a second power voltage as power supply. The BLSA provides the second power voltage to the bit line when the data signal and a wafer level burn-in test signal are both asserted. The second power voltage may be higher than the first power voltage. The wafer level burn-in test signal is asserted when the DRAM is in a wafer level burn-in test mode. | 01-24-2013 |
20130049830 | DELAY LOCK LOOP CIRCUIT - The invention provides a delay lock loop circuit (DLL) for generating a locked signal, the DLL circuit includes: a phase detector, a first and a second voltage controlled delay chains, a charge pump and a duty cycle detection pump. The phase detector generates a phase detecting result by detecting a phase difference between the clock signal and the locked signal. The first and the second voltage controlled delay chains generate a first and a second delayed signals by delaying the clock signal according to the first and the second control signals, respectively. The charge pump is used for generating the first and the second control signal according to the phase detecting result. The duty cycle detection pump is used for controlling a voltage level of the second control signal according to the first and the second delayed signals. | 02-28-2013 |