Patent application number | Description | Published |
20100017569 | PCB INCLUDING MULTIPLE CHIPS SHARING AN OFF-CHIP MEMORY, A METHOD OF ACCESSING OFF-CHIP MEMORY AND A MCM UTILIZING FEWER OFF-CHIP MEMORIES THAN CHIPS - A PCB having fewer off-chip memories than chips, a MCM, and a method of accessing an off-chip shared memory space. In one embodiment, the method includes: (1) generating a memory request at a first chip of the printed circuit board, (2) transforming the memory request to a shared memory request and (3) directing the shared memory request to an off-chip shared memory space indirectly coupled to the first chip via a second chip of the printed circuit board. | 01-21-2010 |
20100052800 | METHOD AND APPARATUS FOR DERIVING AN INTEGRATED CIRCUIT (IC) CLOCK WITH A FREQUENCY OFFSET FROM AN IC SYSTEM CLOCK - Generally, methods and apparatus are provided for deriving an integrated circuit (IC) clock signal with a frequency that is offset from the IC system clock. An offset clock having a frequency that is offset from a system clock is generated by configuring a ring oscillator in a first mode to generate the system clock having a desired frequency; and adjusting the configuration of the ring oscillator in a second mode to generate the offset clock having the frequency that is offset from the system clock. The configuration of the ring oscillator is adjusted in the second mode by adjusting (i) a power supply value applied to the ring oscillator in the second mode relative to a power supply value applied in the first mode; or (ii) a number of delay line elements that are active in the ring oscillator loop. | 03-04-2010 |
20100115475 | Integrated Circuit Performance Enhancement Using On-Chip Adaptive Voltage Scaling - Techniques for enhancing the performance of an IC are provided. A method of enhancing IC performance includes the steps of: associating at least one performance result of at least one performance monitor, formed on the IC, with deterministic combinations of IC performance and a processing parameter, a supply voltage, and/or a temperature of the IC; determining an IC processing characterization of the IC as a function of the performance result for at least one prescribed supply voltage and temperature of the IC, the IC processing characterization being indicative of a type of processing received by the IC during fabrication of the IC; and controlling a voltage supplied to at least a portion of the IC, the voltage being controlled as a function of the IC processing characterization and/or the temperature of the IC so as to satisfy at least one prescribed performance parameter of the IC. | 05-06-2010 |
20100306519 | SYSTEM AND METHOD FOR MAINTAINING THE SECURITY OF MEMORY CONTENTS AND COMPUTER ARCHITECTURE EMPLOYING THE SAME - A secure memory system and a method of maintaining the security of memory contents. One embodiment of the system includes: (1) a security control module configured to transmit a system memory secure mode signal and processor secure mode signal to place the system in a secure mode, (2) a secure memory bridge coupled to the security control and system memory and configured to encrypt and decrypt data associated with the system memory based on a state of the system memory secure mode signal and (3) a boot processor coupled to the security control module and the secure memory bridge and configured to transmit requests to the secure memory bridge in the secure mode and an unsecure mode. | 12-02-2010 |
20110002186 | SECURE ELECTRICALLY PROGRAMMABLE FUSE AND METHOD OF OPERATING THE SAME - An electrically programmable fuse, a method of operating the same and an integrated circuit (IC) incorporating the fuse or the method. In one embodiment, the fuse includes: (1) at least one fuse element configured to be programmed with contents and (2) an inhibitor coupled to the at least one fuse element and configured to be activated to inhibit subsequent reprogramming of the at least one fuse element. | 01-06-2011 |
20130249290 | Adaptive Voltage Scaling Using a Serial Interface - An adaptive voltage scaling system includes first and second devices. Each of the first and second devices includes at least one master serial interface port and at least one slave serial interface port. The first device is operatively coupled to a voltage regulator, and the slave serial interface port associated with the second device is operatively coupled to the master serial interface port associated with the first device. The first device controls the voltage regulator based on information obtained from the first and second devices using the master serial interface port associated with the first device and the slave serial interface port associated with the second device. The first and second devices receive voltage from the voltage regulator. A corresponding method and computer-readable medium are also disclosed. | 09-26-2013 |
20140132303 | APPARATUS AND METHOD FOR SENSING TRANSISTOR MISMATCH - An integrated circuit implements a transistor mismatch sensor comprising first and second inverter chains coupled to a register. The register comprises a plurality of flip-flops having clock inputs driven by an output of the first inverter chain and data inputs driven by an output of the second inverter chain. Data outputs of the flip-flops of the register are indicative of an amount of mismatch between transistors of different conductivity types in the first and second inverter chains. For example, the register may comprise a thermometer encoded register providing a digital output signal having a first value indicative of an approximate match in speed, drive strength or other characteristics between the transistors of the first and second conductivity types, with values above and below the first value being indicative of respective first and second different types of relative mismatch in speed, drive strength or other characteristics. | 05-15-2014 |
20140136128 | APPARATUS AND METHOD FOR SENSING TRANSISTOR AGING EFFECTS - An integrated circuit implements a transistor aging effects sensor comprising first and second delay lines, each comprising a plurality of delay elements, and a register. The register comprises a plurality of flip-flops having data inputs driven by respective outputs of respective ones of the delay elements of the first delay line and clock inputs driven by one or more clock signals provided by at least one of the delay elements of the second delay line. Data outputs of the flip-flops of the register are indicative of one or more aging effects in transistors of the first and second delay lines. For example, the register may comprise a thermometer encoded register providing digital output signals used to determine aging effects in the transistors of the first and second delay lines. Embodiments can be implemented using differential delay lines or delay lines comprising respective inverter chains. | 05-15-2014 |