Mckelvey
Graham Neil Mckelvey, Glashutten DE
Patent application number | Description | Published |
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20160110891 | Comparing Appearances of Fibers - A method and apparatus for assisting a user to compare appearances of fibers, the method including providing ( | 04-21-2016 |
20160110915 | Synthesizing an Image of Fibers - A method and apparatus for synthesizing an image showing fibers. The method comprises providing ( | 04-21-2016 |
Kim Martin Mckelvey, Coventry GB
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20130032495 | SCANNING ELECTROCHEMICAL MICROSCOPY - A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging. | 02-07-2013 |
20150059027 | SCANNING ELECTROCHEMICAL MICROSCOPY - A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging. | 02-26-2015 |
Kim Martin Mckelvey, Swerford GB
Patent application number | Description | Published |
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20150129436 | SCANNING ELECTROCHEMICAL MICROSCOPY - A method of controlling a scanning electrochemical microscopy probe tip comprising the following steps: oscillating the scanning electrochemical microscopy probe tip relative to the surface of interest; moving the oscillating scanning electrochemical microscopy probe tip towards the surface of interest; detecting damping of an amplitude of the oscillation of the scanning electrochemical microscopy probe tip resulting from the scanning electrochemical microscopy probe tip coming into contact with the surface of interest at the first location; using the detected damping to detect the surface of interest; retracting the scanning electrochemical microscopy probe tip away from the surface of interest without first translating the scanning electrochemical microscopy probe tip along the surface of interest whilst the scanning electrochemical microscopy probe tip is in intermittent contact with the surface of interest. The method further comprises measuring electrochemical signals produced at the oscillating scanning electrochemical microscopy probe tip whilst moving the oscillating scanning electrochemical microscopy probe tip towards and/or away from the surface of interest. | 05-14-2015 |
Thomas Mckelvey, Alingsas SE
Patent application number | Description | Published |
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20120190977 | CLASSIFICATION OF MICROWAVE SCATTERING DATA - Example embodiments presented herein relate to solutions for analyzing and/or classifying microwave scattering data. The analyzing and/or classifying may be utilized for estimating an internal condition in an enclosed volume. | 07-26-2012 |