| Patent application number | Description | Published |
|---|
| 20080265931 | On-chip electromigration monitoring - A method is provided for monitoring interconnect resistance within a semiconductor chip assembly. A semiconductor chip assembly can include a semiconductor chip having contacts exposed at a surface of the semiconductor chip and a substrate having exposed terminals in conductive communication with the contacts. A plurality of monitored elements of the semiconductor chip can include conductive interconnects, each interconnecting a respective pair of nodes of the semiconductor chip through wiring within the semiconductor chip. In an example of such method, a voltage drop across each monitored element is compared with a reference voltage drop across a respective reference element on the semiconductor chip at a plurality of different times during a lifetime of the semiconductor chip assembly. In that way, it can be detected when a resistance of such monitored element is over threshold. Based on a result of such comparison, a decision can be made whether to indicate an action condition. | 10-30-2008 |
| 20080304509 | OUT OF BAND SIGNALING ENHANCEMENT FOR HIGH SPEED SERIAL DRIVER - An integrated microelectronic serial driver is provided which is operable to transmit a differential pattern signal during a burst interval and a predetermined common mode voltage level during a second interval between adjacent burst intervals, the serial driver including at least one pre-driver and a driver coupled to an output of the pre-driver for transmitting the differential communication signal. A switching circuit is operable to switch the serial driver between a first power supply voltage level for the burst interval and the predetermined common mode voltage level, wherein the predetermined common mode voltage level is independent of variations in power supply voltage conditions and temperature conditions. | 12-11-2008 |
| 20080316930 | Robust Cable Connectivity Test Receiver For High-Speed Data Receiver - A system is provided for detecting a fault in a signal transmission path. In one embodiment, the system can include a variable amplitude signal attenuator which is operable to modify an input signal by variably attenuating a signal voltage swing of the input signal. Desirably, the input signal is attenuated only when transitioning from a high signal voltage level towards a low signal voltage level d variably, such that a larger high-to-low signal voltage swing is attenuated more than a smaller high-to-low signal voltage swing. Desirably, a comparator, which may apply hysteresis to the output signals, may detect a crossing of a reference voltage level by the modified input signal. In this way, when the comparator does not detect an expected crossing of the reference voltage level by the modified input signal, a determination can be made that a fault exists in the signal transmission path. | 12-25-2008 |
| 20090128161 | Structure for robust cable connectivity test receiver for high-speed data receiver - A design structure embodied in a machine-readable medium used in a design process may include a system for detecting a fault in a signal transmission path. Such system may include, for example, a hysteresis comparator including a latch having n-type field effect transistor (“NFET”) storage elements. The hysteresis comparator may be operable to detect a crossing of a reference voltage level by an input signal arriving from the signal transmission path such that when the comparator does not detect an expected crossing of the reference voltage level by the input signal, the fault is determined to be detected in the signal transmission path. | 05-21-2009 |
| 20090132985 | Design structure for on-chip electromigration monitoring system - A design structure embodied in a machine readable medium used in a design process can include apparatus of a semiconductor chip operable to detect an increase in resistance of a monitored element of the semiconductor chip. The design structure can include, for example, a resistive voltage divider circuit operable to output a plurality of reference voltages having different values. A plurality of comparators in the semiconductor chip may be coupled to receive the reference voltages and a monitored voltage representative of a resistance of the monitored element. Each of the comparators may produce an output indicating whether the monitored voltage exceeds the reference voltages, so that the resistance value of the monitored element may be precisely determined. | 05-21-2009 |
| 20090146692 | Structure for apparatus for reduced loading of signal transmission elements - A design structure for a signal-handing apparatus or communication apparatus is provided which includes a common signal node operable to conduct a first signal, a first circuit coupled to the common signal node to utilize the first signal and a signal-handling element coupled to the common signal node. A signal-handling apparatus may include an isolating circuit coupled to a first conductor, a second conductor to conduct an output of the isolating circuit, and a signal-handling circuit coupled to the second conductor. A signal-handling circuit can perform a signal-handling function in response to the output of the isolating circuit. The signal-handling circuit and the first circuit may be isolated from the second conductor and the signal-handling circuit such that a communication signal may be conducted with less capacitance and be subject to less return loss. | 06-11-2009 |
