| Patent application number | Description | Published |
|---|
| 20090093724 | METHOD FOR OPTIMISING THE FOCUSSING OF WAVES THROUGH AN ABERRATION-INDUCING ELEMENT - The invention concerns a method for optimizing the focusing of waves in a zone of interest of a medium, with the waves being emitted by a network of sources to the medium through an aberration-inducing element that introduces an initially indeterminate phase shift. The method according to the invention proposes to use M−1 successive modifications of the emitted wave, each giving rise to a perturbation. According to the invention, the M perturbations are measured in the zone of interest at each modification of the phase and/or amplitude distributions, and these measurements are used to deduce optimal focusing characteristics to maximize the perturbation induced in the zone of interest. | 04-09-2009 |
| 20090124901 | Imaging Method and Device Using Shear Waves - The inventive imaging method consists in generating a mechanical wave having shearing and compressional components in a viscoelastic medium and in determining the movement parameter of said viscoelastic medium at different points during the propagation of said mechanical wave. Said method comprises a correction stage when the movement parameter is processed for eliminating errors caused by the compressional component of the mechanical wave. | 05-14-2009 |
| 20090309805 | Method and Device for the Transmission of Waves - Method for focusing an electromagnetic or acoustic wave on a point near which one or more diffusers are placed, comprising a learning step in which the pulsed responses h | 12-17-2009 |
| 20100007357 | Electrical Impedance Tomography Method and Device - Electrical impedance tomography method comprising: an electrical measurement step during which pre-determined electrical conditions are imposed on the surface of a medium to be imaged, while generating a mechanical disturbance at predefined points of the medium by locally modifying the impedance of the medium and an electrical parameter is measured at several points on the surface of the medium; and a calculation step during which the electrical impedance is determined at several points in the internal volume of the medium, taking into account the measurements carried out during the disturbance, as a function of a law for modification of the electrical impedance by this disturbance. | 01-14-2010 |
| 20100114533 | METHOD AND APPARATUS FOR EXPLORING BY WAVE PROPAGATION - A method of exploring by wave propagation, in which method an incident wave is emitted a plurality of times towards the same target zone (r | 05-06-2010 |
| 20100222678 | METHOD AND DEVICE FOR MEASURING A MEAN VALUE OF VISCO-ELASTICITY OF A REGION OF INTEREST - The invention relates to a method for measuring a mean visco-elasticity value for a soft material. Said method using a single probe carrying at least one transducer comprises the steps of:
| 09-02-2010 |
| 20100283745 | METHOD FOR LOCATING A TOUCH ON A SURFACE AND DEVICE FOR IMPLEMENTING THE METHOD - For locating a touch on a tactile surface belonging to an object ( | 11-11-2010 |
| 20110028838 | Method and Apparatus for Measuring a Physical Parameter in Mammal Soft Tissues by Propagating Shear Waves - Method for measuring a physical parameter in soft tissues of a mammal, in which a mechanical shear wave is propagated through the soft tissues and observation of the propagation leads to determine values of a shear wave propagation parameter. The physical parameter is computed on the basis of these values. | 02-03-2011 |
| 20110125014 | Sounding Method and Device using Wave Propagation - The invention relates to a wave-propagation-based sounding method, in which: an incident wave is emitted through a medium including diffusers capable of reflecting the wave; and, subsequently, signals representing a reflected wave reverberated by the medium from the incident wave are captured, said captured signals being the sum of a single scattering component and a multiple scattering component. The captured signals are processed by separating the multiple scattering component from the single scattering component by filtering at least one frequency transfer matrix representing responses between transducers from the transducer assembly. | 05-26-2011 |
