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Megumi Nakamura
Megumi Nakamura, Tama-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20090266979 | ION ATTACHMENT MASS SPECTROMETER AND ION ATTACHMENT MASS SPECTROMETRY METHOD THEREOF - An ion attachment mass spectrometer includes an attached ion generation unit which generates attached ions by attaching positively charged metal ions to the molecules of a measurement target substance, and a mass spectrometry unit which performs mass spectrometry of the attached ions. The mass spectrometry unit includes a mass separation chamber to select attached ions having a specific mass number from the attached ions, an ionization chamber to dissociate the attached ions having the specific mass number, and a mass analysis chamber to analyze the dissociated ions. | 10-29-2009 |
| 20090266981 | INTERNAL STANDARD MATERIAL, RESIN COMPOSITION, AND MEASUREMENT METHOD - An internal standard material to be added to a specimen containing a material to be measured when measuring the content of the material to be measured by performing mass spectrometry on the specimen includes a hindered phenol compound. | 10-29-2009 |
| 20090272894 | MASS SPECTROMETER AND MASS SPECTROMETRY METHOD - A mass spectrometer includes an ionization chamber, a temperature control unit which controls the temperature in the ionization chamber to vaporize a sample in at least one of solid and liquid state in the ionization chamber, an introduction unit which introduces the sample into the ionization chamber, an ion supply unit which supplies ions to the ionization chamber to ionize, in the ionization chamber, the sample vaporized in the ionization chamber, and a mass analyzer which measures the mass of the molecules of the ionized sample. | 11-05-2009 |
| 20100243884 | MASS SPECTROMETER AND MASS SPECTROMETRY METHOD - A mass spectrometer includes an ionization chamber ( | 09-30-2010 |
Megumi Nakamura, Tokyo JP
| Patent application number | Description | Published |
|---|---|---|
| 20100163722 | MASS SPECTROMETRY AND MASS SPECTROMETER USED FOR THE SAME - The present invention maintains a stable emission amount from an emitter. In an embodiment of the present invention, a solid sample or a liquid sample is heated to gasify an object to be measured contained in the solid sample or the liquid sample, thereby forming a neutral gaseous molecule, and a metal ion emitted from an emitter having an oxidized surface is attached to the neutral gaseous molecule to ionize the neutral gaseous molecule, which is subjected to mass spectrometry. The solid sample or the liquid sample is a sample that emits a reducing gas by heating. The heating for gasifying the object to be measured is performed at a temperature lower than the vaporization temperature of the solid sample or the liquid sample and not less than the vaporization temperature of the object to be measured, and an oxidizing gas is provided to the emitter. | 07-01-2010 |
| 20100163723 | MASS SPECTROMETER SYSTEM AND MASS SPECTROMETRY METHOD - A mass spectrometer system comprises a chamber having an ion emitting unit to emit metal ions in the chamber with a communicating hole; a neutral molecule introduction unit; another gas introduction unit; a controller controlling a temperature of a region where metal ions attach to the neutral molecules; and a mass analyzer for the neutral molecules with the metal ions, wherein plotting an attachment energy of the metal ions attached to the neutral molecules in the chamber along an abscissa and the temperature of the region where the metal ions attach to the neutral molecules along an ordinate, the controller adjusts the temperature of the region so as to fall within a range obtained by excluding a range corresponding to the temperature of the region from 150 to 200° C. from a range surrounded by the temperatures of the region [° C.]=150×attachment energy [eV], 100×attachment energy [eV]−50, and 20° C., and attachment energies [eV]=2.1 and 0.5. | 07-01-2010 |
Megumi Nakamura, Yamato-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20090247297 | VIRTUAL-SPACE HAZARD ASSESSMENT SYSTEM AND METHOD AND PROGRAM FOR THE SAME - A virtual-space hazard assessment system, for use in a virtual space, having target identifying information that identifies a target that appears in the virtual space. The system includes: a hazard-rating-request receiver for receiving a hazard rating request to rate the degree of hazard of the target; hazard storage for storing a table in which the degree of hazard of the target and the target identifying information are associated with each other; a hazard-degree increasing mechanism for increasing the degree of hazard of the target stored in the table in the hazard storage according to the degree of hazard received by the hazard-rating-request receiver; a hazard-degree decreasing mechanism for decreasing the degree of hazard stored in the table in the hazard storage with the elapse of time; and hazard-information-output instructing mechanism for issuing an instruction to output hazard information stored in the hazard storage. | 10-01-2009 |
| 20100042364 | Monitoring Virtual Worlds to Detect Events and Determine Their Type - A method, apparatus, and article of manufacture are provided for detecting events based upon population density as a function of time and geographic location. Flow of population enables continuous movement to be distinguished from non-continuous movement. Accordingly, various types of events where people are gathering may be determined based upon the population flow and density. | 02-18-2010 |