| 20090175325 | SYSTEM FOR MEASURING AN EYEWIDTH OF A DATA SIGNAL IN AN ASYNCHRONOUS SYSTEM - An eyewidth of a data signal is determined by steps including: (a) recovering a phase of a clock from a data signal as a sampling clock; (b) shifting the phase of the sampling clock away from the first phase by a count multiplied by predetermined phase amount; (c) sampling the data signal with the shifted sampling clock phase to obtain sample data; d) determining whether the sample data contains error; (e) when the sample data does not contain error, recovering the phase of the clock from the data signal again for use as the first phase of the sampling clock, increasing the count value and repeating steps (b) through (e); and f) when the sample data contains error, determining the eyewidth based on the last shifted phase of the sampling clock prior to determining that the sample data contains error. | 07-09-2009 |
| 20090261890 | REGULATED VOLTAGE BOOST CHARGE PUMP FOR AN INTEGRATED CIRCUIT DEVICE - An apparatus and method for a regulated voltage boost charge pump for an integrated circuit (IC) device. The charge pump generally includes a plurality of switching networks and a lift capacitor that are intermittently coupled to an output capacitor or to a regulating transistor, a differential error amplifier biasing a gate terminal of the transistor, and a controller configured to alternate states of switches in the switching networks in a pre-selected timing relationship with a clock signal of the IC device. | 10-22-2009 |
| 20090300562 | Design structure for out of band signaling enhancement for high speed serial driver - A design structure is provided for a microelectronic serial driver. The serial driver is operable to transmit a differential pattern signal during a burst interval and a predetermined common mode voltage level during a second interval between adjacent burst intervals, the serial driver including at least one pre-driver and a driver coupled to an output of the pre-driver for transmitting the differential communication signal. A switching circuit is operable to switch the serial driver between a first power supply voltage level for the burst interval and the predetermined common mode voltage level, wherein the predetermined common mode voltage level is independent of variations in power supply voltage conditions and temperature conditions. | 12-03-2009 |
| 20100054324 | SYSTEM AND METHOD FOR LATENCY REDUCTION IN SPECULATIVE DECISION FEEDBACK EQUALIZERS - A decision feedback equalizer (DFE) and method include summer circuits configured to add a dynamic feedback tap to a received input to provide a sum and to add a speculative static tap to the sum. Sense amplifiers are configured to receive outputs of the summer circuits and evaluate the outputs of the summer circuits in accordance with a clock signal. A passgate multiplexer is configured to receive outputs from sense amplifiers wherein the multiplexer is clock-gated for isolation of subsequent circuitry from the outputs of the sense amplifiers during a precharge period. A gating circuit is configured to perform gating of a select signal output from a second circuit portion with a clock signal and to enable the isolation of the subsequent circuitry by the multiplexer during the precharge period. A regenerative buffer is coupled to the multiplexer to maintain an output of the multiplexer during the precharge period, to provide the select signal for a passgate multiplexer in the second circuit portion of the DFE and to drive the dynamic feedback tap on the first circuit portion of the DFE. | 03-04-2010 |
| 20100194482 | COMPENSATION OF VCO GAIN CURVE OFFSETS USING AUTO-CALIBRATION - A method is provided for selecting an operating band of a voltage-controlled oscillator (“VCO”) of a phase locked loop (“PLL”) for which the lock frequency is closest to a center of the frequency range of the operating band. In such method, steps can be performed to determine the maximum and minimum frequencies of the operating band and the center frequency between them. From the center frequency of the operating band and the lock frequency within such operating band, a difference value can then be determined. The operating bands of the PLL can be tested until an operating band having the smallest difference value is determined. The VCO can then be set to such operating band in order for the lock frequency to be closest to the center frequency of the operating band. | 08-05-2010 |
| 20100194483 | AUTO-CALIBRATION FOR RING OSCILLATOR VCO - A phase locked loop (“PLL”) includes a voltage controlled oscillator (“VCO”) operable to acquire and maintain lock at a selected output frequency of the VCO and control logic operable to perform steps in a method of selecting a frequency band for operating the VCO. Such method can include switching the VCO to a given operating band from among the plurality of operating bands of the VCO; determining a band center frequency at which the VCO oscillates in the given operating band when the control voltage is set to a center of a range of minimum to maximum control voltages [CVmin, CVmax]; determining a difference between the band center frequency and the selected output frequency when the selected output frequency is within the given operating band; switching the VCO to another operating band; repeating the above steps until a difference between the band center frequency and the selected output frequency increases; and selecting the operating band for operation of the VCO for which the difference between the band center frequency and the selected output frequency is smallest. | 08-05-2010 |
