Inventors list |
Assignees list |
Classification tree browser |
Top 100 Inventors |
Top 100 Assignees |
Medhi
Medhi Goranka, Guwahati IN
| Patent application number | Description | Published |
|---|---|---|
| 20110012902 | METHOD AND SYSTEM FOR VISUALIZING THE PERFORMANCE OF APPLICATIONS - An exemplary embodiment of the present invention provides a method for visualizing the performance of a system. The method includes generating a topological map of an application environment from a configuration management database (CMDB), wherein the topological map comprises a plurality of configuration items (CIs). A selection of configuration items (CIs) is made from the plurality of CIs. The definition of one or more performance graph(s) for the CIs is obtained from an operational database, wherein the performance graphs are configured to simultaneously show performance metrics for the CI and related CIs. Performance data for the CI and the related CIs are accessed and the performance graph is generated from the data. | 01-20-2011 |
Medhi Mojdeh, Valencia, CA US
| Patent application number | Description | Published |
|---|---|---|
| 20090072447 | Region-Based Supports for Parts Produced by Solid Freeform Fabrication - Methods for generating supports ( | 03-19-2009 |
Medhi Vaez-Iravani, Los Gatos, CA US
| Patent application number | Description | Published |
|---|---|---|
| 20100074515 | Defect Detection and Response - To increase inspection throughput, the field of view of an infrared camera can be moved over the sample at a constant velocity. Throughout this moving, a modulation (such as optical or electrical) can be provided to the sample and infrared images can be captured using the infrared camera. Moving the field of view, providing the modulation, and capturing the infrared images can be synchronized. The infrared images can be filtered to generate the time delay lock-in thermography, thereby providing defect identification. In one embodiment, this filtering accounts for the number of pixels of the infrared camera in a scanning direction. For the case of optical modulation, a dark field region can be provided for the field of view throughout the moving, thereby providing an improved signal-to-noise ratio during filtering. Localized defects can be repaired by a laser integrated into the detection system or marked by ink for later repair in the production line. | 03-25-2010 |